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AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings

Date 4-6 Oct. 1988

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Displaying Results 1 - 25 of 53
  • AUTOTESTCON '88 Symposium Proceedings: Futuretest . IEEE International Automatic Testing Conference (Cat. No.88CH2575-9)

    Publication Year: 1988
    Request permission for commercial reuse | PDF file iconPDF (157 KB)
    Freely Available from IEEE
  • Convergence of two-level maintenance (military systems)

    Publication Year: 1988, Page(s):21 - 24
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (339 KB)

    The major supportability issue facing the US Department of Defense in the 1990s is increased operational availability of weapon platforms while reducing the logistic pipeline. The systems engineering methodology is discussed, along with a transition plan for existing systems that converges on two levels of maintenance. The proposed approach is top-down and structured for supportability through the... View full abstract»

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  • An embedded expert system for portable ATE

    Publication Year: 1988, Page(s):155 - 159
    Cited by:  Papers (3)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (500 KB)

    By embedding an expert system into portable automatic test equipment (ATE) the sophistication and capability of the testing system was increased while maintaining the compactness of the portable ATE. The results of this effort are presented, and include reductions in both the number and size of fault ambiguity sets, and the ability of the system to detect and isolate multiple faults. By combining ... View full abstract»

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  • VXIbus instrumentation-using tomorrow's technology today with existing IEEE-488 instruments and controllers

    Publication Year: 1988, Page(s):321 - 324
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (533 KB)

    The VXIbus architecture is reviewed, along with the history and current status of the VXIbus specification. How VXIbus instruments relate to the existing IEEE-488 (GPIB) instrumentation standard through an interface board that links the two technologies together is described. By understanding the fundamental VXIbus concepts and how they relate to familiar GPIB concepts, the ATE (automatic test equ... View full abstract»

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  • Supercomputer applications to test systems [avionics and weapons applications]

    Publication Year: 1988, Page(s):225 - 229
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB)

    The applicability of supercomputer technology to test systems is examined. Potential supercomputer applications to test systems such as testing of very high-speed integrated circuit (VHSIC)-based avionics, fault-tolerance and fault-injection testing, and symptom-based diagnosis are discussed View full abstract»

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  • Diagnostic automation-a total systems approach

    Publication Year: 1988, Page(s):3 - 7
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (280 KB)

    Diagnostics automation in the integrated support concept is described in terms of its primary attributes and their normal relationship to one another. The description is set forth with the understanding that each attribute may have both managerial and technological aspects and, in the broadcast sense, could be evaluated from the standpoint of how it contributes to the resolution of chronic support... View full abstract»

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  • Rehosting the MATE ATLAS compiler

    Publication Year: 1988, Page(s):139 - 144
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (468 KB)

    The major modifications made to the MATE ATLAS Compiler (MAC) to host it on a VAX (in addition to the 1750A) are described. These modifications were implemented with three goals in mind: the modified compiler must execute from a single source, both on a VAX/VMS system and on a MIL-STD-1750A computer running under the MATE operating system (MOS); all files produced by the MAC must be completely tra... View full abstract»

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  • A case for Ada TPS programs

    Publication Year: 1988, Page(s):235 - 241
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (548 KB)

    An approach is proposed for integrating general-purpose Ada tools and special-purpose test-oriented tools in a test programming support environment. The approach capitalizes on the strengths of both Ada and ATLAS; test programs would be written in Ada except that they would use a standard test package, written in Ada and modeled after ATLAS, to implement the test-oriented functions. The standard t... View full abstract»

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  • ATLAS EXTEND, its effect on ATE system software

    Publication Year: 1988, Page(s):93 - 98
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (316 KB)

    The EXTEND statement permits the rapid expansion of the ATLAS vocabulary to meet the challenge of testing novel technologies. However, it has been argued that all of the standardization afforded by the very careful deliberations of the ATLAS language maintenance committee will be lost due to the EXTEND statement, because each ATLAS programmer will be free to invent his own vocabulary. A means wher... View full abstract»

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  • DoD initiatives in the automation of the testability/diagnostic design process

    Publication Year: 1988, Page(s):9 - 13
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (324 KB)

    The automation requirements for improving weapon-system diagnostic capability and the steps that the US Department of Defense is taking to meet these requirements are described. Requirements for automation, Department of Defense programs, and a joint-service diagnostic design workstation are described View full abstract»

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  • Implementation considerations of MATE data bases

    Publication Year: 1988, Page(s):145 - 148
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (340 KB)

    The MATE instrument database modeling has a large impact on the cost and schedule of TPS development. The language and language constructs for the instrument database are presented, along with a brief description of the signal-compensation macros, a description of the switch database, and a discussion of the limitations of the MATE ATLAS compilation system, which leads to a methodology of database... View full abstract»

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  • Solutions to current digital testing problems

    Publication Year: 1988, Page(s):17 - 20
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (280 KB)

    A model that describes how differences in interface and device propagation delays affect channel-to-channel skew performance is presented. A cost-effective digital test-system architecture, based on this model, is described. This architecture provides superior timing performance, while requiring only periodic maintenance calibration. Two ways to improve effective digital test rates are discussed. ... View full abstract»

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  • Back to the future for integrated diagnostics [electronic military systems]

    Publication Year: 1988, Page(s):199 - 201
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (260 KB)

    The integrated-diagnostics methodology to correcting high failure ambiguity rates seeks to provide an effective mix of diagnostic capabilities to improve fault detection and isolation. A certain measure of success has been obtained in the reduction of failure ambiguity; however, considerable improvements may be attained using built-in-monitoring equipment (BIME) or a visually oriented performance-... View full abstract»

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  • A systems approach to portable testers total test system integration (T2SI)

    Publication Year: 1988, Page(s):107 - 110
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB)

    A type of systems architecture that will produce the portable automatic test equipment (ATE) to meet the growing demand for true portability and versatility is discussed. An approach to resolving the standardization issued by providing a portable test system that is generic, reprogrammable, and reconfigurable in architecture, which will allow new technology insertion regardless of the test system ... View full abstract»

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  • The enemy is FA, CND, and RTOK [avionics testing]

    Publication Year: 1988, Page(s):185 - 189
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (368 KB)

    Integrated diagnostic requirements of a modern avionic subsystem are identified. A conceptual integrated diagnostic approach to meeting these requirements is postulated. Its essential elements, layered onboard built-in test (BIT), flight-line BIT augmentation, depot automatic test equipment (ATE), and a diagnostic support information system are described. Modern maintenance concepts into which the... View full abstract»

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  • Strategies for testing electro-optic devices

    Publication Year: 1988, Page(s):59 - 63
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (548 KB)

    A fully automatic modular ATLAS/CIIL-driven E/O (electro-optic) demonstrator is described. The system utilized collimation and sampling techniques to automate testing which has been previously performed manually. The resultant system is capable of testing existing units under test (UUTs) in a fraction of the time previously required. The system was used to test the F-18 E/O pod View full abstract»

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  • Integrated system testing and diagnosis with portable testers [weapon systems]

    Publication Year: 1988, Page(s):151 - 153
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (452 KB)

    The areas of technical and mechanical challenges associated with designing portable testers are examined; e.g., environment, accuracy, vertical compatibility, human interface, diagnostic capability, utility and portability. The approaches suggested are based on experience, maintenance philosophy, and present and anticipated technologies. Challenges in designing portable test equipment that require... View full abstract»

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  • Artificial intelligence: fighting the wrong battle? [Electronic equipment diagnosis]

    Publication Year: 1988, Page(s):269 - 275
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (392 KB)

    Problems encountered when applying artificial intelligence (AI) techniques to the diagnosis of electronic equipment are identified, and an approach to building a useful AI diagnostic tool is given. An outline of the system architecture, which will support the more sophisticated and data-intensive needs associated with automation, is given. Improvements to existing development tools for AI diagnost... View full abstract»

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  • Automatic testing of microwave semiconductors

    Publication Year: 1988, Page(s):309 - 315
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (588 KB)

    An automatic microwave semiconductor device tester has been developed which not only enables rapid automatic testing of a variety of microwave semiconductor devices at conditions selected by the operator, but also provides a means for processing, sorting, and storing the resulting test data. The development of the automatic test equipment (ATE) is described, along with how testing is accomplished,... View full abstract»

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  • Future automatic test equipment portable maintenance aids

    Publication Year: 1988, Page(s):111 - 115
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (312 KB)

    The concept of a portable maintenance aid (PMA) is proposed to aid in the advancement of weapon system maintenance and support. The PMA concept is discussed along with background information, desired capabilities, and the current status of some PMA development activities. The PMA attributes considered are memory and display requirements, technician interface, measurement capabilities, decision mak... View full abstract»

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  • VLSI design for fault-dictionary based testability

    Publication Year: 1988, Page(s):195 - 198
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (272 KB)

    The fault-dictionary approach to isolating failures in digital circuits provides inferior isolation accuracy compared to that which is now generally attained with other isolation methods. This limitation is particularly apparent when circuits which use bidirectional bus configurations are being tested. For this reason, fault-dictionary-based isolation has serious economic implications when testing... View full abstract»

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  • A machine vision board test system

    Publication Year: 1988, Page(s):65 - 68
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (236 KB)

    A standard-product electrical-board tester with a photometric capability is described. The use of such a photometric method allows direct coupling to the normal electrical-board tester driver-sensors and real-time, closed-loop, optoelectronic testing of display boards with existing automated test-generation software. The newt result is component-level fault diagnosis for both optical and electroni... View full abstract»

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  • Accounting for test system measurement uncertainties

    Publication Year: 1988, Page(s):47 - 51
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (368 KB)

    The development of approaches to tolerance tiering, introduced to meet the needs of complex weapon systems testing, is examined. Results of a study on the relationship between system measurement uncertainty and pass-fail rates of the test subjects are presented. These results indicate that the strategies adopted for tolerance tiering on any major weapons-system test facility can have important and... View full abstract»

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  • Dynamic testing of frequency agile transceivers

    Publication Year: 1988, Page(s):305 - 308
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (284 KB)

    New radio transceiver systems pose a measurement challenge to manufacturers and end users alike because many of the system parameters are different from those of previous-generation tactical radios, and test equipment to verify these parameters has not been available. Using dynamic testing of frequency-agile transceivers, the authors identify the important new system parameters, show how these par... View full abstract»

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  • Benefits of using ATE systems in the testing of printed circuit boards

    Publication Year: 1988, Page(s):25 - 29
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (308 KB)

    An industrial-based pragmatic review is given of the economic and product-quality consequences of automatic test equipment (ATE) usage in printed circuit-board testing. Results indicated that the use of ATE systems in printed circuit-board test operations results in definable economic and quality-level benefits. Supporting data behind this conclusion was provided by the test operations at twenty i... View full abstract»

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