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AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings

4-6 Oct. 1988

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  • AUTOTESTCON '88 Symposium Proceedings: Futuretest . IEEE International Automatic Testing Conference (Cat. No.88CH2575-9)

    Publication Year: 1988
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    Freely Available from IEEE
  • Convergence of two-level maintenance (military systems)

    Publication Year: 1988, Page(s):21 - 24
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (339 KB)

    The major supportability issue facing the US Department of Defense in the 1990s is increased operational availability of weapon platforms while reducing the logistic pipeline. The systems engineering methodology is discussed, along with a transition plan for existing systems that converges on two levels of maintenance. The proposed approach is top-down and structured for supportability through the... View full abstract»

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  • An embedded expert system for portable ATE

    Publication Year: 1988, Page(s):155 - 159
    Cited by:  Papers (3)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (500 KB)

    By embedding an expert system into portable automatic test equipment (ATE) the sophistication and capability of the testing system was increased while maintaining the compactness of the portable ATE. The results of this effort are presented, and include reductions in both the number and size of fault ambiguity sets, and the ability of the system to detect and isolate multiple faults. By combining ... View full abstract»

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  • VXIbus instrumentation-using tomorrow's technology today with existing IEEE-488 instruments and controllers

    Publication Year: 1988, Page(s):321 - 324
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (533 KB)

    The VXIbus architecture is reviewed, along with the history and current status of the VXIbus specification. How VXIbus instruments relate to the existing IEEE-488 (GPIB) instrumentation standard through an interface board that links the two technologies together is described. By understanding the fundamental VXIbus concepts and how they relate to familiar GPIB concepts, the ATE (automatic test equ... View full abstract»

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  • A diamond turned optical system for use in field test equipment

    Publication Year: 1988, Page(s):69 - 73
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (360 KB)

    An optical system was needed which would project visual, near-infrared signals and 8-12-μm target patterns into a multispectral military prime equipment. A system measurement requirement of ±100 μmrad is defined, which established an optical collimation requirement of 30 μm. This collimation requirement was further divided into an error budget of 5.9 μmrad optical fabrication to... View full abstract»

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  • Fault insertion methodology

    Publication Year: 1988, Page(s):119 - 123
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (272 KB)

    Relevant procedures, information, and guidelines are presented to validate and verify the effectiveness of a test program. The major areas of discussion are the test-program development sequence, component stress, and fault-insertion guidelines. Fault insertion, defined as the temporary installation of component and pin fault failures in a unit under test (UUT), can be destructive to the UUT, inte... View full abstract»

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  • A machine vision board test system

    Publication Year: 1988, Page(s):65 - 68
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (236 KB)

    A standard-product electrical-board tester with a photometric capability is described. The use of such a photometric method allows direct coupling to the normal electrical-board tester driver-sensors and real-time, closed-loop, optoelectronic testing of display boards with existing automated test-generation software. The newt result is component-level fault diagnosis for both optical and electroni... View full abstract»

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  • Rehosting the MATE ATLAS compiler

    Publication Year: 1988, Page(s):139 - 144
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (468 KB)

    The major modifications made to the MATE ATLAS Compiler (MAC) to host it on a VAX (in addition to the 1750A) are described. These modifications were implemented with three goals in mind: the modified compiler must execute from a single source, both on a VAX/VMS system and on a MIL-STD-1750A computer running under the MATE operating system (MOS); all files produced by the MAC must be completely tra... View full abstract»

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  • Future automatic test equipment portable maintenance aids

    Publication Year: 1988, Page(s):111 - 115
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (312 KB)

    The concept of a portable maintenance aid (PMA) is proposed to aid in the advancement of weapon system maintenance and support. The PMA concept is discussed along with background information, desired capabilities, and the current status of some PMA development activities. The PMA attributes considered are memory and display requirements, technician interface, measurement capabilities, decision mak... View full abstract»

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  • Accounting for test system measurement uncertainties

    Publication Year: 1988, Page(s):47 - 51
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (368 KB)

    The development of approaches to tolerance tiering, introduced to meet the needs of complex weapon systems testing, is examined. Results of a study on the relationship between system measurement uncertainty and pass-fail rates of the test subjects are presented. These results indicate that the strategies adopted for tolerance tiering on any major weapons-system test facility can have important and... View full abstract»

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  • Back to the future for integrated diagnostics [electronic military systems]

    Publication Year: 1988, Page(s):199 - 201
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (260 KB)

    The integrated-diagnostics methodology to correcting high failure ambiguity rates seeks to provide an effective mix of diagnostic capabilities to improve fault detection and isolation. A certain measure of success has been obtained in the reduction of failure ambiguity; however, considerable improvements may be attained using built-in-monitoring equipment (BIME) or a visually oriented performance-... View full abstract»

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  • Prototype implementation of a TPS development environment

    Publication Year: 1988, Page(s):257 - 260
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (308 KB)

    A hardware/software environment to assist TPS developers is described and is called the TPS development environment (TDE). The environment is based on a detailed analysis of the TPS development process, combined with proven software engineering techniques. The result is a system which automates many of the tasks which traditionally are manual, provides a standard means for TPS development, and was... View full abstract»

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  • Universal Ada Test Language (UATL) to support real-time software/system integration and factory/maintenance fault isolation [military avionics]

    Publication Year: 1988, Page(s):85 - 92
    Cited by:  Papers (6)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (796 KB)

    The Universal Ada Test Language (UATL), developed to encourage, and provide support to, the use of Ada in eventually replacing ATLAS, BASIC, and other special-purpose test control languages for generating automatic test programs, is presented. The UATL consists of a set of modular, portable, Ada packages that define a higher-level test language that supports the generation of test programs in Ada.... View full abstract»

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  • Strategies for testing electro-optic devices

    Publication Year: 1988, Page(s):59 - 63
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (548 KB)

    A fully automatic modular ATLAS/CIIL-driven E/O (electro-optic) demonstrator is described. The system utilized collimation and sampling techniques to automate testing which has been previously performed manually. The resultant system is capable of testing existing units under test (UUTs) in a fraction of the time previously required. The system was used to test the F-18 E/O pod View full abstract»

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  • Artificial intelligence: fighting the wrong battle? [Electronic equipment diagnosis]

    Publication Year: 1988, Page(s):269 - 275
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (392 KB)

    Problems encountered when applying artificial intelligence (AI) techniques to the diagnosis of electronic equipment are identified, and an approach to building a useful AI diagnostic tool is given. An outline of the system architecture, which will support the more sophisticated and data-intensive needs associated with automation, is given. Improvements to existing development tools for AI diagnost... View full abstract»

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  • Hybrid architecture of field-tested diagnostic expert system

    Publication Year: 1988, Page(s):281 - 286
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (448 KB)

    Three approaches to diagnostic expert systems have emerged: rule-based, dependency models, and deep-knowledge models. A fourth approach is a hybrid architecture that combines two or more of the three pure forms so that the strengths of one support the weaknesses of the other and vice versa. The advantages and disadvantages of each of these approaches are examined. AI-Ferret, a system that was fiel... View full abstract»

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  • An automatic display tester for the nineties

    Publication Year: 1988, Page(s):295 - 299
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (340 KB)

    An approach to automatic display testing called the display test system (DTS) is described. Spatial, spectral, and luminescent properties of displays can be tested automatically and under computer control. The DTS uses test program sets to accommodate a wide variety of displays for military, medical, computer, and consumer applications. The system incorporates a charge-coupled device (CCD) sensor ... View full abstract»

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  • Benefits of using ATE systems in the testing of printed circuit boards

    Publication Year: 1988, Page(s):25 - 29
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (308 KB)

    An industrial-based pragmatic review is given of the economic and product-quality consequences of automatic test equipment (ATE) usage in printed circuit-board testing. Results indicated that the use of ATE systems in printed circuit-board test operations results in definable economic and quality-level benefits. Supporting data behind this conclusion was provided by the test operations at twenty i... View full abstract»

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  • MATE management information system-an innovative design

    Publication Year: 1988, Page(s):135 - 137
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (208 KB)

    The US Air Force's MATE integration program encompasses interrelated information pertaining to MATE products, standards, applications, communications and management tools. For the MATE program to continue to evolve in a coherent and coordinated fashion, a means for managing this mass of data, called MATEMIS (MATE management information system), was developed. MATEMIS was designed to approach the t... View full abstract»

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  • A systems approach to portable testers total test system integration (T2SI)

    Publication Year: 1988, Page(s):107 - 110
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB)

    A type of systems architecture that will produce the portable automatic test equipment (ATE) to meet the growing demand for true portability and versatility is discussed. An approach to resolving the standardization issued by providing a portable test system that is generic, reprogrammable, and reconfigurable in architecture, which will allow new technology insertion regardless of the test system ... View full abstract»

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  • Hybrid diagnostic strategy for an expert system controlled automatic test system (EXATS)

    Publication Year: 1988, Page(s):41 - 46
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (512 KB)

    A prototype automated diagnosis system for a real-world unit under test (UUT) is presented. The system features a time-optimized test sequence with feedback of correctly diagnosed failures and a reduction of effort for test program development and maintenance. The diagnostic strategy used involves associative and model-based diagnosis. The experimental knowledge is organized as a hierarchical rule... View full abstract»

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  • VLSI design for fault-dictionary based testability

    Publication Year: 1988, Page(s):195 - 198
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (272 KB)

    The fault-dictionary approach to isolating failures in digital circuits provides inferior isolation accuracy compared to that which is now generally attained with other isolation methods. This limitation is particularly apparent when circuits which use bidirectional bus configurations are being tested. For this reason, fault-dictionary-based isolation has serious economic implications when testing... View full abstract»

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  • Solutions to current digital testing problems

    Publication Year: 1988, Page(s):17 - 20
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    A model that describes how differences in interface and device propagation delays affect channel-to-channel skew performance is presented. A cost-effective digital test-system architecture, based on this model, is described. This architecture provides superior timing performance, while requiring only periodic maintenance calibration. Two ways to improve effective digital test rates are discussed. ... View full abstract»

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  • Integrated diagnostic concepts for advanced technology rotorcraft

    Publication Year: 1988, Page(s):171 - 177
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (640 KB)

    It is proposed to achieve integrated diagnostic systems for advanced rotorcraft by combining the concepts of design-for-testability (DFT), expert systems, advanced maintenance architectures, portable maintenance aids, and electronic publications. Mechanical and avionic systems of the rotorcraft would both be covered by the diagnostic system. The problem is broken down into mechanical diagnostics, ... View full abstract»

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  • An overview of SEDACS: a state of the art TRD/TPS environment

    Publication Year: 1988, Page(s):253 - 255
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB)

    The support equipment data acquisition and control system (SEDACS) was developed to allow a prime contractor to control the development of test requirement documents (TRD) and associated ATLAS programs for the suite of avionics residing on an aircraft. The system allows multiple avionics manufacturers to supply data for the test program set (TPS) to SEDACS directly from facilities located in vario... View full abstract»

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