Test Workshop, 2000. Proceedings. IEEE European
Date 23-26 May 2000
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Displaying Results 1 - 25 of 27
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Proceedings IEEE European Test Workshop
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PDF (199 KB)
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Author index
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PDF (61 KB)
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A system level boundary scan controller board for VME applications [to CERN experiments]
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PDF (420 KB)
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Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path
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PDF (468 KB)
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Combining symbolic and genetic techniques for efficient sequential circuit test generation
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PDF (636 KB)
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On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits
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PDF (496 KB)
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LEAP: An accurate defect-free IDDQ estimator
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PDF (456 KB)
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Test challenges in nanometer technologies
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PDF (716 KB)
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Microprocessor cores
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PDF (384 KB)
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Comparison of defect detection capabilities of current-based and voltage-based test methods
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PDF (504 KB)
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