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16-19 Sept. 2013

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Displaying Results 1 - 25 of 59
  • [Front cover]

    Publication Year: 2013, Page(s): 1
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    Freely Available from IEEE
  • [Copyright notice]

    Publication Year: 2013, Page(s): ii
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 2013, Page(s):iii - ix
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    Freely Available from IEEE
  • Message from the general chairman

    Publication Year: 2013, Page(s):x - xxvi
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    Freely Available from IEEE
  • Design and manufacturing of lauch support test set for Arirang-3

    Publication Year: 2013, Page(s):1 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1210 KB) | HTML iconHTML

    Korea Aerospace Research Institute launched Korea's multi-purpose satellite, Arirang-3, on May 18, 2013. Arirang-3 has been performing its mission successfully. A Launch Support Test Set (LSTS) was used for the setting of the final satellite launch configuration and to monitor satellite status under the harsh launch environment. The LSTS starts its function several hours before launch by supplying... View full abstract»

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  • Developing new Automatic Test Equipments (ATE) using systematic design approaches

    Publication Year: 2013, Page(s):1 - 7
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1313 KB) | HTML iconHTML

    Keeping Automatic Test Equipments (ATE) current with technology is one of the major challenges in automatic testing world. Needs and priorities can quickly evolve throughout the life cycle of ATEs and handling obsolescence via performing upgrades on hardware and software can be impossible after several years. While developing Test Program Sets (TPS), if existing ATE systems cannot meet the necessa... View full abstract»

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  • Incorporating optical test capabilities into a depot test platform

    Publication Year: 2013, Page(s):1 - 4
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (720 KB) | HTML iconHTML

    This paper reviews how an existing test platform that supports a variety of missile launcher systems; LAU 7, LAU 88, LAU 117, LAU 127, LAU 128, and LAU 129, was modified to address support for Paveway laser guided bomb kits. Specifically, support for the Paveway system required the addition of an optical test bench as well as adding additional simulation and test capabilities to accurately simulat... View full abstract»

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  • A modular, extendible and reusable test configuration for system-level manufacturing tests

    Publication Year: 2013, Page(s):1 - 7
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2373 KB) | HTML iconHTML

    This paper explores an effective solution for a test configuration to perform system-level manufacturing tests without use of system management/user interface software of system under test (SUT). A generic, computer aided and modular test configuration, which acts in combination and in an integrated way with the management unit(s) of the SUT over Ethernet connectivity is proposed as a solution. Us... View full abstract»

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  • IVI revisited: Building next-generation test systems with open FPGAs while preserving software APIs

    Publication Year: 2013, Page(s):1 - 5
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1145 KB) | HTML iconHTML

    Test equipment vendors are increasingly supplying modular or synthetic instrumentation modules with end-user programmable FPGAs. A significant challenge in developing custom firmware for these devices is preserving standard software APIs, as firmware changes often require modification of the software API. A new software and firmware architecture, instrument driver FPGA extensions, provides the com... View full abstract»

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  • Development of dual-channel high-speed data acquisition card based on PCI bus

    Publication Year: 2013, Page(s):1 - 5
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (699 KB) | HTML iconHTML

    This paper develops a dual channel high speed data acquisition card based on PCI bus, with 1GSa/s dual-channel sampling rate and 2GSa/s single-channel sampling rate, 8-bit of resolution, and 2GB of high-speed data cache. This paper puts forward an overall scheme of the system, and uses key ADC chip(ADC08D1000) to realize the acquisition of dual channel/single channel signal, and uses DDR2 SDRAM to... View full abstract»

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  • Implementation of programmable delay lines on off-the-shelf FPGAs

    Publication Year: 2013, Page(s):1 - 4
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (318 KB) | HTML iconHTML

    The programmable delay line is a key component in test and measurement applications; it facilitates key functionalities such as de-skewing, timing adjustment, edge placement, and time-to-digital conversions. In this work, we investigate the implementation of programmable delay lines on off-the-shelf FPGAs (field programmable gate array). Two flavors of delay lines, coarse and fine, are realized an... View full abstract»

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  • A holistic approach to reducing the life cycle costs of test

    Publication Year: 2013, Page(s):1 - 5
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1096 KB) | HTML iconHTML

    Many studies have shown that 90% of the production costs are cast before the first unit flows off the production line. Therefore, it's very difficult to reduce the cost of the bill of material, assembly, capital, or test after the fact. Historically, design engineers focus on material and assembly cost but neglects the impact of test design, test implementation, test labor and test equipment costs... View full abstract»

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  • Avionic support for the Foreign Military Sales customer

    Publication Year: 2013, Page(s):1 - 5
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (612 KB) | HTML iconHTML

    As military budgets decline, opportunities to maintain economies of scale in weapon system production may increasingly depend upon Foreign Military Sales (FMS). FMS can also spread development costs among all customers, reducing the burden each must bear. A large scale weapon system integrator is in a unique position to observe the trends in FMS. A manufacturer based depot concept can lower up fro... View full abstract»

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  • Managing costs through test system manageability

    Publication Year: 2013, Page(s):1 - 5
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (808 KB) | HTML iconHTML

    The concept of system manageability has been a part of information technology systems for decades. Manageability functions include asset discovery and inventory, software deployment and updates, system configuration and control, and health monitoring, logging and alerting. As the computing power and network connectivity of test and measurement systems increases, leveraging these manageability func... View full abstract»

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  • Wideband 20 GHz RF digitizer and python-based open application framework for test and measurement

    Publication Year: 2013, Page(s):1 - 10
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1685 KB) | HTML iconHTML

    The measurement and analysis of modern wireless signals is a complex task requiring wideband signal analyzers that can operate over large frequency ranges. In addition they should meet other stringent specifications such as those for dynamic range and noise figure. These signal analyzers are expensive and similar, less expensive analyzers lack the functionality and specifications to meet the requi... View full abstract»

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  • Phase coherent signal creation with up to twelve channels with high-performance multi-channel Arbitrary Waveform Generator

    Publication Year: 2013, Page(s):1 - 4
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (886 KB) | HTML iconHTML

    Radar signal generation requires a signal source with excellent Spurious Free Dynamic Range (SFDR) and very large bandwidth. Highest performance Arbitrary Waveform Generators (AWG) are capable to generate radar signals with 12 or 14 bit resolutions. This high resolution is mandatory to achieve an SFDR of up to -80 dBc. Besides the high DAC resolution, sample rates in the range of up to 8 GSa/s or ... View full abstract»

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  • Using RF recording techniques to resolve interference problems

    Publication Year: 2013, Page(s):1 - 6
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (922 KB) | HTML iconHTML

    The user environment for wireless devices is complex and includes many sources of interference, from the multitude of devices in the wireless landscape or other non-communications-based RF sources. As the RF power is spread over wider bandwidths to improve range resolution, increase data rates, and decrease probability of detections, RF devices encounter a wider bandwidth of interference. As desig... View full abstract»

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  • Simplify ATE development and measurements

    Publication Year: 2013, Page(s):1 - 4
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1079 KB) | HTML iconHTML

    RF and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT). Configuring switches into a switch matrix system enables signal routing from multiple instruments to single or multiple DUTs. This allows multiple tests to be performed with the same setup, eliminating the need for frequent connects and disconnects. The enti... View full abstract»

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  • Using cloud computing to enhance automatic test equipment testing and maintenance capabilities

    Publication Year: 2013, Page(s):1 - 6
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (625 KB) | HTML iconHTML

    The purpose of this paper is to present a conceptual approach and to make practical recommendations on how to improve the current Automatic Test Equipment (ATE) testing and maintenance capabilities by utilizing the existing cloud computing model to build a globally linked ATE maintenance system. The basic tenet of the ATE community is to support a multi-tiered maintenance concept which, in general... View full abstract»

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  • LabVIEW based control software for finger force sensor instrumentation design

    Publication Year: 2013, Page(s):1 - 6
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2268 KB) | HTML iconHTML

    This report describes National Instruments (NI) LabVIEW software for the control of finger force instrumentation for the quantification of Repetitive Stress Injury (RSI), Carpal Tunnel Syndrome (CTS), or other applications requiring automated data acquisition of applied finger force using resistive type force sensors. The quantification of finger force requires the precise data collection from res... View full abstract»

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  • Using Clifford Algebra to position a test fixture

    Publication Year: 2013, Page(s):1 - 5
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1021 KB) | HTML iconHTML

    This paper is about using Clifford Algebra to position a gimbal test fixture that is used during infrared laser (IR) pointing system testing. The Clifford Algebra Cl3, 0 specifically known as the Algebra of Physical Space (APS) is useful as a unifying mathematical frame work in physics that can describe classical physics, special relativity, general relativity, electro-dynamics, and qua... View full abstract»

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  • Bus testing in a modern era

    Publication Year: 2013, Page(s):1 - 10
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (774 KB) | HTML iconHTML

    The application of IEEE Std. 1641 to Bus testing has been (and continues to be) a major hurdle to its full adoption on deployed ATE systems. The IEEE Std 1641-2010 standard had several new primitives added for support of both Digital and Bus testing. These digital changes [8] focused primarily on the digital aspects usage, and although it added BSCs to support bus communication and protocols, the ... View full abstract»

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  • Verifying fibre channel FC-AV ULP functionality in a UUT

    Publication Year: 2013, Page(s):1 - 5
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (771 KB) | HTML iconHTML

    As electronic warfare becomes more advanced, many obsolete military avionics components are being replaced with more modern components that rely on high speed busses to communicate. Among the protocols running on these high speed busses is the Fiber Channel FC-AV Upper Level Protocol. This protocol provides a means of streaming large volumes of audio and video data at high speeds over a Fiber Chan... View full abstract»

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  • AXIe local bus architecture delivers unprecedented bus speed and flexibility

    Publication Year: 2013, Page(s):1 - 5
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (700 KB) | HTML iconHTML

    AXIe is commonly referred to as the "big brother" of PXI. This is because it shares many of the features of PXI (open modular structure, PCI Express fabric, similar software) while deploying a large board size, power, and cooling matching that found in high performance instruments. However, it also adds one very unique aspect: the AXIe local bus. In this paper the authors describe the local bus, a... View full abstract»

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  • What are we able to do with test data or using LabVIEW to hone in on actual cause of failures

    Publication Year: 2013, Page(s):1 - 6
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (386 KB) | HTML iconHTML

    As systems/circuits degrade or high failure performance trends occur over time, there is an increased probability of predicting with reasonable confidence, when a given assembly or component is likely to experience an insipient fault or a cause a mission failure. Also, performance trends can be applied to algorithms to enhance the testing process. However, profound predictions can be made accurate... View full abstract»

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