VLSI Technology, Systems, and Applications, 1999. International Symposium on
Date 1999
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Design and simulation of addressable failure site test structure for IC process control monitor
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PDF (280 KB)
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1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)
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PDF (545 KB)
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High-performancf ALPHA microprocessor design
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PDF (372 KB)
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Author index
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PDF (125 KB)
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High quality ultra-thin (2.4 nm) oxide prepared by clustered vertical furnace with in-situ HF-vapor pre-gate oxide cleaning
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PDF (216 KB)
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Layout design on bond pads to improve the firmness of bond wire in packaged IC products
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PDF (276 KB)
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Implementation of a high speed multiport register file in a 1.8 V, 0.25 μm CMOS bulk and SOI technology
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PDF (236 KB)
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New divided-source structure to eliminate instability of threshold voltage in p-channel flash memory using channel hot-hole-induced-hot-electron programming
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PDF (268 KB)
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ASET activities toward the 21st century
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PDF (144 KB)
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Experimental investigation on the HBM ESD characteristics of CMOS devices in a 0.35-μm silicided process
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PDF (316 KB)
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High-speed VLSI implementation of reduced complexity sequence estimation algorithms with application to Gigabit Ethernet 1000Base-T
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PDF (328 KB)
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A case for a multitrace cluster
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PDF (232 KB)
