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10-13 Sept. 2012

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Displaying Results 1 - 25 of 73
  • [Cover]

    Publication Year: 2012, Page(s): c1
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    Freely Available from IEEE
  • [Copyright notice]

    Publication Year: 2012, Page(s): ii
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 2012, Page(s):iii - xiii
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  • [Front matter]

    Publication Year: 2012, Page(s):xiv - xxxii
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    Freely Available from IEEE
  • Preserving test program set (TPS) performance after legacy automated test equipment (ATE) upgrade

    Publication Year: 2012, Page(s):1 - 6
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (656 KB) | HTML iconHTML

    Legacy ATE typically requires economical obsolescence upgrades ranging from minor to major at various points during its life cycle, due to availability and viability of repair assets. System level replacement costs are generally prohibitive. For mature systems where significant investments in TPS software and hardware have been made, there is substantial incentive to maintain compatibility with le... View full abstract»

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  • A novel approach to RF/microwave stimulus for legacy ATE

    Publication Year: 2012, Page(s):7 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (863 KB) | HTML iconHTML

    Problem to be solved: With the Department of Defense's concerted effort to consolidate test systems, and associated TPSs (Test Program Set) to a common platform; backward compatibility is an increasing difficult task due to advances (differences) in newer test equipment. When a TPS is being migrated, to a different test platform, there are a number challenges that will be encountered in both softw... View full abstract»

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  • CASS / VDATS interoperability exploration

    Publication Year: 2012, Page(s):9 - 13
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (922 KB) | HTML iconHTML

    Reducing “the total cost of Automatic Test Systems (ATS) to [the] Department of Defense (DoD) while defining ways to use commercial products on the market and preserving our legacy investments in Test Program Sets” is the goal of the DoD ATS Executive Directorate [1]. The Consolidated Automated Support System (CASS) / Versatile Depot Automatic Test Station (VDATS) Interoperability Ex... View full abstract»

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  • Test Strategies for minimizing the overall cost of test in moving from “cost based/government furnished equipment” to “firm fixed price” contracts

    Publication Year: 2012, Page(s):14 - 18
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (655 KB) | HTML iconHTML

    As government aerospace defense contracts move to firm fixed price (FFP) and away from cost-based contracts companies are faced with re-structuring the whole product life cycle (PLC) process. Ensuring solid development and manufacturing strategies to meet the new emphasis toward Fixed Firm Price (FFP) procurements is crucial for the financial success of fulfilling the contract. An important aspect... View full abstract»

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  • Component obsolescence management model for long life cycle embedded system

    Publication Year: 2012, Page(s):19 - 24
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (393 KB) | HTML iconHTML

    This paper discusses the component obsolescence problem and presents a mathematic model for life cycle analysis of long life cycle embedded system maintenance. This model can estimate minimized management costs for different system architecture. Matlab is used to generate a graph and Lingo is used for linear programming. A simple CAN controller system case study is shown to apply this model. A min... View full abstract»

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  • Test means at airbus military: Covering the aircraft test life-cycle with a common and standard approach

    Publication Year: 2012, Page(s):25 - 28
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (987 KB) | HTML iconHTML

    Several decades of experience at test means led Airbus Military, by year 2000, to define and develop a common approach to cover all test activities at aircraft life-cycle. The continuous evolution of the technologies involved, as well as the evolution of the industry requirements, pushes the company to a new generation of test means. The right choice at every issue will be critical to future test ... View full abstract»

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  • Life cycle planning from product development to long term sustainment

    Publication Year: 2012, Page(s):29 - 33
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (989 KB) | HTML iconHTML

    One of the major challenges engineers face when developing military test systems is balancing the life cycle mismatch of test equipment that's commonly deployed for 20+ years with the shorter life cycle of commercial-off-the-shelf (COTS) components often used in those systems. To ensure long term supportability of these systems, it is important to plan for obsolescence issues starting in the produ... View full abstract»

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  • Boundary scan as a system-level diagnostic tool

    Publication Year: 2012, Page(s):34 - 38
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1642 KB) | HTML iconHTML

    Boundary scan is a testability tool intended to provide independent observability and controllability at the periphery of the IC. For the past two decades, it has been used successfully in manufacturing tests to identify shorts, opens and other manufacturing defects. Until now, however, it has not been widely used as a system level diagnostic tool, especially to diagnose military systems requiring... View full abstract»

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  • Testability modeling usage in design-for-test and product lifecycle cost reduction

    Publication Year: 2012, Page(s):39 - 41
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (586 KB) | HTML iconHTML

    Weapon systems have become increasingly complex and customer funding has become constricted. Customers and contractors are in an environment where the cost of test systems has to be reduced yet still test effectively in order to remain competitive. In an effort to reduce the total development and lifecycle cost, companies are using Design-For-Test (DFT) methodologies to increase Built-In-Test (BIT... View full abstract»

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  • Data awareness from ATE

    Publication Year: 2012, Page(s):42 - 45
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (610 KB) | HTML iconHTML

    With a data awareness culture in place within the organization with data storage, reporting, analysis and real-time SPC, the data infrastructure can easily be recognized as a strategic asset. When customers inquire about test data regarding a problem in the field, it is quickly queried and analyzed in a productive manner. With an SPC system in place, there will be fewer escapes and therefore less ... View full abstract»

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  • Low-cost and small footprint solution for testing low-voltage differential signal video displays

    Publication Year: 2012, Page(s):49 - 53
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (410 KB) | HTML iconHTML

    In recent years, liquid crystal displays (LCD) have almost completely replaced older technologies such as cathode ray tube (CRT) displays in many industrial, commercial, aerospace, and military applications due to their increased efficiency, decreased weight, and smaller size. Likewise, the technology used to transmit video signals to LCD displays has evolved from analog standards such as the Nati... View full abstract»

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  • Increasing the resolution of a uniform quantizer using a deterministic dithering signal

    Publication Year: 2012, Page(s):54 - 57
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (310 KB) | HTML iconHTML

    Adding a dither signal to a signal to be measured is a known technique for improving the accuracy of a quantizer output. In this paper a measurement called effective bits is used to compare un-dithered signals, stochastically dithered signals, and deterministically dithered signals. A deterministic dither signal is found that adds one effective bit using only two dither points. With this dither si... View full abstract»

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  • Enhancing vibration analysis by embedded sensor data validation technologies

    Publication Year: 2012, Page(s):58 - 63
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (663 KB) | HTML iconHTML

    This paper discusses a Structural Health Monitoring framework developed for aircraft airframes, where the objective is high performance vibration-based diagnostics using validated data from low power and miniaturized smart sensors. Although considerable research has been devoted to the structural health monitoring discipline, successful field implementations have not been widely achieved. This res... View full abstract»

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  • Interpreting system switching specifications and how they relate to waveform quality

    Publication Year: 2012, Page(s):64 - 69
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (466 KB) | HTML iconHTML

    This paper discusses how to interpret system specifications that involve the switching subsystem and how these specifications can be used to predict the effect on the signals passing through the system and if the system will even support those signals. These specifications include bandwidth, crosstalk and insertion loss. Actual waveform examples are included showing how the switching path can dram... View full abstract»

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  • Applying system engineering processes to legacy test program set modernization

    Publication Year: 2012, Page(s):70 - 74
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (620 KB) | HTML iconHTML

    Automatic Test Equipment (ATE) Engineering often involves modernization of legacy test systems. With anticipated reductions in the DoD budgets and increasing system test complexity, modernization can be quite challenging. Most of the time these legacy systems have minimal or occasionally no documentation. How do you get from an aging legacy system lacking documentation to an updated modern test sy... View full abstract»

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  • Implementing a cots design approach to reduce development time of complex microwave test adapters

    Publication Year: 2012, Page(s):75 - 79
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (739 KB) | HTML iconHTML

    Large mil/aero prime contractors have been tasked to design and develop Radio Frequency (RF) and Microwave test systems with increasing pressure to deliver against very aggressive schedules. These systems are often quite complex and can include specifications and requirements that are classified, requiring design engineers to have appropriate security clearances. Rapid design cycles are needed to ... View full abstract»

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  • Windows Presentation Foundation (WPF) technology meets the challenges of operator interface design in automatic test systems

    Publication Year: 2012, Page(s):80 - 83
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (606 KB) | HTML iconHTML

    The operator interface is the critical link between a test system and its operator. When a test fails, the operator must quickly process the results and decide whether to troubleshoot, rerun or halt the test based on information displayed by the software. An effective and well-designed operator interface can increase productivity, reduce testing time and operator error as well as improve adoption ... View full abstract»

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  • Electronic countermeasures (ECM) technique measurements and automation methods

    Publication Year: 2012, Page(s):88 - 92
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1453 KB) | HTML iconHTML

    Test and verification of ECM Systems can prove to be challenging due to the dynamically changing RF signals encountered. To support development of an ECM system it is important to provide a method of test for ECM technique measurements. This method needs to not only support the development and integration phase of the system, but also final performance and functional verification. Having a method ... View full abstract»

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  • Using RF Recording Techniques to Resolve Wireless Channel Interference Problems

    Publication Year: 2012, Page(s):93 - 98
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1274 KB) | HTML iconHTML

    The user environment for wireless devices is complex and includes many sources of interference, from the multitude of devices in the wireless landscape or other non-communications-based RF sources. As the RF power is spread over wider bandwidths to improve range resolution, increase data rates, and decrease probability of detections, RF devices encounter a wider bandwidth of interference. As desig... View full abstract»

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  • Automated continuity tester for large wire-wrapped avionics chassis

    Publication Year: 2012, Page(s):99 - 104
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (693 KB) | HTML iconHTML

    In the 1960s and 70s wire wrap circuit construction was very common in electronics manufacturing. Although, its use has fallen out of favor in manufacturing due to surfacemount technology along with high-quality, rapid, and inexpensive professional printed circuit board production, it is still useful for prototyping. As one might imagine, manually testing the continuity of a large, complex wire-wr... View full abstract»

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  • Using a plug-in model to simplify and enhance ATE test software capabilities

    Publication Year: 2012, Page(s):105 - 107
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (681 KB) | HTML iconHTML

    An ATE software or test executive must perform a variety of tasks in addition to simply sequencing and running functional tests on the device under test (DUT). These tasks include prompting the test operator for a serial number and displaying test results, logging the results of the tests to a report, test system calibration and self-tests, and more. In most test executive software applications, t... View full abstract»

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