Applied Statistical Pattern Recognition (Ref. No. 1999/063), IEE Colloquium on

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Applied Statistical Pattern Recognition (Ref. No. 1999/063), IEE Colloquium on

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Support vector machines: a tutorial overview and critical appraisal

Knowledge extraction and insertion from radial basis function networks

A little introduction to wavelets

An introduction to robust shape classification

Textured image segmentation using multiresolution Markov random fields

One-to-many mappings, continuity constraints and latent variable models

Recognizing anomalies in weather radar images

Detecting cells in DIC microscope images using a high level Bayesian model and template matching

Non-linear feature space transformations

IEE Colloquium on Applied Statistical Pattern Recognition (Ref. No. 1999/063)

Minimum description length and the inference of scene structure from images

Using statistical models to interpret complex and variable images

Robust model-based signal analysis and identification

Analysis of the response of an auto adaptive matched filter

Recognising 2-D shapes from incomplete boundaries

A classification approach for estimating prior models in statistical image restoration

Texture recognition or classification using statistics

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