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IEEE Design & Test

Issue 4 • Aug. 2017

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Displaying Results 1 - 19 of 19
  • Front Cover

    Publication Year: 2017, Page(s): C1
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  • Cover 2

    Publication Year: 2017, Page(s): C2
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  • IEEE Design&Test publication information

    Publication Year: 2017, Page(s): 1
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  • Table of Contents

    Publication Year: 2017, Page(s):2 - 3
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  • Cyber-Physical Systems Security and Privacy

    Publication Year: 2017, Page(s): 4
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  • Guest Editors’ Introduction: Cyber-Physical Systems Security and Privacy

    Publication Year: 2017, Page(s):5 - 6
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  • Security and Privacy in Cyber-Physical Systems: A Survey of Surveys

    Publication Year: 2017, Page(s):7 - 17
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (613 KB) | HTML iconHTML

    The following is a survey on surveys and may help the interested reader to find a way through the jungle of literature on the security and CPS topics out there already. In order to ease the search, the authors have provided a classification in CPS Domains, Attacks, Defenses, Research-trends, Network-security, Security level implementation, and Computational Strategies which makes this survey a uni... View full abstract»

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  • Side Channels of Cyber-Physical Systems: Case Study in Additive Manufacturing

    Publication Year: 2017, Page(s):18 - 25
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (902 KB) | HTML iconHTML

    As 3-D printers are becoming increasingly relevant in various domains, including critical infrastructure, cyber-security questions naturally arise. This article investigates how to leverage analog emissions (vibration, acoustic, magnetic, and power) of 3-D printers in order to identify the printed object and compromise confidentiality. — Michail Maniatakos, New York University Abu D... View full abstract»

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  • Comparative Study of Authenticated Encryption Targeting Lightweight IoT Applications

    Publication Year: 2017, Page(s):26 - 33
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1284 KB) | HTML iconHTML

    This article focuses on detecting attacks to power system with the help of cyber-physical co-modeling. The foundational algorithm used to detect attacks is a new dynamic state estimator that can provide real-tie models of the system improving over legacy state estimators and three-phase linear state estimators. This new system can help operators of the power grid detect when device settings have b... View full abstract»

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  • Data Attack Detection and Command Authentication via Cyber-Physical Comodeling

    Publication Year: 2017, Page(s):34 - 43
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1917 KB) | HTML iconHTML

    In this article, the authors study the problem of efficient authenticated encryption algorithms for use in embedded devices. In particular, they describe the ongoing Competition for Authenticated Encryption: Security, Applicability, and Robustness (CAESAR), and compare the different candidates of the competition with respect to a variety of metrics of relevance to constrained systems, including th... View full abstract»

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  • Fault Diagnosis and Network Anomaly Detection in Water Infrastructures

    Publication Year: 2017, Page(s):44 - 51
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (852 KB) | HTML iconHTML

    Testing cybersecurity techniques for critical infrastructure on real-world setups is economically infeasible and lacks flexibility. In order to address this challenge, this article presents a testbed for water infrastructures capable of accurately assessing the effectiveness of cybersecurity solutions. –Michail Maniatakos, New York University Abu Dhabi View full abstract»

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  • A Platform to Analyze DDR3 DRAM’s Power and Retention Time

    Publication Year: 2017, Page(s):52 - 59
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (534 KB) | HTML iconHTML

    Editor’s note: The authors explore the intrinsic trade-off in a DRAM between the power consumption (due to refresh) and the reliability. Their unique platform allows tailoring to the design constraints depending on whether power consumption, performance or reliability has the highest design priority. —Jörg Henkel, Karlsruhe Institute of Technology View full abstract»

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  • Overview of 3-D Architecture Design Opportunities and Techniques

    Publication Year: 2017, Page(s):60 - 68
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (204 KB) | HTML iconHTML

    Three-dimensional (3-D) integration, a breakthrough technology to achieve “More Moore and More Than Moore,” provides numerous benefits, e.g., higher performance, lower power consumption, and higher bandwidth, by utilizing vertical interconnects and die/wafer stacking. This paper presents an overview of 3-D integration along with various design challenges and recent innovations. ... View full abstract»

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  • Accellera’s Support for ESL Verification and Stimulus Reuse

    Publication Year: 2017, Page(s):69 - 75
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (494 KB) | HTML iconHTML

    During its 16-year existence Accellera has created 19 industry standards or methods, nine of which are IEEE standards. Its Universal Verification Methodology (UVM) standard was donated to the IEEE 1800.2 Working Group, while its Portable Stimulus standard is approaching balloting within the organization. View full abstract»

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  • Report on DATE 2017 in Lausanne

    Publication Year: 2017, Page(s):76 - 77
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  • TTTC News

    Publication Year: 2017, Page(s):78 - 79
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  • Practice Makes Perfect

    Publication Year: 2017, Page(s): 80
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  • Cover 3

    Publication Year: 2017, Page(s): C3
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  • Cover 4

    Publication Year: 2017, Page(s): C4
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Aims & Scope

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.  

It was published as IEEE Design & Test of Computers between 1984 and 2012.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Joerg Henkel
Chair for Embedded Systems (CES)
Karlsruhe Institute of Technology (KIT)