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1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)

25-27 Aug. 1998

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Displaying Results 1 - 25 of 106
  • IEEE Systems Readiness Technology Conference - Test Technology For The 21st Century [front matter]

    Publication Year: 1998, Page(s):i - xxvi
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    Freely Available from IEEE
  • Automated test pattern generation for VHDL codes of VLSI chips

    Publication Year: 1998
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (40 KB)

    Summary form only given, as follows. This paper introduces a methodology for automated test pattern generation (ATPG) for VHDL codes of VLSI chips. A VHDL specification of a VLSI chip can be modeled as a data flow graph based EFSM (Extended Finite State Machine). The EFSM model is then checked for any of the three types of defined consistencies. Techniques available for finite state machines (FSM)... View full abstract»

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  • Analysis of JDAM tests at China Lake

    Publication Year: 1998
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (34 KB)

    Summary form only given, as follows. This paper examines telemetry signal levels of the Joint Direct Air Munition (JDAM) tests at China Lake NAWC. Significant received signal level variations were observed as the munition approached impact. This paper presents and examines two simple multipath models to explain the received signal variations. The first model assumes a flat Earth and a single specu... View full abstract»

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  • Automated translation of ASIC designs

    Publication Year: 1998
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (37 KB)

    Summary form only given, as follows. Tremendous advances in application specific integrated circuit (ASIC) technology are continually being made in speed, power, and gate density. This paper discusses the development of an automated translation process that allows the advances in ASIC technology to be applied to existing ASIC designs without having to redesign the ASICs. This translation process i... View full abstract»

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  • A handheld data terminal for industrial applications

    Publication Year: 1998
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (33 KB)

    Summary form only given, as follows. In the area of embedded computer systems there is often a need for a simple and rugged operator interface in order to allow the user to communicate with the system. This paper describes the design and manufacture of a hand-held data terminal capable of sending and receiving data from an embedded host computer using serial communications. The intended result of ... View full abstract»

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  • Backup generator control and monitoring system for KSL TV

    Publication Year: 1998
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (37 KB)

    Summary form only given, as follows. This is a backup generator monitoring and control system designed to meet the demands stipulated by KSL Television in Salt Lake City, Utah. The system must monitor 28 (up to 32) inputs including, but not limited to, voltages, currents, and frequency of all three phases at three different points, as well as engine conditions, and enunciate any problems. Analog n... View full abstract»

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  • Analysis of curve tracer instruments for fault location

    Publication Year: 1998, Page(s):284 - 291
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    A review of testability, fault isolation algorithms, and fault simulation techniques is performed. Within the context of established theoretical and simulation analysis methods for fault isolation, the use of curve tracer instruments is analyzed. Curve tracer instruments are extensively employed by the military, in repair environments, to aid technicians in the isolation and repair of failed circu... View full abstract»

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  • Prototyping a diagnostic interface

    Publication Year: 1998, Page(s):276 - 283
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    The ARI is planning to prototype several potential interface implementations related to TPS transportability and interoperability. For the diagnostic interface, examination of available commercial standards has identified only one viable candidate-IEEE Std 1232, AI-ESTATE (Artificial Intelligence Exchange and Service Tie to All Test Environments) and its component standards. In this paper, we will... View full abstract»

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  • C-17 production automated verification equipment (PAVE)

    Publication Year: 1998, Page(s):639 - 645
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (572 KB)

    Manually testing aircraft functions during factory assembly has been a costly and time-consuming task. In addition, this problem has been compounded by the fact that deliverable cockpit avionics are required during testing and are therefore exposed to the damaging production environment longer. The C-17 aircraft currently requires 48 on-aircraft test procedures (OATP) to verify system operations a... View full abstract»

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  • Firewire: standard computer industry interconnect for test and measurement AutoTestCon '98

    Publication Year: 1998, Page(s):272 - 275
    Cited by:  Patents (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB)

    Do you know what Firewire is? If not, you soon will. IEEE 1394, or Firewire, is an up-and-coming electronics industry standard that will soon be in wide use for interconnecting a massive variety of electronic equipment. It will be used for connecting CD-ROMs and scanners to computers, and it will be used for connecting VCRs, DVDs and satellite dishes to digital televisions. How does this affect Te... View full abstract»

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  • Standard automatic test system (SATS) hardware interface standards for SATS frameworks, VXI instrument front panels, power module interface, augmentation module interface, receiver fixture interface, pin map configuration

    Publication Year: 1998, Page(s):627 - 638
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (972 KB)

    In response to the Department of Defense Small Business Innovation Research (SBIR) Program, Project No. AF97-239, Standard Automatic Test System (SATS) Interface, VXI Associates has been commissioned to assist and coordinate an industry effort to develop SATS Hardware Interface Standards for the VXI Instrument Front Panel, Power Module Interface, Switch/Matrix Module Interface, Receiver Fixture In... View full abstract»

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  • Navy initiatives to steer COTS instrument technology developments

    Publication Year: 1998, Page(s):262 - 271
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (916 KB)

    The Navy has purchased commercial-off-the-shelf (COTS) test instrumentation (general purpose electronic test equipment-GPETE) for over 25 years. Over that period, the Navy has actively engaged the test equipment industry in technical discussions to support technical requirements for instrumentation. A strong customer-supplier relationship has developed that has allowed the Navy to ensure instrumen... View full abstract»

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  • RF testing of MEMS components

    Publication Year: 1998
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (60 KB)

    The authors discuss some of the testing issues associated with the RF characterization of MEMS components. More specifically, they present testing methods and experimental results for two RF MEMS components-an RF switch and a tunable capacitor. RF measurements including insertion loss, electrical isolation, linearity, and vibration sensitivity are among the MEMS characteristics to be presented, as... View full abstract»

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  • New 100 MHz bandwidth vector signal analysis measurement technique for R&D in radar development, EW and surveillance

    Publication Year: 1998, Page(s):624 - 626
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (212 KB)

    Many new and next generation wide bandwidth microwave radar, EW and surveillance applications require measurement and analysis of RF and microwave signals with wide bandwidth analog and digital modulation. This paper describes a new measurement technique featuring 100 MHz of information bandwidth signal analysis capability, including spectrum analysis and modulation analysis of RF and microwave si... View full abstract»

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  • Raytheon beta site evaluation of Teradyne's PC-based VXI functional test solution

    Publication Year: 1998, Page(s):461 - 465
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (384 KB)

    To keep pace with changing business conditions, Raytheon Systems Company has established a list of key objectives that refocus standards for high-speed, low-cost functional test. Raytheon's goal is to move toward modular, reconfigurable, PC-based, open-architecture automated test equipment that reduces overall program development and life-cycle costs. As part of a strategic alliance, Raytheon emba... View full abstract»

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  • VXIbus instruments-past, present and future

    Publication Year: 1998, Page(s):259 - 261
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (232 KB)

    VXI instruments, when first introduced to the marketplace in 1988, were initially aimed at reducing the size and improving the performance over GPIB ATE systems. The acceptance of VXIbus solutions has enabled the VXIbus platform to be used effectively in many other applications, and not just ATE. With new and emerging platforms, such as compact PCI, as well as customers looking more closely at ret... View full abstract»

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  • Testing of MEMS material properties and stability

    Publication Year: 1998, Page(s):161 - 162
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (128 KB)

    This article presents progress in characterizing MEMS failure. The results are applicable to a wide range of materials and applications. Data is presented, however, for MEMS polysilicon and single crystal silicon. The observations of fatigue crack growth in single crystal silicon and time dependent crack initiation in polysilicon are important because they indicate MEMS failure modes that have not... View full abstract»

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  • Blending borescope inspection (BBI) maintenance service equates to cost savings

    Publication Year: 1998, Page(s):486 - 493
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (512 KB)

    This paper provides an insight into how the introduction and implementation of the blending borescope used to perform on-wing blending of compressor blades on Pratt & Whitney (P&W) engines has resulted in significant savings. It describes the following: commercial statistics and savings; military statistics and potential savings; the P&W maintenance team; what is on-wing blending; the ... View full abstract»

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  • Experience on analyzing phased-array antenna range and diagnostic data through an expert system

    Publication Year: 1998, Page(s):615 - 623
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (696 KB)

    The Antenna Repair Facility at McClellan AFB, which has been responsible for the repair and maintenance of Air Force antennas and radars over several decades, now faces the challenge of transferring their many years of skill in antenna maintenance from their closing base to an acquiring base. This is being done with the requirement of maintaining in-house expertise and production levels, while man... View full abstract»

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  • Automatic dependency model generator for mixed-signal circuits

    Publication Year: 1998, Page(s):91 - 96
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (832 KB)

    Dependency models are the basis of several important products for testability analysis, diagnosability analysis, and generation of optimal fault frees, including generation of dynamic test strategies based on current parameters and available resources. The problem with dependency models is that they are difficult to generate. We are developing a new software tool for automatic generation of depend... View full abstract»

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  • The evolution and application of VXIbus common core based ATS design

    Publication Year: 1998, Page(s):452 - 460
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (940 KB)

    This paper looks at one system integrator's experiences of VXIbus ATS design over the past decade. A number of specific successful ATS implementations, for factory and depot, fixed installation and deployable, are examined. The evolution of the overall ATS designs detailing influencing factors, differences, and common aspects are highlighted. The benefits, to the through life support of ATSs, of a... View full abstract»

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  • VXI RF measurement analyzer

    Publication Year: 1998, Page(s):254 - 258
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (444 KB)

    VXI has grown substantially in applications from testing in the lab to field support of weapon systems. Early criticism of VXI came that it was only intended for low frequency applications. Recently, developers have been taking on the challenge of extending VXI into the RF and microwave frequency domain. This paper describes the challenges of creating an 8.5 GHz RF measurement analyzer in a VXI en... View full abstract»

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  • Testing requirements for microelectromechanical systems (MEMS)

    Publication Year: 1998
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (88 KB)

    This presentation addresses some of these challenges and outlines potential approaches to overcoming them. Examples of the many energy domains encountered in MEMS devices will be provided and potential strategies for evaluating MEMS device performance in these domains will be discussed. Particular attention will be paid to the challenges of measuring performance of these devices in an extensively ... View full abstract»

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  • Using infrared thermography to detect age degradation in EPROM chips

    Publication Year: 1998, Page(s):546 - 551
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB)

    Dozens of circuit cards (about 5% of the total) failed to function after a recent upgrade of the digital Flight Control Computer (DFLCC), even though all of these cards operated correctly before the modifications. The shop called for the use of the infrared camera to assist in diagnosing and repairing these cards. What the Neural Radiant Energy Detection (NREDS) found was faulty and marginal chips... View full abstract»

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  • Data acquisition of mechanical devices: a new way to think

    Publication Year: 1998, Page(s):479 - 485
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (652 KB)

    In today's environment of high speed personal computers and laptops, acquisition system design has remained unaffected. Most systems use interface electronics to convert a mechanical signal representing either positional movement or rate of change into an analog or digital format. This interface is a series of conversions from a complicated electrical signal into a simple one and is done outside t... View full abstract»

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