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AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE

Date 25-27 Aug. 1998

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Displaying Results 1 - 25 of 106
  • IEEE Systems Readiness Technology Conference - Test Technology For The 21st Century [front matter]

    Publication Year: 1998, Page(s):i - xxvi
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    Freely Available from IEEE
  • The Year 2000 impact on automated testing

    Publication Year: 1998, Page(s):661 - 664
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (392 KB)

    Both the US military and industry rely on automatic testing to verify the quality of manufacture and repair. Many testers still rely on computers designed and manufactured in the early 1980's. This includes systems using embedded controllers. Year 2000 problems can surface in computer operating systems, compilers, test programs, and in embedded systems. Until the impact of the Y2K “bug&rdquo... View full abstract»

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  • Building government-industry partnerships

    Publication Year: 1998, Page(s):649 - 660
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (920 KB)

    In today's downsized Government/Industry environment there is a challenge to maximize the return on investment. Both government and industry are investigating new and innovative concepts in order to do business with each other. The mutual goals to deliver products and services that will meet the expectations of the end user. This paper explores some of the solutions, describe the actions required ... View full abstract»

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  • Challenges of MEMS device characterization in engineering development and final manufacturing

    Publication Year: 1998, Page(s):164 - 170
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (604 KB)

    Testing of microelectromechanical systems (MEMS) devices is rapidly progressing to the point that high volume, cost effective, and accurate measurement systems are necessary. This area of automatic test is very challenging compared to a normal semiconductor portfolio. Besides the typical electrical and thermal stimulus, a MEMS measurement system requires control of the quantity, property, or condi... View full abstract»

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  • Why testing sometimes doesn't work

    Publication Year: 1998, Page(s):647 - 648
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (180 KB)

    The failure of a test to detect a problem in the unit under test usually results from unanticipated fault modes and inappropriate test design techniques. Resulting corrective and preventative measures may load test suites with unnecessary tests. This paper recommends using Quality Function Deployment (QFD) to verify the test is for the right reason and that correct information is being collected. ... View full abstract»

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  • RF testing of MEMS components

    Publication Year: 1998
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (60 KB)

    The authors discuss some of the testing issues associated with the RF characterization of MEMS components. More specifically, they present testing methods and experimental results for two RF MEMS components-an RF switch and a tunable capacitor. RF measurements including insertion loss, electrical isolation, linearity, and vibration sensitivity are among the MEMS characteristics to be presented, as... View full abstract»

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  • Testing tomorrow's fire control systems today

    Publication Year: 1998, Page(s):78 - 82
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    Military Electro-Optic fire control systems have evolved greatly over the years and continue to do so. The pace of evolution has sped up, due to the lower cost of purchasing upgraded sensor systems vs. the higher cost of buying all new tanks, ships, or aircraft. The evolution of fire control systems themselves drive a required evolution to their optical test systems, which must have a 4× to ... View full abstract»

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  • C-17 production automated verification equipment (PAVE)

    Publication Year: 1998, Page(s):639 - 645
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (572 KB)

    Manually testing aircraft functions during factory assembly has been a costly and time-consuming task. In addition, this problem has been compounded by the fact that deliverable cockpit avionics are required during testing and are therefore exposed to the damaging production environment longer. The C-17 aircraft currently requires 48 on-aircraft test procedures (OATP) to verify system operations a... View full abstract»

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  • Embedded diagnostics for legacy processor based systems

    Publication Year: 1998, Page(s):530 - 535
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (748 KB)

    The need for affordable COTS insertion and advanced diagnostics in legacy weapon systems is widely acknowledged. Furthermore, the upgrade approach of incrementally adding and maturing our systems is becoming increasingly necessary. TRW's RePLACETM technology, which allows for the use of COTS microprocessor technology, legacy software code re-use, and affordable incremental addition of n... View full abstract»

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  • Testing of MEMS material properties and stability

    Publication Year: 1998, Page(s):161 - 162
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (128 KB)

    This article presents progress in characterizing MEMS failure. The results are applicable to a wide range of materials and applications. Data is presented, however, for MEMS polysilicon and single crystal silicon. The observations of fatigue crack growth in single crystal silicon and time dependent crack initiation in polysilicon are important because they indicate MEMS failure modes that have not... View full abstract»

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  • Integrated Family of Test Equipment (IFTE) Electro-Optic Test Facility (EOTF)

    Publication Year: 1998, Page(s):72 - 77
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (596 KB)

    Major weapon systems use multiple forms of electrooptics (EO), be it forward looking infrared (FLIR), direct view optics (DVO), trackers, laser range finders (LRF), or TV systems. Furthermore, EO technology is finding its way into less conventional military uses such as chemical detection/early warning systems, landmine detection, and aboard helicopters searching for the wounded. Clearly, EO techn... View full abstract»

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  • Standard automatic test system (SATS) hardware interface standards for SATS frameworks, VXI instrument front panels, power module interface, augmentation module interface, receiver fixture interface, pin map configuration

    Publication Year: 1998, Page(s):627 - 638
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (972 KB)

    In response to the Department of Defense Small Business Innovation Research (SBIR) Program, Project No. AF97-239, Standard Automatic Test System (SATS) Interface, VXI Associates has been commissioned to assist and coordinate an industry effort to develop SATS Hardware Interface Standards for the VXI Instrument Front Panel, Power Module Interface, Switch/Matrix Module Interface, Receiver Fixture In... View full abstract»

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  • Automated fluorescent penetrant inspection (FPI) system is triple A

    Publication Year: 1998, Page(s):498 - 529
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2080 KB)

    This paper describes how Fluorescent Penetrant Inspection (FPI) was used in the past, how it is used now and how it will be used in the future. The United States Air Force (USAF) and Pratt & Whitney (P&W) now use a fully-automated FPI process with manual visual inspection. With direction and funding provided by the USAF/Aeronautical System Center (ASC), these fully-automated FPI processors... View full abstract»

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  • Bridging the gap between ATLAS and C: an open-systems approach to TPS re-host

    Publication Year: 1998, Page(s):120 - 124
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (632 KB)

    In these days of declining Department of Defense (DoD) budgets and the downsizing of the military, much of the focus has shifted away from large development programs for new platforms and equipment. Rather, upgrades to existing equipment, to modernize it and to replace obsolete components has become a major focus. Additionally, recent efforts of the DoD have been initiated to define or adopt stand... View full abstract»

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  • Testing requirements for microelectromechanical systems (MEMS)

    Publication Year: 1998
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (88 KB)

    This presentation addresses some of these challenges and outlines potential approaches to overcoming them. Examples of the many energy domains encountered in MEMS devices will be provided and potential strategies for evaluating MEMS device performance in these domains will be discussed. Particular attention will be paid to the challenges of measuring performance of these devices in an extensively ... View full abstract»

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  • Techniques and applications for neural networks “an air force perspective”

    Publication Year: 1998, Page(s):580 - 583
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (348 KB)

    This paper describes the use of neural networks in combination with algorithmic test programs to aid in improving test efficiency and accuracy, especially in test situations where “bad actor” test programs exist that have difficulty in detecting and isolating Unit Under Test (UUT) failures View full abstract»

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  • Reducing the cost of test through reuse

    Publication Year: 1998, Page(s):48 - 53
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (660 KB)

    As the length of time between design and production decreases, the demand for timely and cost effective testing increases. One way to reduce the cost of test development is through the reuse of applications and components. This approach includes designing and implementing reusable components as well as leveraging off of existing tools and utilities. This paper describes a set of test applications ... View full abstract»

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  • Clutter emulator for radar testing

    Publication Year: 1998, Page(s):606 - 610
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (372 KB)

    With the advent of a new airborne radar signal processing technology entitled, “Space-Time Adaptive Processing (STAP),” previous testing methods have proven inadequate. STAP algorithms minimize the amount of interference competing with the desired signal. The algorithms are complex and their reaction to an actual in the air scenario difficult to predict via analysis and simulation. The... View full abstract»

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  • Automated testability analysis for design applications

    Publication Year: 1998, Page(s):360 - 367
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (704 KB)

    This paper addresses testability specifically design for diagnostic test. It covers the early history of automated test, how “Design for testability” relates to the task of generating test program sets, how testability is analyzed now on CASS (Consolidated automated support system), and how this system may be able to be automated to increase accuracy and throughput. It is the goal of t... View full abstract»

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  • A new dependency model based testability analyzer

    Publication Year: 1998, Page(s):187 - 191
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (460 KB)

    This paper describes the development of a testability analysis tool called ADMA. The approach used in ADMA is based on use of dependency models. Dependency models are the basis of several important products for testability analysis. What makes ADMA different from existing testability analysis tools is its capability to use multiple analysis algorithms and its user-friendly report format. The ratio... View full abstract»

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  • Electro-optical instruments for DOD systems: the evolution continues

    Publication Year: 1998, Page(s):67 - 71
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (348 KB)

    True EO instruments have existed for a long time in the commercial world. For several years the development of off-the-shelf instruments for military applications has been a theme discussed by a number of parties. At Autotestcon '95 three papers addressed this topic. Work in this area has continued since then, and this paper will review progress and lessons learned Topics to be discussed are: char... View full abstract»

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  • New 100 MHz bandwidth vector signal analysis measurement technique for R&D in radar development, EW and surveillance

    Publication Year: 1998, Page(s):624 - 626
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (212 KB)

    Many new and next generation wide bandwidth microwave radar, EW and surveillance applications require measurement and analysis of RF and microwave signals with wide bandwidth analog and digital modulation. This paper describes a new measurement technique featuring 100 MHz of information bandwidth signal analysis capability, including spectrum analysis and modulation analysis of RF and microwave si... View full abstract»

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  • Prototyping a diagnostic interface

    Publication Year: 1998, Page(s):276 - 283
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (680 KB)

    The ARI is planning to prototype several potential interface implementations related to TPS transportability and interoperability. For the diagnostic interface, examination of available commercial standards has identified only one viable candidate-IEEE Std 1232, AI-ESTATE (Artificial Intelligence Exchange and Service Tie to All Test Environments) and its component standards. In this paper, we will... View full abstract»

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  • Digital electronic engine control (DEEC)/engine diagnostic unit (EDU) functional tester (DEFT) for the F100-PW-220/-229 engines

    Publication Year: 1998, Page(s):494 - 497
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (316 KB)

    Automated test equipment does not need to be expensive to produce or occupy multiple equipment racks. By using commercial-off-the-shelf (COTS) circuit cards and customizing special functions in printed wiring assemblies, the costs of functionally testing Unit Under Test (UUT), such as the Digital Electronic Engine Control (DEEC) or the Engine Diagnostic Unit (EDU), can be reduced by 90 percent com... View full abstract»

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  • Digital testing under the IEEE-716 C/ATLAS environment: the dark side of the moon?

    Publication Year: 1998, Page(s):111 - 119
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (572 KB)

    This paper will shed some light on the capabilities of digital testing under the lEEE defined C/ATLAS automatic testing environment. It addresses the issues of IEEE-716 C/ATLAS adequacy to perform digital testing at various levels of assembly, with particular emphasis on the LRU/WRA level. The authors addressed these issues when involved in projects to post-process LASAR data into a modern C/ATLAS... View full abstract»

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