Date 7-11 Nov. 2010
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Displaying Results 1 - 25 of 141
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[Front matter]
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PDF (103 KB)
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Executive Committee
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PDF (158 KB)
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Foreword
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PDF (33 KB)
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Awards
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PDF (34 KB)
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Keynote address
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PDF (43 KB)
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Table of contents
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PDF (76 KB)
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Author index
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PDF (41 KB)
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[Front cover]
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PDF (165 KB)
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Fidelity metrics for estimation models
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PDF (654 KB)
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WISDOM: Wire spreading enhanced decomposition of masks in Double Patterning Lithography
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PDF (1734 KB)
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Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation
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PDF (1371 KB)
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An algorithm for exploiting modeling error statistics to enable robust analog optimization
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PDF (877 KB)
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Aging analysis at gate and macro cell level
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PDF (3877 KB)
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Process variation aware performance modeling and dynamic power management for multi-core systems
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PDF (525 KB)
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Design-aware mask inspection
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PDF (885 KB)
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SMATO: Simultaneous mask and target optimization for improving lithographic process window
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PDF (966 KB)
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