By Topic

2010 Workshop on Fault Diagnosis and Tolerance in Cryptography

21-21 Aug. 2010

Filter Results

Displaying Results 1 - 21 of 21
  • [Front cover]

    Publication Year: 2010, Page(s): C1
    Request permission for commercial reuse | PDF file iconPDF (53 KB)
    Freely Available from IEEE
  • [Title page i]

    Publication Year: 2010, Page(s): i
    Request permission for commercial reuse | PDF file iconPDF (109 KB)
    Freely Available from IEEE
  • [Title page iii]

    Publication Year: 2010, Page(s): iii
    Request permission for commercial reuse | PDF file iconPDF (196 KB) | HTML iconHTML
    Freely Available from IEEE
  • [Copyright notice]

    Publication Year: 2010, Page(s): iv
    Request permission for commercial reuse | PDF file iconPDF (120 KB)
    Freely Available from IEEE
  • Table of contents

    Publication Year: 2010, Page(s):v - vi
    Request permission for commercial reuse | PDF file iconPDF (130 KB)
    Freely Available from IEEE
  • Preface

    Publication Year: 2010, Page(s): vii
    Request permission for commercial reuse | PDF file iconPDF (68 KB) | HTML iconHTML
    Freely Available from IEEE
  • Program Committee

    Publication Year: 2010, Page(s): viii
    Request permission for commercial reuse | PDF file iconPDF (92 KB)
    Freely Available from IEEE
  • Acknowledgments

    Publication Year: 2010, Page(s): ix
    Request permission for commercial reuse | PDF file iconPDF (56 KB)
    Freely Available from IEEE
  • Contact information

    Publication Year: 2010, Page(s): x
    Request permission for commercial reuse | PDF file iconPDF (70 KB)
    Freely Available from IEEE
  • Differential Fault Analysis against AES-192 and AES-256 with Minimal Faults

    Publication Year: 2010, Page(s):3 - 9
    Cited by:  Papers (18)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (601 KB) | HTML iconHTML

    The naive implementation of AES is known to be vulnerable to Differential Fault Analysis (DFA). We can find the key of AES-128 (AES with 128-bit key) with one pair of correct and faulty cipher texts. Recently several works on the extension of the attack to AES with 192 and 256-bit key have been published. Due to the longer key size and the characteristic of AES key schedule, we need subtle caution... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Passive and Active Combined Attacks on AES Combining Fault Attacks and Side Channel Analysis

    Publication Year: 2010, Page(s):10 - 19
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (366 KB) | HTML iconHTML

    Tamper resistance of hardware products is currently a very popular subject for researchers in the security domain. Since the first Kocher side-channel (passive)attack, the Bellcore researchers and Biham and Shamir fault (active) attacks, many other side-channel and fault attacks have been published. The design of efficient countermeasures still remains a difficult task for IC designers and manufac... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Optical Fault Masking Attacks

    Publication Year: 2010, Page(s):23 - 29
    Cited by:  Papers (18)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1989 KB) | HTML iconHTML

    This paper introduces some new types of optical fault attacks called fault masking attacks. These attacks are aimed at disrupting of the normal memory operation through preventing changes of the memory contents. The technique was demonstrated on an EEPROM and Flash memory inside PIC microcontrollers. Then it was improved with a backside approach and tested on a PIC and MSP430 microcontrollers. The... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Memory Address Scrambling Revealed Using Fault Attacks

    Publication Year: 2010, Page(s):30 - 36
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (391 KB) | HTML iconHTML

    Today's trend in the smart card industry is to move from ROM+EEPROM chips to Flash-only products. Recent publications have illustrated the vulnerability of Floating Gate memories to UV and heat radiation. In this paper, we explain how, by using low cost means, such a vulnerability can be used to modify specific data within an EEPROM memory even in the presence of a given type of counter-measure. U... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Generic Analysis of Small Cryptographic Leaks

    Publication Year: 2010, Page(s):39 - 48
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (310 KB) | HTML iconHTML

    Side channel attacks are typically divided into two phases: In the collection phase the attacker tries to measure some physical property of the implementation, and in the analysis phase he tries to derive the cryptographic key from the measured information. The field is highly fragmented, since there are many types of leakage, and each one of them usually requires a different type of analysis. In ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Fault Injection Resilience

    Publication Year: 2010, Page(s):51 - 65
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (389 KB) | HTML iconHTML

    Fault injections constitute a major threat to the security of embedded systems. Errors occurring in the cryptographic algorithms have been shown to be extremely dangerous, since powerful attacks can exploit few of them to recover the full secrets. Most of the resistance techniques to perturbation attacks have relied so far on the detection of faults. We present in this paper another strategy, base... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A Continuous Fault Countermeasure for AES Providing a Constant Error Detection Rate

    Publication Year: 2010, Page(s):66 - 71
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (561 KB) | HTML iconHTML

    Many implementations of cryptographic algorithms have shown to be susceptible to fault attacks. To detect manipulations, countermeasures have been proposed. In the case of AES, most countermeasures deal with the non-linear and the linear part separately, which either leaves vulnerable points at the interconnections or causes different error detection rates across the algorithm. In this paper, we p... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Multi Fault Laser Attacks on Protected CRT-RSA

    Publication Year: 2010, Page(s):75 - 86
    Cited by:  Papers (21)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1237 KB) | HTML iconHTML

    Since the first publication of a successful practical two-fault attack on protected CRT-RSA surprisingly little attention was given by the research community to an ensuing new challenge. The reason for it seems to be two-fold. One is that generic higher order fault attacks are very difficult to model and thus finding robust countermeasures is also difficult. Another reason may be that the publishe... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Fault Attacks and Countermeasures on Vigilant's RSA-CRT Algorithm

    Publication Year: 2010, Page(s):89 - 96
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (606 KB) | HTML iconHTML

    At CHES 2008, Vigilant proposed an efficient way of implementing a CRT-RSA resistant against Fault Analysis. In this paper, we investigate the fault-resistance of this scheme and we show that it is not immune to fault injection. Indeed, we highlight two weaknesses which can lead an attacker to recover the whole private key by using only one faulty signature. We also suggest some modifications with... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Low Cost Built in Self Test for Public Key Crypto Cores

    Publication Year: 2010, Page(s):97 - 103
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (246 KB) | HTML iconHTML

    The testability of cryptographic cores brings an extra dimension to the process of digital circuits testing security. The benefits of the classical methods such as the scan-chain method introduce new vulnerabilities concerning the data protection. The Built-In Self-Test (BIST) is considered to be the most suitable countermeasure for this purpose. In this work we propose the use of a digit-serial m... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Author index

    Publication Year: 2010, Page(s): 105
    Request permission for commercial reuse | PDF file iconPDF (67 KB)
    Freely Available from IEEE
  • IEEE Computer Society Conference Publications Operations Committee [Roster page]

    Publication Year: 2010, Page(s): 106
    Request permission for commercial reuse | PDF file iconPDF (69 KB) | HTML iconHTML
    Freely Available from IEEE