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Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European

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Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European

Date 13-16 Sept. 1993

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Proceedings of the 23rd European Solid State Device Research Conference

Preface

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[Timetable]

Technical contents

Physics and Technology for MOSFETs at 0.1 micron and Below

Photonic Integrated Circuits

Can cellular automata methods compete with Monte Carlo semiconductor device simulations?

An analytical model of current-splitting in CMOS-compatible lateral bipolar transistors

Analysis and modeling of small-geometry effects on maximum cutoff frequency fT and forward transit time in high-speed self-aligned bipolar transistors

Low frequency noise in partially depleted SOI twin-MOSFET's

Random Telegraph Signal related low-frequency noise peaks in submicrometer Si MOST's

Noise Performance of MESFETs and MODFETs: Influence of the Gate Leakage Current

Low-Frequency Noise and Microwave Noise Parameters in Si/SiGe Heterojunction Bipolar Transistors

Polysilicon Thin Film Transistor : a Study of some Techniques of Realisation of the Channel Region and of the Gate

Analysis of Hot Carrier Induced Degradation in Polycrystalline Silicon Thin Film Transistors

Large Area Deposition of Device Quality SiO2 for Poly Si TFT Fabrication

On the Way to the Silicon Carbide IMPATT

The Role of TCAD in Parasitic Analysis of ICs

Mechanisms of Hot-Carrier Degradation of Analog Device Parameters in n-MOSFETs

Study of process-induced mechanical stresses in multi-chip modules packaged with a chip-on-board technology

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