Date 14-18 Sept. 2009
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Displaying Results 1 - 25 of 120
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Direct observation of fluctuations in both the number and individual carrier capture rate of interface traps in small gate-area MOSFETs
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PDF (1517 KB)
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A zero V
TH memory cell ferroelectric-NAND flash memory with 32% read disturb, 24% program disturb, 10% data retention improvement for enterprise SSD
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PDF (1141 KB)
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Hot carrier (HC) and bias-temperature-instability (BTI) degradation of MuGFETs on silicon oxide and silicon nitride buried layers
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PDF (1414 KB)
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Light switched Plasma Charging Damage protection device allowing high field characterization
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PDF (840 KB)
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New findings on low frequency noise and mismatching properties in uniaxial strained pMOSFETs
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PDF (1312 KB)
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Experimental evaluation of trapping efficiency in silicon nitride based charge trapping memories
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PDF (941 KB)
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A 3-V, 6-bit C-2C digital-to-analog converter using complementary organic thin-film transistors on glass
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PDF (1189 KB)
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Comparison of double patterning technologies in NAND flash memory with sub-30nm node
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PDF (1143 KB)
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RF performance degradation in 100-nm metal gate/high-k dielectric nMOSFET by hot carrier effects
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PDF (1439 KB)
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Noise as a characterization tool for reliability under illumination of transfer gate transistor for image sensors applications
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PDF (875 KB)
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Theoretical analysis of the vertical LOCOS DMOS transistor with process-induced stress enhancement
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PDF (1150 KB)
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Electrothermal simulation and measurements of SOI smart power transistors for short pulses
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PDF (1434 KB)
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LER-induced limitations to V
DD scalability of FinFET-based SRAMs with different design options
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PDF (993 KB)
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