By Topic

AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings

22-25 Sept. 1997

Filter Results

Displaying Results 1 - 25 of 110
  • 1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century

    Publication Year: 1997
    Request permission for commercial reuse | PDF file iconPDF (683 KB)
    Freely Available from IEEE
  • Author/co-author index

    Publication Year: 1997, Page(s):xxvi - xxviii
    Request permission for commercial reuse | PDF file iconPDF (166 KB)
    Freely Available from IEEE
  • The infusion of LASAR into VXI or how to utilize fault dictionary techniques in an open system

    Publication Year: 1997, Page(s):367 - 370
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (230 KB)

    Utilizing Fault Dictionary information, derived from tables produced by Digital Automated Stimulus and Response modeling software, to diagnose circuit faults makes porting a UUT test to a PC-based, low-cost, open system VXI platform very feasible. Fault dictionary techniques employ a fault signature analysis routine to pin point UUT failures. These techniques are used in conjunction with stimulus ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Software reuse for hydraulic component test stands: a case study

    Publication Year: 1997, Page(s):660 - 668
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1100 KB)

    This paper is an update to information presented at Autotestcon 1991. Presented are lessons learned from a practical reuse of a large C++ library that has been developed for hydraulic component testing. This software is currently being used by HR Textron to supply semi-automatic/automatic servovalve and servocylinder test stands. The lessons learned are presented in the context of servovalve and s... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A proposed structure and Lexicon for ATE commonality

    Publication Year: 1997, Page(s):536 - 543
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (768 KB)

    This paper has been written following investigations within The Boeing Co. by individuals involved in ATE Systems design, development, definition and implementation over the issue of “standards”. Results of those studies have been captured into this paper in the form of an analysis of the issues deriving from the central theme of ATE “commonality”, impediments to “com... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Advanced battery analyzer/charger program

    Publication Year: 1997, Page(s):652 - 659
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (608 KB)

    This paper provides an overview of the Advanced Battery Analyzer/Charger (ABAC) Technology under development at AlliedSignal for the US Navy. The ABAC technology provides complete battery maintenance and support solution including battery analysis, charging and multimedia based operator-training capabilities. The technology addresses three battery electrochemical couples: Lead-acid, Nickel-Cadmium... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Servo control using digital signal processing [turrets]

    Publication Year: 1997, Page(s):308 - 312
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (384 KB)

    The classical method for testing and calibrating turrets is to use a servo control system similar to an operational environment. Digital processing was used to address the differences between the operational and test environments. This paper describes some of the requirements, encountered problems and solutions found in testing and calibrating one particular airborne turret View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • TEDL-a new test interface standard from the IEEE

    Publication Year: 1997, Page(s):528 - 535
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (852 KB)

    Earlier this year, the IEEE approved a new test interface standard called IEEE Std 993-Test Equipment Description Language (TEDL). For many years, industry has bridged the gap between test language standards, such as ATLAS and instrumentation standards such as GPIB and VXI, using non standard terminology. This new standard will provide a standard interface between test specifications on the one ha... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Sigma-Delta digital technology enhances acoustic/vibration measurements

    Publication Year: 1997, Page(s):647 - 651
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    The traditional method for making acoustic and vibration measurements for aerospace and defense applications involves the use of analog tape recorders. After a test is completed the analog tapes must be digitized for analysis. This process could require weeks or months to accomplish, depending upon the number of channels involved. The new VXI-based acoustic/vibration system that is described uses ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Development of a high speed data acquisition system based on LabVIEW(R) and VXI(R)

    Publication Year: 1997, Page(s):302 - 307
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1472 KB)

    The collection of high speed, multi-channel test data in a VXI environment can be challenging, especially when the number of input channels is large and data processing is required for analysis of the test data. This paper describes a data acquisition system which was designed to acquire performance data on the Minuteman III MK12/W62 Re-entry Vehicle Nuclear Weapon Sub-System, as the Sub-System is... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The International Electrotechnical Commission and system level test

    Publication Year: 1997, Page(s):524 - 527
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (356 KB)

    The US Department of Defense has directed increased reliance on commercial standards and commercial products be used in procurement There are many sources for such standards. For example, in the US we have several consensus bodies such as the Institute of Electronics and Electrical Engineers (IEEE), American National Standards Institute (ANSI), American Institute of Aeronautics and Astronautics (A... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Integrated display for functional emulation during test

    Publication Year: 1997, Page(s):639 - 646
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (696 KB)

    The following is a description of a general purpose display designed to emulate mission displays, which would normally require the use of additional equipment. The device is configurable to accept RS-170, RS-343, Stroke and VGA RGB video. The paper discusses the operational and design concepts of the device View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Design methodology for creating an effective test environment

    Publication Year: 1997, Page(s):129 - 142
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1228 KB)

    A test environment needs to be informative, versatile and maintainable in order to efficiently meet aggressive development and integration schedules, reduce long term support costs and provide test station life-cycle extension, independent of the level of test being performed. For a test environment to support these requirements, it must contain features that may be developed independently, yet op... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • W-band synthesized signal generator using fundamental voltage controlled oscillators

    Publication Year: 1997, Page(s):331 - 336
    Cited by:  Papers (1)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (436 KB)

    The architecture and implementation of a W-Band signal generator are described. The architecture presented highlights the developmental areas of: the signal source, frequency control, output control and modulation. Voltage controlled oscillators (VCOs) were developed to provide frequency agility, to enhance the viability of frequency modulation (FM) characteristics, and to improve weight and power... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A paperless system of reporting and analyzing field failure data for IFTE ATS

    Publication Year: 1997, Page(s):13 - 17
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (420 KB)

    Data collection from complex systems is typically inefficient and inaccurate since it requires a certain degree of operator interaction. Sample Data Collection (SDC) is a well known method of collecting data in some government agencies. This can be a very cumbersome method requiring many man-hours and much dedication of the data collectors in filling out surveys. The US Army has developed a tool f... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Using VXI based breadboard modules

    Publication Year: 1997, Page(s):297 - 301
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (596 KB)

    Plug-in VXI based breadboard modules are an excellent solution to achieve a lower costing, time and hardware saving test bench. These breadboard modules are equipped with built-in VXI bus interface circuitry and a breadboard area for creating a design to suit your test needs. A prime example for the use of this capability was demonstrated on a recent radar system test bench created to test many un... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Signal oriented test programs: fact or fiction?

    Publication Year: 1997, Page(s):502 - 507
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (536 KB)

    Traditional automatic test system (ATS) test programs are written in various versions of the abbreviated test language for all systems (ATLAS). Many of these versions are based on the commercial standard ATLAS 626 or the IEEE standard C/ATLAS 716. One of the key features of ATLAS is its ability to describe signals in an English-based, human readable format. This feature allows test engineers to wr... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • C-5 digital technical order system (G-File)

    Publication Year: 1997, Page(s):23 - 29
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (956 KB)

    This paper traces the evolution of the U.S. Air Force C-5 aircraft G-File from a paper based system to a digital technical order system (DTOS). The C-5 DTOS replaced over 275 kilograms (600 pounds) of paper based documentation carried aboard the aircraft with 12 compact discs (CD). More importantly, it allows maintenance personnel to focus totally on aircraft maintenance, by relieving them of the ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Test executive features for improved TPS debug

    Publication Year: 1997, Page(s):520 - 523
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (372 KB)

    This paper describes several capabilities that greatly improve the test program set (TPS) debug and integration efforts. As TPS debug and integration activities are significant cost factors in TPS development, improvements in this phase offer potentially high returns. Important considerations include hardware and software architecture decisions, instrument interface visibility, interactive control... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A test platform implementing SPC in a low-volume, high-mix test department

    Publication Year: 1997, Page(s):629 - 638
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (892 KB)

    The development of a PC-based functional test platform that incorporates Statistical Process Control (SPC) and a failure analysis database is described. With Commercial Off-The-Shelf(COTS) tools available it is possible in a low volume high-mix environment to easily obtain basic statistical information on each test, develop an easily accessible database of information on failures, causes of failur... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • BIST: a test a diagnosis methodology for complex, high reliability electronics systems

    Publication Year: 1997, Page(s):398 - 402
    Cited by:  Papers (6)  |  Patents (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (572 KB)

    A test and diagnosis methodology that is based on built-in self-test(BIST) is defined and described. A BIST solution based on a maintainable system architecture is described that includes the technology, and tools needed for the development of chip, board, and system BIST. This architecture is based on the IEEE 1149.5 MTM-Bus at the backplane level and the IEEE 1149.1 (JTAG) Boundary Scan Architec... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Economics of diagnosis

    Publication Year: 1997, Page(s):435 - 445
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1500 KB)

    Detecting the existence of a fault in complex systems is neither sufficient nor economical without diagnostics assisting in fault isolation and cost-effective repairs. This work attempts to put in economical terms the technical decisions involving diagnostics. It looks at the cost factors of poor diagnostics in terms of the accuracy and completeness of fault identification and the time and effort ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Use of client/server structures within ATE systems

    Publication Year: 1997, Page(s):153 - 164
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1092 KB)

    This paper has been written following investigations within The Boeing Co. by individuals involved in ATE Systems design, development, definition and implementation. Results of those studies have been captured in the form of a proposed methodology for achieving the goal of “commonality” within the ATE industry. That methodology has at its core, the technologies found in the modern clie... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Next Generation Test Generator (NGTG) interface to Automatic Test Equipment (ATE) for digital circuits

    Publication Year: 1997, Page(s):126 - 128
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (224 KB)

    Although current methods for digital and analog circuit testing in the NAVY Automatic Test Equipment (ATE) environment are adequate, there are limitations and pitfalls. These can be due to inadequate transfer of information between the design and test of a circuit card resulting in untestable circuits. This can lead to expensive and time consuming test generation. Next Generation Test Generator (N... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The Dynamic Range Tester: a patented, dual-channel, precision signal-to-noise ratio generator

    Publication Year: 1997, Page(s):327 - 330
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (340 KB)

    The Dynamic Range Tester (DRT) is a patented, prototype system designed at the Army Research Laboratory. This useful tool emulates field conditions in the laboratory in order to characterize signal processing hardware with repeatability and reliability. It is a multi-purpose, test instrument that simultaneously generates two highly isolated, wideband, “real-world” signals. The DRT cont... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.