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2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts

27-29 Oct. 2008

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  • [Title page i]

    Publication Year: 2008, Page(s): a
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  • [Title page ii]

    Publication Year: 2008, Page(s): i
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  • [Copyright notice]

    Publication Year: 2008, Page(s): ii
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  • Contributors page

    Publication Year: 2008, Page(s): iii
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  • Steering Committee

    Publication Year: 2008, Page(s): iv
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  • Officers

    Publication Year: 2008, Page(s): v
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  • Table of contents

    Publication Year: 2008, Page(s):vi - xiv
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  • Foreword

    Publication Year: 2008, Page(s): xv
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  • Ragnar Award

    Publication Year: 2008, Page(s):xvi - xvii
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  • Morton Atlar Lecture

    Publication Year: 2008, Page(s): xviii
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  • Erle Shobert Prize paper

    Publication Year: 2008
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  • THE ARMINGTON RECOGNITION AWARD

    Publication Year: 2008, Page(s): xxi
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  • High Current AC Break Arc Contact Erosion

    Publication Year: 2008, Page(s):xxii - xlvi
    Cited by:  Papers (1)
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  • The Transition from to the Metallic Phase Arc After the Rupture of the Molten Metal Bridge for Contacts Opening in Air and Vacuum

    Publication Year: 2008, Page(s):1 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (806 KB) | HTML iconHTML

    The total arcing time between opening electrical contacts interrupting a low voltage, low current circuit in both air and vacuum was controlled. The voltage across the opening contacts showed the rupture of the molten metal bridge and then its rapid increase to a value greater than the minimum arcing voltage before dropping back to a value close to the minimum arcing voltage. Using a radioactive t... View full abstract»

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  • An Electrical Arc Erosion Model Valid for High Current: Vaporization and Splash Erosion

    Publication Year: 2008, Page(s):9 - 14
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (303 KB) | HTML iconHTML

    Electrical arc erosion plays an important role in limiting the life of power switching devices. Consequently, a macroscopic arc erosion model, valid for high current, has been developed. This is the first of its kind since it takes into account two modes of contact material erosion: vaporization and splash erosion. Specifically, this model is used to measure the amount of contact material removed ... View full abstract»

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  • Melting Phenomena and Arc Ignition of Breaking Relay Contacts

    Publication Year: 2008, Page(s):15 - 20
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1293 KB) | HTML iconHTML

    Using the transient current switch circuit in parallel with the energizing switching contacts and the driving delay lines for timely control of breaking operations, the increase of contact voltage is suppressed as well as arc ignition at the last stage of the breaking electric contacts. Therefore, the melting phenomena can be slowly controlled and the electric characteristics can be accurately mea... View full abstract»

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  • Characteristics of Break Arcs Driven by External Magnetic Field in a DC42V Resistive Circuit

    Publication Year: 2008, Page(s):21 - 26
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (376 KB) | HTML iconHTML

    Break arcs occurring between electrical contacts are driven by the external magnetic field. Break arcs are observed using a high-speed camera. The external magnetic field is applied with a permanent magnet. The distance between the electrical contacts and the magnet is varied. Experimental circuit is DC 42 V-10 A resistive circuit. Material of electrical contacts is pure silver. The opening speed ... View full abstract»

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  • A Finite Volume Scheme for Modeling Arc Discharges in Low Voltage Circuit Breaking Devices

    Publication Year: 2008, Page(s):27 - 34
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1750 KB) | HTML iconHTML

    In this document, a coupled system of codes will be presented that have the goal to simulate the transient arc movement in low voltage circuit breaker devices. A numerical method built on the basis of the finite volume scheme is described, that addresses convergence problems at the current-dependent potential jump at the interface between the arc and the electrodes. It is shown how different simul... View full abstract»

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  • High Temperature Resistant Gold Alloys for Switching Signal Relay Contacts

    Publication Year: 2008, Page(s):35 - 40
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (482 KB) | HTML iconHTML

    Most telecom/signal relays are of the surface-mounted type nowadays. Since the introduction of lead-free soldering processes, the temperature exceeds 260degC during the soldering process. In a growing share of applications, these relays are additionally used in high-temperature environments such as motor compartments. Regardless of the high ambient temperatures of up to 125degC at which the relays... View full abstract»

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  • Effects of Electrical Contact Failure on High Speed Digital Signal Transmission

    Publication Year: 2008, Page(s):41 - 46
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (328 KB) | HTML iconHTML

    In digital communication systems, the deleterious effects of contacts at coaxial connector is one of the major causes of declining quality of communication. This paper describes the effects of contact degradation caused by contamination of a coaxial connector on transmitted signal integrity and error code rate. Transmission of high frequency current through degraded coaxial connectors is simulated... View full abstract»

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  • Effect of Nanosecond Electrical Discontinuities in High-Speed Digital Applications

    Publication Year: 2008, Page(s):47 - 52
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2013 KB) | HTML iconHTML

    Nanosecond discontinuities are a concern in separable-interface connectors. Speculation about their causes includes the structural movement between perfectly clean and flat contact surfaces and/or surface irregularities and presence of surface films. Both of these scenarios are considered here in the context of high-speed transmission (i.e. greater than 1 Gbit/s) in backplane connectors. Because s... View full abstract»

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  • Numerical Prediction of Socket Solder Joint Reliability during Shock

    Publication Year: 2008, Page(s):53 - 58
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (556 KB) | HTML iconHTML

    This paper proposes a simulation methodology to assess the risk in solder joint reliability (SJR) of Pin Grid Array (PGA)/ Land Grid Array (LGA) Socket during Mechanical shock. One of the main challenges in simulation is the complex socket/contact geometry convoluted with its massive number of degrees of freedom. This paper proposes a technique, Contact Isolation Method (CIM), to simplify the geom... View full abstract»

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  • Innovative, Multifunctional Contact-Spring Design

    Publication Year: 2008, Page(s):59 - 65
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (545 KB) | HTML iconHTML

    The connector industry is under increased pressure to innovate its products and reduce costs. For this reason it is no longer adequate only to use the latest development tools and strategies in order to implement new designs with increased speed and precision. It is also necessary to persuade the customer with added value by integrating multiple uses into the connector. An example details how the ... View full abstract»

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  • Extension and Experimental Verification of a New 'First Contact' Method to Model Performance of Multilayer Contact Interfaces

    Publication Year: 2008, Page(s):66 - 73
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1567 KB) | HTML iconHTML

    As the connector industry moves towards the use of smaller and smaller contact designs, achievable contact normal forces have been reduced to levels below what has been typically used previously in connector applications. Therefore, improving the ability to predict and analyze the mechanical and electrical performance of these lower force contact interfaces is becoming increasingly important. This... View full abstract»

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  • Investigation of Relaxation Behavior for Terminals of CPU Socket Connectors

    Publication Year: 2008, Page(s):74 - 77
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (137 KB) | HTML iconHTML

    Terminals of a CPU socket connector dominate signal transmission between the CPU and the motherboard. Contact forces between the terminal of an electronic connector and the corresponding counterparts generally play an important role in signal transmissions. The contact forces of these terminals, however, could decay gradually due to the stress relaxation effect under the high temperature condition... View full abstract»

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