Date 24-26 Sept. 2008
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Displaying Results 1 - 25 of 55
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Collection of papers presented at the 14th International Workshop on THERMal INvestigation of ICs and Systems
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PDF (111 KB)
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[Copyright notice]
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PDF (380 KB)
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Workshop Committee and Programme Committee
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PDF (371 KB)
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[Blank page]
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PDF (274 KB)
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Preface
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PDF (369 KB)
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[Blank page]
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PDF (317 KB)
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Table of contents
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PDF (329 KB)
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Managing leakage power and reliability in hot chips using system floorplanning and SRAM design
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PDF (480 KB)
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Material characterization and non-destructive failure analysis by transient pulse generation and IR-thermography
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PDF (757 KB)
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A novel procedure and device to allow comprehensive characterization of power leds over a wide range of temperature
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PDF (707 KB)
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