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Physics of Failure in Electronics, 1964. Third Annual Symposium on the

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Physics of Failure in Electronics, 1964. Third Annual Symposium on the

Date Sept. 29 1964-Oct. 1 1964

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Title History

[Breaker pages]

Physics of Failure in Electronics

[Breaker pages]

Preface

Table of contents

Opening Address

[Breaker pages]

Component Quality Assurance Programs for Microminiature Electronic Components for Minuteman II

Evaluation of R-F Noise Measurements for Diode Reliability Improvement by the Elimination of Weak Units

Application of Power Step Stress Techniques to Transistor Life Predictions

Emitter Softening in Diffused Silicon Transistors

The Determination and Analysis of Aging Mechanisms in Accelerated Testing of Selected Semiconductors, Capacitors and Resistors

[Breaker pages]

Silicon Surface Leakage

The Chemistry of Failure of Aluminum Electrolytic Capacitors

Failure Mechanisms in Reverse-Biased Oxide-Passivated Silicon Diodes

Failure Mechanisms at Surfaces and Interfaces

Planar Silicon Device Failure Mechanism Studies with the Microanalyzer Electron Probe

Physics of Failure in Commercialand

Physics of Failure Principles Applied to a Device Development Program

Prediction of Device Reliability by Mechanisms-of-Failure Principles

A Reliability Predictor for Semiconductor Devices

Failure Analysis Techniques

Management of the Human Element in the Physics of Failure

Experimental Confirmation of Precipitation and Oxidation in Evanohm Condensate Thin Films

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