52nd ARFTG Conference Digest

Dec. 1998

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Displaying Results 1 - 22 of 22
  • How to build a Learning R&D organization

    Publication Year: 1998, Page(s):1 - 39-40
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1291 KB)

    There are many factors that have impacted design productivity within Hewlett Packard: Effective Product Definition, an Institutionalized Process for New Product Introduction, an Integrated Design Infrastructure, Proficient Inter- and Intra-Group Communications, and Excellent Project Management Skills. One other factor that has paid large dividends is the utilization of the Learning Design Cycle. T... View full abstract»

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  • Increasing MMIC Design Capacity with Design Automation

    Publication Year: 1998, Page(s):22 - 27
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (489 KB)

    Business growth of many MMIC foundries is limited by design capacity. A MMIC design process is compared to a manufacturing process to identify opportunities to increase design capacity. The roles of design automation to reduce three types of design iterations and increase design efficiency are described. View full abstract»

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  • Simulation of a 915 MHz Receiver Using the HP Advanced Design System

    Publication Year: 1998, Page(s):28 - 38
    Cited by:  Papers (1)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (487 KB)

    The simulation of a 915 MHz receiver using Hewlett Packard's Advanced Design System™ CAE software is presented in this paper. The receiver subsystem includes input filtering and amplification, and a single down-conversion stage to a 70 MHz IF frequency. In order to demonstrate some capabilities of the software, examples of power budget, small-signal sweep, large signal sweep and harmonic b... View full abstract»

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  • Applications of an Envelope Simulator

    Publication Year: 1998, Page(s):39 - 54
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1815 KB)

    You can tackle difficult wireless circuit and subsystem designs involving digitally-modulated RF signals and transient RF signals with new but proven Circuit Envelope simulation technology. You can also design directly to digital wireless specifications instead of relying on intuition and guesswork from traditional TOI or gain compression analyses. This technology is available on the PC, and it al... View full abstract»

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  • Diagnostic of High Speed Analog Circuits using DC conditions

    Publication Year: 1998, Page(s):55 - 58
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (388 KB)

    This paper focusses the attention on the problem of analog nonlinear circuits diagnostic when a circuit with multiple DC solutions has a fault in any element and the possibility to locate the fault in the circuit is complicated due to change in the number of solutions. Several improvements are tried to include in [1] with the gain to use differents models in the electronic devices like diodes, bip... View full abstract»

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  • A New Two Temperatures Noise Model for FET Mixers Suitable for CAD

    Publication Year: 1998, Page(s):59 - 66
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (386 KB)

    In this paper, we propose a simple and accurate new model for determining the noise correlation matrix of FETs for mixer applications. Using this nonlinear noise model, and by a judicious choice of the terminations value present at each flequency, it is shown that the noise figure of FET mixers can be greatly improved. HP EEsof and IEMN are investigating incorporating the model into HP EEsof's pro... View full abstract»

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  • Noise Parameter Extraction of GaAs MESFETs and PHEMTs From Swept Noise Figure Measurements

    Publication Year: 1998, Page(s):67 - 72
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (331 KB)

    A new method of measuring and extracting bias dependent noise parameters for GaAs MESFETs and PHEMTs is presented. This technique only requires noise figure and S-parameter measurements over fiequency. This eliminates the need for time-consuming traditional sourcepull measurements and facilitates rapid noise parameter extraction. This technique makes the extraction of bias-dependent noise models o... View full abstract»

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  • A Sub 1 Ω Load-Pull Quarter-Wave Pre-Matching Network Based on a Two-Tier TRL Calibration

    Publication Year: 1998, Page(s):73 - 81
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (455 KB)

    Transistors used for cellular and PCS infrastructure applications are required to amplify signals with a peak-average ratio that can exceed 13 dB, resulting in a PEP approaching 1 kW. This PEP requirement is a consequence of simultaneous amplification of multiple digitally modulated carriers with a time-varying envelope, and requires a load resistance in the neighborhood of 0.3 Ω Present l... View full abstract»

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  • Automated Wafer Analysis using Wafer Map Autocorrelation

    Publication Year: 1998, Page(s):82 - 87
    Cited by:  Papers (2)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (770 KB)

    A complete wafer map contains information sufficient to discriminate certain prober errors, parametric errors, and point defect errors even without the full measured data set. Autocorrelation of the wafer map allows a simple automated analysis system to provide immediate feedback to the operator of known errors, allowing immediate retest in case of wafer probing errors and providing information to... View full abstract»

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  • Automated Characterization of Ceramic Multilayer Capacitors

    Publication Year: 1998, Page(s):88 - 94
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (410 KB)

    This paper describes an automated test configuration that is used for rapid characterization of the equivalent series resistance (ESR) of ceramic multilayer capacitors. The primary components in this system are a coaxial resonant line, an HP 8753D vector network analyzer, and a personal computer. Sample measurements are provided for several 1206 style capacitors, and the trends in ESR versus the i... View full abstract»

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  • The National Wireless Electronic Systems Testbed and its Initial Development

    Publication Year: 1998, Page(s):95 - 100
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (458 KB)

    The U.S. National Institute of Standards and Technology and the U.S. National Telecommunications and Information Administration are developing the National Wireless Electronic Systems Testbed (N-WEST), an experimental facility for characterizing the performance of wireless systems and the dependence of their performance on components, subsystems, modulation, propagation, interference, and other fa... View full abstract»

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  • Design of Components for a 7-16 Precision Calibration Kit Using the High Frequency Structure Simulator

    Publication Year: 1998, Page(s):101 - 105
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (364 KB)

    A systematic method to design components of a 7-16 connector type precision short-open-load-thru (SOLT) calibration kit for the wireless industry using the High Frequency Structure Simulator (HFSS) at microwave frequencies is presented. To achieve a better than 60 dB accuracy in the nominal optimized value of each individual feature, only one of the 5° segments of the coaxial structure was used t... View full abstract»

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  • Ground-Signal Standards for RF Probing

    Publication Year: 1998, Page(s): 106
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (14 KB)

    First Page of the Article
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  • Measuring and Modeling Package Interconnects Using Vector Network Analyzers and Time Domain Transforms

    Publication Year: 1998, Page(s):107 - 127
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (906 KB)

    First Page of the Article
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  • NIST Passive Intermodulation Measurement Comparison for Wireless Base Station Equipment

    Publication Year: 1998, Page(s):128 - 139
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (643 KB)

    The National Institute of Standards and Technology has initiated a passive intermodulation measurement comparison for the U.S. wireless industry. The goal is to determine the agreement in the measurements of third-order intermodulation products of passive devices made by participating companies for currently deployed communication bands. We provide the details of this comparison along with prelimi... View full abstract»

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  • Integrating System Level Design and Instrumentation for Communications Development

    Publication Year: 1998, Page(s):140 - 156
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1376 KB)

    A challenge for communication system designers is to integrate many hardware subsystems. After a system has been modeled in software it has to be transferred to a hardware prototype. Linking electronic design automation (EDA) tools with measurement equipment decreases the time needed to evaluate and troubleshoot the system. This is accomplished by allowing subsystems to be tested as if they were p... View full abstract»

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  • Power Amplifier Simulations

    Publication Year: 1998, Page(s):157 - 158
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (41 KB)

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  • Automatic RF Techniques Group Executive Committee Members - 1998

    Publication Year: 1998, Page(s):172 - 175
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1998, Page(s):1 - vii
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    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1998, Page(s):1 - 146
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    Freely Available from IEEE
  • Author index

    Publication Year: 1998, Page(s):1 - 165
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1998, Page(s):1 - 102
    Request permission for commercial reuse | PDF file iconPDF (2132 KB)
    Freely Available from IEEE