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ARFTG Conference Digest-Fall, 50th

Date Dec. 1997

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Displaying Results 1 - 25 of 26
  • Nonlinear Characterization by Harmonic Generation: An Alternative Technique for Measuring Intermodulation Distortions

    Publication Year: 1997, Page(s):1 - 12
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (799 KB)

    The same intrinsic nonlinear property that produces intermodulation distortion from two or more excitation tones, also produces harmonic generation from a single excitation tone. The measurement of one of these distortions, therefore, can be used to derive the results of the other. We have configured, tested and qualified an experimental setup to measure the nonlinear properties by harmonic genera... View full abstract»

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  • The Measurement of Intermodulation Products on Passive Components and Transmissionlines

    Publication Year: 1997, Page(s):13 - 22
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1005 KB)

    Multiple frequency carrier systems require components and transmission cables and connectors with low passive intermodulation products between the frequency channels. With the implementation of cellular private radio networks, the market and the usage of components with extreme low passive intermodulation products characteristics has been a dramatical growth in volume and tightened specifications.... View full abstract»

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  • Power Amplifer Intermodulation Distortion Measurements

    Publication Year: 1997, Page(s):23 - 26
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (698 KB)

    Power amplifiers have been used in communications systems for many years. The recent surge in demand for cellular phones, pagers, WLAN¿S and other wireless communications devices has revived the interest in the design of these building blocks of the telecommunications industry. One of the important performance parameters for these power amplifiers is intermodulation distortion (IMD), which is a m... View full abstract»

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  • A History of Microwave Wafer Probing

    Publication Year: 1997, Page(s):27 - 34
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (960 KB)

    A series of slides and pictures display the technological history of microwave wafer probing. View full abstract»

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  • History of Microwave Metrology at NIST

    Publication Year: 1997, Page(s):35 - 39
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (206 KB)

    A sage once said that ¿no subject can possibly be as interesting as its own history¿. He probably never had to sit through a lecture on the history of a branch of technology! In order to make the following review of microwave development at NIST more palatable, the author will inject occasional humor, and rather than simply enumerating facts and events, will seek to point out some of the driving... View full abstract»

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  • A Brief Look Back at Microwave Generator Calibration

    Publication Year: 1997, Page(s): 40
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (46 KB)

    Summary form only given, as follows. Since the initial use of noise figure as a measure of receiver noise about 50 years ago, one of the most compelling problems with the measurement has been the uncertainty in the calibration of the noise generator - the device which provides the two ¿known¿ levels of noise power required for the measurement. This presentation is a look at some of the past and ... View full abstract»

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  • Vector Network Analysis and ARFTG: A Historical Perspective

    Publication Year: 1997, Page(s): 41
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (92 KB)

    Summary form only given. In the early days of microwave development, the slotted line was the main measurement tool when reflection coefficient phase was needed. The slotted line allowed the magnitude and location of voltage ¿a and maxima to be found, so network parameters could be calculated. The process was indirect and time consuming. The Vector Network Analyzer (VNA) simplifies the network me... View full abstract»

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  • Characterization and Simulation of a 915MHz Wireless Receiver

    Publication Year: 1997, Page(s):42 - 53
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (784 KB)

    A versatile test bench and CAE environment are employed to characterize and simulate a 915MHz receiver subsystem. The subsystem, which down-converts to a 70MHz IF frequency, is constructed with coaxial components and characterized at several different levels. The 3GHz test bench used includes a vector network analyzer, a spectrum analyzer, and a synthesized signal source. Measurements are compared... View full abstract»

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  • Designing a C-Band Downconverter for High Testability

    Publication Year: 1997, Page(s):54 - 63
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (998 KB)

    This article describes the design of a C-band down-converter that incorporates hybrid probe points to provide a flexible, production-line test capability. These probe points, available commercially from Jmicro, allow repetitive, non-destructive testing during assembly as well as convenient trouble-shooting of post-production failures. As demonstrated within, the added functionality comes at little... View full abstract»

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  • The Effects of Line Width and Slot Etching on Silicon-Based CPW at MM-Wave Frequencies

    Publication Year: 1997, Page(s):64 - 72
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (703 KB)

    An experimental study is in progress to investigate the performance of coplanar waveguide (CPW) transmission lines which are printed on high-resistivity silicon. In one sample group a nominal characteristic impedance of 50 ¿ is maintained while the ground plane spacing and ground plane width are varied. In this group conventional CPW lines are included, as well as lines in which the slots have be... View full abstract»

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  • High Speed Power Measurements for Digital Wireless Applications

    Publication Year: 1997, Page(s):73 - 83
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1046 KB)

    RF power is a fundamental measurement representing energy transfer over a period of time. This paper discusses power sensor technology and measurement accuracy. Sensor Technology Commercial sensor element types include thermistors, thermocouples, thermopiles and diodes. Thermistors, thermocouples, and thermopiles sensors are based upon heat transfer principles. Diodes are not absorption devices. View full abstract»

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  • Vector Corrections for an Automated Power Sensor Calibration System

    Publication Year: 1997, Page(s):84 - 90
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    In an ideal measurement system, all error sources have been identified and eliminated. The system described here was based in error analysis so that these sources would be minimized. The result is a highly accurate automated system to characterize thermistor, diode, and thermoelectric Type N coaxial RF/microwave power sensors. The system described operates fiom 50 MHz to 18 GHz. Methods to extend ... View full abstract»

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  • ACPR, IM3 and their Correlation for a PCS CDMA Power Amplifier

    Publication Year: 1997, Page(s):91 - 96
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (283 KB)

    In this paper, the measured and simulated data of adjacent channel power ratio(ACPR) for a PCS CDMA power amplifier (PA) is presented. The measured data agrees well with the simulated results which were obtained by using ¿Circuit Envelope Simulator¿ in HP-EESOF¿s Microwave Design System (MDS). Additionally, third order intermodulation (IM3) performance for the PA was also measured and simulated... View full abstract»

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  • CDMA Load Pull Measurements with Harmonic Tuning and Harmonic Behavioral Modeling

    Publication Year: 1997, Page(s):97 - 100
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (343 KB)

    A load pull system that has CDMA stimulus and response capability is presented. This novel system performs harmonic tuning using a single, solid-state, impedance tuner without a multiplexer or harmonic loops. In addition, it has a characterization approach that can fit a behavioral model of a measured parameter as a function of the fundamental and harmonic termination. It model is a general equati... View full abstract»

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  • Measurement of Large Signal Device Input Impedance During Load Pull

    Publication Year: 1997, Page(s):101 - 106
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (337 KB)

    Knowledge of device input impedance as a function of power level and load matching is useful to fully understand non-linear device behavior, and is also needed to rigorously determine the delivered input power for any arbitrary source tuner setting. This paper describes a technique of measuring the input impedance directly during a load or source pull using a vector network analyzer. View full abstract»

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  • A Method for Comparing Vector Network Analyzers

    Publication Year: 1997, Page(s):107 - 114
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (639 KB)

    We present a method of comparing two distinct vector network analyzer systems by taking the differences in calibrated S-parameters over a set of test devices. The maximum magnitude of all S-parameter differences in the ensemble of data provides an estimate of the upper bound on the system differences for the set of test devices measured. If the maximum ensemble difference is greater than the repea... View full abstract»

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  • Formulations of the Basic Vector Network Analyzer Error Model including Switch-Terms

    Publication Year: 1997, Page(s):115 - 126
    Cited by:  Papers (36)  |  Patents (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (628 KB)

    This paper explores details of the relationship between two expressions of the basic error model describing a two-port vector network analyzer (VNA). One of these formulations is the conventional twelve-term formulation; the other is in terms of error boxes. The paper focuses on the role of the switch terms. By fully detailing the relationship between the two formulations, the paper arrives at sev... View full abstract»

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  • Characteristics and Accuracy of a Fully Corrected Four-port Vector Network Analyzer

    Publication Year: 1997, Page(s):127 - 130
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (377 KB)

    A new, fully corrected, four ports-parameter test system has been developed and evaluated. In this system, all sixteen s-parameters are accurately measured by a fully vector corrected system. The new test system is compared to conventional methods of measuring 4-port s-parameters, and measurement examples are shown. Accuracy of measurements with the new system is compared to measurements made conv... View full abstract»

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  • Series-Resistor Calibration

    Publication Year: 1997, Page(s):131 - 137
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (354 KB)

    We develop a coplanar-waveguide probe-tip scattering parameter calibration based on a thru, a reflect, and an accurately modeled series resistor. Comparison to a multiline Thru-Reflect-Line calibration verifies the accuracy of the method. View full abstract»

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  • Data Assessment of The ARFTG Microwave Vector Network Analyzer Measurement Comparison Program

    Publication Year: 1997, Page(s):138 - 164
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1154 KB)

    The purpose of the Automatic Radio Frequency Techniques Group (ARFTG) Measurement Comparison Program (MCP) is to allow participating laboratories to compare their measurements on the ARFTG standards kits to measurements obtained from other laboratories. The MCP is designed to permit the intercomparison of a large number of automatic vector network analyzers (VNA) and of different connector types. ... View full abstract»

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  • A High Throughput On-Wafer RFIC Tester

    Publication Year: 1997, Page(s):165 - 171
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (599 KB)

    Volume RFIC production requirements are driving industry to seek higher throughput lower cost on-wafer comprehensive dc and RF test capability than can be implemented using traditional ¿rack and stack¿ test systems. To meet RFIC volume test demands, an in-house on-wafer test system based upon HP¿s 84000 RFIC tester was designed and implemented. With the resulting system a 23X on-wafer test thro... View full abstract»

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  • Automatic RF Techniques Group Executive Committee Members - 1997

    Publication Year: 1997, Page(s):185 - 187
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1997, Page(s):1 - vi
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    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1997, Page(s):1 - 146
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    Freely Available from IEEE
  • Author index

    Publication Year: 1997
    Request permission for commercial reuse | PDF file iconPDF (2384 KB)
    Freely Available from IEEE