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ARFTG Conference Digest-Spring, 43rd

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ARFTG Conference Digest-Spring, 43rd

Date May 1994

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Title History

Electronic Calibration of a Vector Network Analyzer (VNA) for Non-Insertable Devices

The Multi-State Two-port: An Alternative Transfer Standard

Study of Millimeter-Wave On-Wafer Calibration Techniques and Effect Upon HEMT Parameter Extraction

Network Analyzer Calibration for Cryogenic On-Wafer Measurements

Cryogenic Probe Station for Use in Automated Microwave and Noise Figure Measurements

Implementation of a Noise Model and Extraction Method for GaAs MESFETs

High Accuracy Signal/Noise Measurement of Microwave Power Amplifiers

Accuracy of Broadband On-Wafer Load Pull Measurements

An Air Coplanar Wafer Probe

Microwave Probing Measurements with a Monolithic Six-Port Module (MSPM)

Determining Uncertainty in Antenna Array Measurements

Automated High-Power RF Microwave Tube Test Stand

Manufacturing Microwave and RF Test Equipment To Meet The Requirements of ISO 9002

Data Processing For Q Factor Measurement

A Position-Insensitive Measurement of the Permittivity and Permeability in Coaxial Airline

A Non-Linear High-Power MESFET Amplifier Model Verified by Waveform and Load-Pull Measurements

Comparison between complete and simplified methods for determining the microwave noise parameters of HEMTs

ARFTG Executive Committee Members

ARFTG Mailing and Membership List as of 03/11/94

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