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ARFTG Conference Digest-Spring, 43rd

Date May 1994

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Displaying Results 1 - 23 of 23
  • Electronic Calibration of a Vector Network Analyzer (VNA) for Non-Insertable Devices

    Publication Year: 1994, Page(s):1 - 10
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (618 KB)

    A characterized multi-state electronic transfer standard (MSETS) in conjunction with an unknown adapter can provide an appropriate connector configuration for the characterization of the non-insertable devices. The connector non-repeatability of the adapter is eliminated because it is characterized after it has been inserted in the circuit and it is never removed from the circuit until the non-ins... View full abstract»

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  • The Multi-State Two-port: An Alternative Transfer Standard

    Publication Year: 1994, Page(s):11 - 18
    Cited by:  Papers (4)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (601 KB)

    In a companion paper [1] the proposed use of a ¿stable solid state programmable impedance generator¿ as a calibration transfer and verification standard, for vector network analyzers, (VNA) has been suggested. An obvious requirement is that the multi-state device provide a high degree of stability and repeatability. This paper describes a series of preliminary tests, using the NIST six-port syst... View full abstract»

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  • Study of Millimeter-Wave On-Wafer Calibration Techniques and Effect Upon HEMT Parameter Extraction

    Publication Year: 1994, Page(s):19 - 23
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (303 KB)

    A new procedure has been developed to identify which calibration techniques are most suitable for millimeter-wave, on-wafer measurements. This work quantifies the sources and types of error encountered with SOLT and LRM calibrations in relation to multi-line TRL calibrations at V-band. A sensitivity analysis studies these calibration effects upon InP HEMT parameter extraction at V-Band. View full abstract»

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  • Network Analyzer Calibration for Cryogenic On-Wafer Measurements

    Publication Year: 1994, Page(s):24 - 33
    Cited by:  Papers (5)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1102 KB)

    A cryogenic probe station for on-wafer microwave measurements has been developed at Sandia National Laboratories to explore basic device physics and characterize advanced components for low-temperature applications. The station was designed to operate over a temperature range of 20 to 300 K with a frequency range of DC to 50 GHz. Due to the vacuum and the low temperature environment, the use of mi... View full abstract»

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  • Cryogenic Probe Station for Use in Automated Microwave and Noise Figure Measurements

    Publication Year: 1994, Page(s):34 - 42
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (651 KB)

    A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices and circuits has been developed. This ¿CryoProbe Station¿ can wafer probe devices and circuits at cryogenic temperatures, thus eliminating the need for wire bonds. The system operates under vacuum created by a sorption pump. It uses an open cycle cooling system that can be cooled with either liquid ... View full abstract»

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  • Implementation of a Noise Model and Extraction Method for GaAs MESFETs

    Publication Year: 1994, Page(s):43 - 47
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (300 KB)

    A noise model for GaAs MESFETs based on the small signal equivalent circuit is described. The model is a variation of that described by Pospieszalski. It is shown that good agreement between measured and modeled noise performance can be obtained by varying a single parameter in the model, namely the drain noise current iDn, which may be obtained by measuring the device noise figure at a single fre... View full abstract»

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  • High Accuracy Signal/Noise Measurement of Microwave Power Amplifiers

    Publication Year: 1994, Page(s):48 - 57
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (598 KB)

    To improve the repeatability and correlation of signal-to-noise ratio measurements of microwave power tubes between test sites, and between test sets at the same test site, a self-calibrating measurement technique has been developed. This technique results in an accuracy of better than 0.1 dB, and a repeatability primarily determined by the number of independent noise samples taken. Without calibr... View full abstract»

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  • Accuracy of Broadband On-Wafer Load Pull Measurements

    Publication Year: 1994, Page(s):58 - 69
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (754 KB)

    Numerous systems are currently available for taking semi-automated load pull measurements. The majority of these systems use computer controlled, passive microwave tuners. At Texas Instruments a test set has been constructed around one of these systems to make broadband on-wafer measurements on large numbers of devices. Through various experiments, the accuracy of the system is examined both at th... View full abstract»

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  • An Air Coplanar Wafer Probe

    Publication Year: 1994, Page(s):70 - 75
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (552 KB)

    A new wafer probe is presented based on using coplanar waveguide in air. The transmission line is called air coplanar waveguide, and the probe an air coplanar probe (ACP). The probe consists of a coaxial connector, a short piece of coaxial cable and finally the air coplanar waveguide which is formed into a probe tip. This air coplanar tip is made of beryllium copper (BeCu) and allows in excess of ... View full abstract»

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  • Microwave Probing Measurements with a Monolithic Six-Port Module (MSPM)

    Publication Year: 1994, Page(s):76 - 82
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (523 KB)

    This paper presents the design of monolithic six-port module MSPM with resistive bridges. It shows how these simple structures may act as directional resistive couplers. Final MMIC circuit includes six-port junction and matched MESFET detectors covering an area of 1.2 mm2 in the frequency range 100 MHz to 3 GHz. The MSPM was bonded in a MIC structure with output coaxial connectors. Experimental re... View full abstract»

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  • Determining Uncertainty in Antenna Array Measurements

    Publication Year: 1994, Page(s):83 - 92
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (870 KB)

    Recently a 7X7 cross dipole array** was built and tested to compare its performance against the predicted calculations which were obtained using the Numerical Electromagnetic Code, version 4 (NEC-4). The cross dipole array was designed to operate at two bands: the lower band ranged from 56 MHz to 140 MHz and the upper band ranged from 130 MHz to 200 MHz. A vector network analyzer (Hewlett Packard ... View full abstract»

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  • Automated High-Power RF Microwave Tube Test Stand

    Publication Year: 1994, Page(s):93 - 98
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (569 KB)

    This paper describes an automated test stand used for testing the high-power klystron amplifiers for the Ground Test Accelerator (GTA). To verify klystron performance, we have developed an automated test system using data-acquisition and control programs based on LabVIEW¿, a program that readily interfaces with both the high-power transmitter¿s programmable logic controller and the GPIB interfac... View full abstract»

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  • Manufacturing Microwave and RF Test Equipment To Meet The Requirements of ISO 9002

    Publication Year: 1994, Page(s):99 - 103
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (330 KB)

    ISO 9002 specifies quality system requirements which must be met in order to demonstrate a supplier¿s capability to control processes that determine the acceptability of products supplied to a customer. These requirements are designed to detect and prevent any non-conformity during manufacturing and installation. In practice, ISO 9002 requires a supplier to establish the intent, implementation, a... View full abstract»

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  • Data Processing For Q Factor Measurement

    Publication Year: 1994, Page(s):104 - 111
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (428 KB)

    The Q factor and the coupling coefficient are determined from the file of reflection coefficient data measured with a vector network analyzer. The data processing is accomplished by a curve fitting procedure for a fractional linear mapping on a complex plane. The procedure is well suited for very high values of Q factor, and it is performed on a personal computer. The number of measured points is ... View full abstract»

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  • A Position-Insensitive Measurement of the Permittivity and Permeability in Coaxial Airline

    Publication Year: 1994, Page(s):112 - 116
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (279 KB)

    A position-insensitive measurement method of the permittivity and permeability of microwave materials in coaxial airline is described. In this method the sample position is found from the measurement data, and the errors arising from position uncertainty of the material are eliminated. Experimental results for two arbitrary locations of a ferrite sample are included to illustrate the validity of t... View full abstract»

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  • A Non-Linear High-Power MESFET Amplifier Model Verified by Waveform and Load-Pull Measurements

    Publication Year: 1994, Page(s):117 - 120
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (290 KB)

    A high-power metal-semiconductor field-effect transistor amplifier model was developed based on novel theoretical features and experimental verification techniques. The model accurately predicts the amplifier output characteristics, including power, efficiency and linearity, as functions of bias, input and load conditions. Detailed variation of intermodulation distortion with input power was expla... View full abstract»

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  • Comparison between complete and simplified methods for determining the microwave noise parameters of HEMTs

    Publication Year: 1994, Page(s):121 - 126
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (416 KB)

    Modem automatic noise parameter measuring systems are based on measurements of some values of F(rs ) for different values of I¿¿s (more than four, for redundancy) realized by adjusting an admittance transformer (tuner) inserted between the noise source and the TUT mput . Such values are then manipulated by means of proper data processing techniques using eqn.( 1) [ 11. This measuring procedure is ... View full abstract»

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  • ARFTG Executive Committee Members

    Publication Year: 1994, Page(s):135 - 136
    Request permission for commercial reuse | PDF file iconPDF (115 KB)
    Freely Available from IEEE
  • ARFTG Mailing and Membership List as of 03/11/94

    Publication Year: 1994, Page(s):137 - 148
    Request permission for commercial reuse | PDF file iconPDF (1307 KB)
    Freely Available from IEEE
  • Table of contents

    Publication Year: 1994, Page(s):1 - vii
    Request permission for commercial reuse | PDF file iconPDF (209 KB)
    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1994, Page(s):1 - 146
    Request permission for commercial reuse | PDF file iconPDF (2233 KB)
    Freely Available from IEEE
  • Author index

    Publication Year: 1994, Page(s):1 - 165
    Request permission for commercial reuse | PDF file iconPDF (2384 KB)
    Freely Available from IEEE
  • Table of contents

    Publication Year: 1994, Page(s):1 - 102
    Request permission for commercial reuse | PDF file iconPDF (2132 KB)
    Freely Available from IEEE