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ARFTG Conference Digest-Fall, 42nd

Date 2-3 Dec. 1993

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Displaying Results 1 - 18 of 18
  • Wireless Market: Implications for RF Test & Measurement

    Publication Year: 1993, Page(s):1 - 5
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (173 KB)

    In the face of a static or declining defense budget, the microwave industry is placing its hopes on the growth in commercial markets particularly in the wireless area. In this paper we will discuss how the market is segmented, the anticipated developments in these segments and the implications for test and measurement. The emerging character of this market makes it hard to segment in any simple wa... View full abstract»

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  • X-Band Insertion Loss Process Control Measurement System

    Publication Year: 1993, Page(s):6 - 15
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (401 KB)

    This paper discusses the development and integration of an automated positioning system with a X-Band Insertion Loss (IL) measurement system. The system operates as an In-Line feedback controller to manufacture Stealthy web materials, which are later formed into loaded honeycomb core. Customized software positions two X-Band antennas at user-defined locations to retrieve real-time transmission IL ... View full abstract»

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  • Westinghouse Calibrated RF Digital Communications Signal Generator and Channel Emulator

    Publication Year: 1993, Page(s):16 - 22
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (414 KB)

    Westinghouse is currently under contract to design and produce the Mobile Satellite System (MSS) Ground Segment and Satellite Mobile Terminal (MT) for the American Mobile Satellite Corporation (AMSC) and Telesat Mobile Inc. (TMI) of Canada. To allow for the development and testing of the Mobile Terminal product, Westinghouse has developed the Calibrated RF Digital Communications Signal Generator a... View full abstract»

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  • TUNTEST - Programme Package for TV Tuner Characteristics Automated Measuring

    Publication Year: 1993, Page(s):23 - 31
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (650 KB)

    In this paper PC computer based programme package for varicap diode TV tuner characteristics automated measuring is presented. Programme package allows both separated and complete tuner characteristics measuring. Measurement results are displayed in tabelar or graphics form. Programme package is very efficient, in relation to manually tuner measuring methods. Saving in time is obtained, and the pr... View full abstract»

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  • LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines

    Publication Year: 1993, Page(s):32 - 36
    Cited by:  Papers (12)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (323 KB)

    The line-reflect-match calibration is extended, without significant loss of measurement accuracy, to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length. The new method provides a practical means of obtaining accurate, wideband calibrations with c... View full abstract»

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  • Verification of Commercial Probe-Tip Calibrations

    Publication Year: 1993, Page(s):37 - 44
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (462 KB)

    We present results of a verification procedure useful in evaluating the accuracy of probe-tip scattering parameter measurements. The procedure was applied to calibrations and measurements performed in industrial laboratories. Actual measurement discrepancies, due primarily to calibration errors, are directly com pared to bounds determined by the comparison method. The results demonstrate the utili... View full abstract»

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  • Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates

    Publication Year: 1993, Page(s):45 - 47
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (130 KB)

    The microwave on-wafer measurement community has been searching for a mechanism to quantify calibration inaccuracies. Recent work at the National Institute of Standards and Technology (NIST) has enabled the determination of calibration error bounds by comparison with a well understood technique - the NIST multi-line GaAs TRL calibration. A series of automated Line-Reflect-Reflect-Match (LRRM) cali... View full abstract»

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  • Techniques for Automated On-Wafer Measurements of Sub-30PS Transition-Time Pulse and Data Amplifiers

    Publication Year: 1993, Page(s):48 - 54
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (470 KB)

    Techniques for calibrating and measuring the relative time of arrivals of pulse edges for wafer-probed pulse amplifier ICs are described. Fixturing, waveform dependency, and dc measurement are considered. Criteria for selecting an appropriate level of calibration are described. These techniques are successfully applied in the measurement of sub-30 ps edge transitions from a pulse amplifier IC. View full abstract»

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  • Automated Test System for Microwave Devices

    Publication Year: 1993, Page(s):55 - 56
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (101 KB)

    This paper describes a microwave measurement system designed to address the single connection, multiple measurement testing requirements for active devices. This market is rapidly growing, especially in the rf and microwave semiconductor market place. View full abstract»

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  • A Pulse Bias/RF Environment for Device Characterization

    Publication Year: 1993, Page(s):57 - 60
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (264 KB)

    Characterizing semiconductor devices is often limited by temperature rises within the device under test. These junction temperature rises are a result of the static DC biasing which must be applied to the device before making characterization measurements. Junction temperature increases can distort the measurements or damage the device being tested. This paper describes a technique to characterize... View full abstract»

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  • A Combined Measurement Stand for Linear, Nonlinear and Noise Measurements of Microwave Devices and Circuits

    Publication Year: 1993, Page(s):61 - 66
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (342 KB)

    A novel approach is presented for a measurement system which is able to investigate the most relevant specifications of microwave circuits and components. The test stand is configured for on wafer measurements up to 60GHz, but can also be used for connectorized device measurements. The main measurement capabilities of the system are: Two and three port scattering parameters, noise figure and noise... View full abstract»

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  • Vector Measurement of "Nonlinear Transfer Function"

    Publication Year: 1993, Page(s):67 - 80
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (649 KB)

    A technique for the precise frequency-domain characterization of weakly non-linear RF/microwave networks is described. The method, which is capable of measuring the so-called Nonlinear (Volterra) Transfer Function, proves to be invaluable in designing high performance pre-distorters to linearize non-linear RF/microwave devices. The non-linearity under test (NLUT) is subjected to stimulus from seve... View full abstract»

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  • Characterization of Electromagnetic Software

    Publication Year: 1993, Page(s): 81
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (170 KB)

    Summary form only given. Presents slides of the paper on electromagnetic software. View full abstract»

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  • ARFTG Executive Committee Members

    Publication Year: 1993, Page(s):95 - 97
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1993, Page(s):1 - v
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    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1993
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  • Author index

    Publication Year: 1993, Page(s):1 - 165
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1993, Page(s):1 - 102
    Request permission for commercial reuse | PDF file iconPDF (2132 KB)
    Freely Available from IEEE