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By Topic

ARFTG Conference Digest-Spring, 37th

Date 13-14 June 1991

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Displaying Results 1 - 19 of 19
  • Electromagnetic Simulation of Microwave Components

    Publication Year: 1991 , Page(s): 3 - 9
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (476 KB)  

    Workers in industry and academia have been writing numerical codes to solve electromagnetic fields problems for several decades. These programs were often written - on main frame computers with little thought given to portability or the user interface. Only in the past few years have commercial general purpose electromagnetic field solvers become available to the engineering community. These comme... View full abstract»

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  • Simple Microstrip Structures Calculated vs Measured

    Publication Year: 1991 , Page(s): 10 - 20
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (516 KB)  

    The microwave performance of simple microstrip structures such as gaps, bends, stubs, termination and Beatty lines was calculated using both standard RF analysis and EM analysis. The structures were manufactured on 10 mil alumina and the RF performance was measured to 60 GHz. The results are compared. The question of the accuracy of both models and measurements is always nagging, especially at hig... View full abstract»

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  • A Resonant Mode Dielectrometer for Substrates

    Publication Year: 1991 , Page(s): 21 - 25
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (317 KB)  

    An advance towards meeting the need for microwave permittivity measurements of substrates is represented by the resonant mde dielectrmter (RMD), Fig.lb. The RMD is an evolution frun the evanescent mde dielectrmter (EMD), which is related to other evanescent resonators. These methods use the lowest resonance of the TE-01 cylindrical waveguide mode; and as a result, no metalization of the specimen i... View full abstract»

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  • Modeling Precision Connectors with a High Frequency Structure Simulator

    Publication Year: 1991 , Page(s): 26 - 34
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (412 KB)  

    Presents a series of slides and explanations of modeling precision vonnectors with a high frequency structure simulators. View full abstract»

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  • A Novel Tecknioue for Vector Network Measurement

    Publication Year: 1991 , Page(s): 35 - 42
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (433 KB)  

    A novel technique for the vector measurements of RF/microwave networks provides dramatic reduction of cost and complexity. The method also provides good accuracy, wide dynamic range, easy de-embedding features and other advantages. Being heavily dependent on Digital Signal Processing (DSP), it is perfectly suited to the modern trend of computation-intensive RF instrumentation. View full abstract»

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  • Discontinuities and Noise Modeling Noise Model Verification Using Advanced " Discontinuities "

    Publication Year: 1991 , Page(s): 43 - 55
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (494 KB)  

    Presents a series of slides and explanations of discontinuities and noise modeling noise model verification using advanced discontinuities. View full abstract»

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  • A Gigahertz Test Fixture for Two Port Passive Devices

    Publication Year: 1991 , Page(s): 56 - 65
    Cited by:  Papers (3)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (663 KB)  

    Since it is not possible to obtain exact standards for many types of filters, resonators and discrete components, it is necessary to qualify procedures for extraction of device parameters. In addition, the package adds additional parasitics to equivalent circuit models which increases the difficulty of parameter extraction. A procedure has been developed using scattering parameters for extraction ... View full abstract»

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  • Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners

    Publication Year: 1991 , Page(s): 66 - 75
    Cited by:  Papers (6)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (573 KB)  

    A wafer probing system capable of both noise, and load and source pull measurements is described. The system is based on precision computer controlled electromechanical tuners. Sophisticated system software controls calibration, measurements, data analysis and display. Results of measurements of submicron In-GaAs/InAlAs/InP HEMTs and GaAs MESFETs are presented. View full abstract»

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  • Pulsed Bias-RF Power GaAs MMIC Testing

    Publication Year: 1991 , Page(s): 76 - 84
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (314 KB)  

    Development of automated on-wafer test methods over the past few years has made possible the highly accurate characterization of both passive and low-power active microwave devices without the extra time, expense, and accuracy degradation introduced by packaging. Probes operating from dc to 65 GHz and enhanced calibration procedures such as the TRL method [ l ] have aided in construction of test s... View full abstract»

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  • Error Correction and Power Calibration of Active Load Pull Measurement Systems

    Publication Year: 1991 , Page(s): 86 - 93
    Cited by:  Papers (5)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (318 KB)  

    A 26.5 to 40 GHz active load pull measurement system has been developed using a commercially available test fixture and bias tees. At 27 GHz, the system is capable of reflection coefficient magnitude accuracy better than 0.007, phase error less than 4 degrees, and gain uncertainty less than 0.15 dB. Reflection coefficient measurements are corrected by flrst using a standard network analyzer TRL ca... View full abstract»

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  • Using a Packaged Fet to Transform Between Measurement Media

    Publication Year: 1991 , Page(s): 94 - 103
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (349 KB)  

    The recent availability of low cost HEMT devices in an improved stripline package useful to 26GH2, though exciting for the hybrid amplifier designer, poses new measurement problems for the device supplier. Hybrid applications are most commonly in microstrip, with the leads cropped short and soldered down. Therefore using an improved version of the TTF1 or even a full lead length microstrip fixture... View full abstract»

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  • Measuring Resistive Sheets in Free Space

    Publication Year: 1991 , Page(s): 104 - 112
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (402 KB)  

    Resistive sheet material, having surface resistance measured in ohms per square, is measured in a reflection and transmission manner by placing the material between two antennas. The measured transmission data is then converted to the time domain for separation of surface reflection and the attenuation thru the material. View full abstract»

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  • Matched Filter Detection Adds Versatility to a Spectrum Analyzer

    Publication Year: 1991 , Page(s): 113 - 116
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (193 KB)  

    By adding a matched filter at the output IF stage of a Spectrum Analyzer, finer resolution bandwidth (RBW) and wider dynamic range (due to improved SNR) can be obtained. Under certain conditions, the matched filter allows the phase information of the frequency components to be recovered, potentially making the analyzer capable of displaying time-domain data and performing vector network measuremen... View full abstract»

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  • ARFTG Executive Committee Members

    Publication Year: 1991 , Page(s): 125 - 126
    Save to Project icon | Request Permissions | PDF file iconPDF (117 KB)  
    Freely Available from IEEE
  • ARFTG Membership List as of February 1991

    Publication Year: 1991 , Page(s): 127 - 145
    Save to Project icon | Request Permissions | PDF file iconPDF (1134 KB)  
    Freely Available from IEEE
  • Table of contents

    Publication Year: 1991 , Page(s): 1
    Save to Project icon | Request Permissions | PDF file iconPDF (118 KB)  
    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1991 , Page(s): 1 - 146
    Save to Project icon | Request Permissions | PDF file iconPDF (2233 KB)  
    Freely Available from IEEE
  • Author index

    Publication Year: 1991 , Page(s): 1 - 165
    Save to Project icon | Request Permissions | PDF file iconPDF (2384 KB)  
    Freely Available from IEEE
  • Table of contents

    Publication Year: 1991 , Page(s): 1 - 102
    Save to Project icon | Request Permissions | PDF file iconPDF (2132 KB)  
    Freely Available from IEEE