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ARFTG Conference Digest-Fall, 36th

Date 29-30 Nov. 1990

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Displaying Results 1 - 23 of 23
  • Comments Concerning On-Wafer Noise Parameter Measurements

    Publication Year: 1990, Page(s):5 - 15
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (438 KB)

    The National Institute of Standards and Technology (NIST) has a goal of offering an on-wafer noise parameter special test service for 8 - 12 GHz amplifiers in 1992. This paper discusses two preliminary stages in the development of this service: the measurement of component amplifier noise parameters, and elementary on-wafer noise measurements. The measurement approach is described and the basic re... View full abstract»

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  • Improvements to On-Wafer Noise Parameter Measurements

    Publication Year: 1990, Page(s):16 - 25
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (602 KB)

    A new system for measuring noise parameters on-wafer has been developed that incorporates three main new features: (1) the source can be tuned to any impedance including Zopt rather than pre-calibrated settings, (2) the system corrects for drift in second stage gain, and (3) calibration is simplified with an on-wafer noise source. This cold-noise measurement system uses a HP8510B network analyzer ... View full abstract»

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  • Results of an On-Wafer Noise-Parameter Measurement Comparison

    Publication Year: 1990, Page(s):26 - 35
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (408 KB)

    The results from an on-wafer noise-parameter measurement comparison are presented. The measurement comparison was coordinated by the TRW Measurement Engineering Department. The measurement comparison consisted of two parts. In the first part, after standardizing the network analyzer and noise-figure meter operating conditions, each participant calibrated their system using their customary S-parame... View full abstract»

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  • Verification of Calculations Made by the ATN NP5 Noise Figure Measurement System

    Publication Year: 1990, Page(s):36 - 46
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (601 KB)

    The verification of measurements made by software-driven instrumentation systems is a difficult task since it is rarely possible to guarantee that the software is error free. The difficulty increases when both the internal measurement algorithms and software are undergoing continuous development and refinement. View full abstract»

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  • Multi-Line Calibration for MMIC Measurement

    Publication Year: 1990, Page(s):47 - 56
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (501 KB)

    Perhaps the most precise means of network analyzer calibration is the TRL (thru-reflectline) method [ll. Certain inevitable errors, prominent among them the nonrepeatability of connectors, limit the accuracy of any calibration method. The error analysis of the TRL method presented here is particularly useful because it suggests tactics for error reduction. The most significant error reductions ari... View full abstract»

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  • LRM and LRRM Calibrations with Automatic Determination of Load Inductance

    Publication Year: 1990, Page(s):57 - 63
    Cited by:  Papers (81)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (615 KB)

    Two new techniques are presented in an effort to achieve greater accuracy and better repeatability in the on-wafer calibration of vector network analyzers. The first is a method of determining an inductance value for the match standard during the calibration process so that only its resistance, not its reactance, needs to be known. The second is a new type of calibration, LRRM (line-reflect-reflec... View full abstract»

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  • MMIC Package Characterization with Active Loads

    Publication Year: 1990, Page(s):64 - 72
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (617 KB)

    A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately characterized from external reflection coefficient measurements when a single bias-dependent active standard is embedded within it. The frequency characteristics, stability, and linearity of active PIN diode standards are investigated. View full abstract»

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  • Progress Toward MMIC On-wafer Standards

    Publication Year: 1990, Page(s):73 - 83
    Cited by:  Papers (10)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (764 KB)

    A prototype standard set in coplanar waveguide suitable for the calibration of wafer probe stations has been developed through a cooperative effort between the National Institute of Standards and Technology and a MIMIC Phase 3 team. The coplanar standard set is intended primarily for in-process testing, although the characterization of coplanar waveguide circuits is also possible. In this paper tw... View full abstract»

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  • The Interpretation and Use of S-Parameters in Lossy Lines

    Publication Year: 1990, Page(s):84 - 90
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (383 KB)

    Although a fundamental parameter of transmission lines, the charac. teristic impedance is difficult to measure accurately. We suggest a method by which it may be easily determined from a measurement of the propagation constant. The method is based on a rigorous analysis from first principles using explicit and realistic approximations which include the effects of imperfect conductors. Results of n... View full abstract»

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  • On-Wafer Three-Port Characterization of Microstrip Transistors for Monolithic Microwave Integrated Circuits

    Publication Year: 1990, Page(s):91 - 100
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (621 KB)

    The transistor, which is a three-port device, is generally characterized by its two-port s-parameters with one of its ports grounded. A finite source-to-ground impedance is unavoidable in two-port characterization, and is a significant source of error at microwave frequencies unless the common port is always grounded in the same manner as characterized. Three-port characterization is fundamentally... View full abstract»

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  • Large Signal 2nd Harmonic on Wafer Mesfet Characterization

    Publication Year: 1990, Page(s):101 - 106
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (309 KB)

    An automatic test set which performs a real time harmonic load-pull characterization is proposed. An active load technique is used in order to set the load at the test frequency and its harmonics and a complete set of device parameters useful for power amplifier design purposes can be measured versus the harmonic loads. The calibration procedure, based on substrate and coaxial standards, has been ... View full abstract»

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  • An Automated System for On-Wafer DC, S-Parameter, Power, and Harmonics Measurements of Broadband GaAs MMICs

    Publication Year: 1990, Page(s):107 - 116
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (550 KB)

    An automated test system for broadband on-wafer measurements of small-signal and medium power GaAs MMICs has been developed. This system is capable of S-parameter measurements to 34 GHz, harmonics measurements to 40 GHz, and power measurements to 26.5 GHz. To maximize serviceability and phase stability, and to minimize drive signal loss the test set was constructed on the autoprober top plate. A 3... View full abstract»

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  • Software For Automated On-Wafer Testing

    Publication Year: 1990, Page(s):117 - 127
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1083 KB)

    The MIMIC Phase I program2 has funded the development of test software that has been designed for automated testing of a broad range of MMICs device types (amplifiers, mixers, phase shifters, multiple pole switches, oscillators, etc.). The test software is an integrated RF/microwave measurement package that allows automated on-wafer, carrier, and module level testing. The objective of the developm... View full abstract»

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  • On-Wafer S-Parameter and Waveform Measurements

    Publication Year: 1990, Page(s):128 - 138
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (502 KB)

    Rapid and accurate on-wafer measurements are essential to the affordable manufacture of large volumes of monolithic microwave integrated circuits (MMICs). The purposes of this paper are to compare published on-wafer scattering (S) parameter and waveform measurement methods, identify those that are most useful for particular applications, and discuss probable future directions. Methods discussed in... View full abstract»

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  • An Investigation of the Characteristics of Coplanar Waveguide and Terminations and Coplanar Waveguide Probes for On-Wafer Measurement Applications

    Publication Year: 1990, Page(s):139 - 151
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (660 KB)

    Both CPW and GCPW guiding structures have been discussed. Their modal and dispersive properties have been presented both quantitatively and visually. Examples of canonical discontinuities in CPW were presented and computations and measurements were compared. An entirely new examination of a typical on-wafer CPW probe was carried out. Both qualitative, and just as importantly, qualitatively informa... View full abstract»

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  • On-Wafer Characterization of CPW Step Discontinuities by a One-Port Method

    Publication Year: 1990, Page(s):152 - 160
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (292 KB)

    We have introduced a useful one-port method for characterizing a certain class of transmission line discontinuities. We have used it to characterize CPW steps and to obtain the susceptance of a circular aperture in a WR-28 waveguide. In the former case, the method yields the normalized discontinuity admittance and the propagation constant of the line that creates the discontinuity with a reference... View full abstract»

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  • A V-Band Wafer Probe

    Publication Year: 1990, Page(s):161 - 167
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (457 KB)

    In this paper the design and development of a V-band (50-75 GHz) probe is presented. The V-band probe must have a waveguide input, since commercially available coaxial cable has overmoding present above 65 GHz. Design goals: ¿ Frequency coverage 50-75 GHz ¿ Insertion loss better than 4 dB ¿ Correctable performance: (|S11| - |S21| ¿ 5dB) ¿ Footprint GSG (ground-signal-ground) ¿ Pitch availabi... View full abstract»

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  • ARFTG Executive Committee Members

    Publication Year: 1990, Page(s):177 - 178
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    Freely Available from IEEE
  • ARFTG Membership List as of February 1991

    Publication Year: 1990
    Request permission for commercial reuse | PDF file iconPDF (1112 KB)
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  • Table of contents

    Publication Year: 1990, Page(s): 1
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  • Survey of the articles

    Publication Year: 1990, Page(s):1 - 146
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  • Author index

    Publication Year: 1990, Page(s):1 - 165
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  • Table of contents

    Publication Year: 1990, Page(s):1 - 102
    Request permission for commercial reuse | PDF file iconPDF (2132 KB)
    Freely Available from IEEE