33rd ARFTG Conference Digest

June 1989

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Displaying Results 1 - 19 of 19
  • A Versatile 60 GHz Test Fixture

    Publication Year: 1989, Page(s):2 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (430 KB)

    A microstrip and co-planar waveguide test fixture which operates to 60 GHz is described and data is presented. The fixture does not require mounting blocks and can test a large variety of shapes and sizes of substrates. The fixture is useful for both scalar and vector measurement systems. View full abstract»

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  • A Microstrip Fixture Design for Power GaAs Fets

    Publication Year: 1989, Page(s):9 - 16
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (714 KB)

    Small signal,(low power) devices can very adequately be In the new microstrip design the chip is die attached directly to a gold plated copper or brass carrier which is in intimate thermal contact with a finned aluminum heat sink. This results in an "unblown" thermal resistance of 3.S??C/Watt and a "blown" Rth of 1,6OC/Watt. View full abstract»

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  • Calibration and Measurement of Ceramic Microstrip Circuits Using a Wafer Probe Station

    Publication Year: 1989, Page(s):17 - 26
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (412 KB)

    Two methods for calibration and measurement of microstrip circuits fabricated on 10 mil thick alumina will be presented. The first method may be used from 7 to 30 GHz. The second method is best suited for measurements below 10 GHz. The basic measurement configuration consisted of: 1) an automatic network analyzer with thru-reflect-line (TRL) [l] calibration capability; 2) wafer probe station and c... View full abstract»

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  • Time Domain Reflectometry Applied to MMIC Passive Component Modeling

    Publication Year: 1989, Page(s):27 - 36
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (341 KB)

    The time domain facilities of a network analyzer, combined with the tools of network synthesis, were recently used for experimental modeling of discontinuities in an S-parameter measurement set, so as to allow the instrument calibration directly to the ports of the device under test. The technique proved to be very useful in those cases where the discontinuities, that lie before the unknown device... View full abstract»

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  • Recent Trends in Microwave ATE Systems

    Publication Year: 1989, Page(s):37 - 45
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (644 KB)

    Programmable instruments and test systems have assumed a very important role in the last few years. While they are more expensive than their non-programmable counterparts, the cost is easily justified when the same test must be performed repeatedly. Often the most cost-effective approach to automated testing is to purchase a turnkey system from a vendor that supplies all or most of the critical co... View full abstract»

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  • Automated T/R Module Testing for the Spaceborne Imaging Radar C (SIR-C) Antenna Subsystem

    Publication Year: 1989, Page(s):46 - 55
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1858 KB)

    This paper describes automated transmit and receive test systems for measuring L- and C-band T/R modules used in the Spaceborne Imaging Radar C (SIR-C) antenna subsystem. The SIR-C antenna subsystem is an active phase array that includes 756 distributed L- and C-band T/R modules. Automated microwave testing of each T/R module is essential to reduce test time, to assemble a data base for module com... View full abstract»

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  • A Fully Automated, Single-Connection Tester for T/R Modules

    Publication Year: 1989, Page(s):56 - 66
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (675 KB)

    This paper was written from both a specific and general point of view. The discussion on the tester's instrument integration included an actual block diagram of the Sandia tester; this was done to provide a specific example of how the HP 85110A's access links can be utilized. On the other hand, the de-embedding discussion and analysis was carried out from a general point of view to be of maximum s... View full abstract»

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  • High-Throughput, Multi-Function, On-Wafer Test System

    Publication Year: 1989, Page(s):67 - 75
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (580 KB)

    analyzing and solving numerous hardware and software test issues, and it requires a thorough knowledge of the entire test environment. The most effective way to address the variety of issues is to create a partnership between several companies (hardware and software vendors and end users). In this spirit, ITT, HP, IMS and Cascade are working together to create an on-wafer RF test environment which... View full abstract»

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  • Dual Six-Port Reflectometer Systems Using Waveguide in the Frequency Range 18-50 GHz

    Publication Year: 1989, Page(s):76 - 88
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (656 KB)

    The development and evaluation of three dual six-port reflectometer systems, that use WR-42, WR-28 and WR-22 waveguide, is discussed; these cover the frequency range 18-50 GHz. The systems are capable of automated or semi-automated operation and will provide complex scattering parameter data for customer waveguide components, as well as effective efficiency data for power sensors. Some representat... View full abstract»

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  • Using a Load Tuner to Improve the Accuracy of Noise Characterization

    Publication Year: 1989, Page(s):89 - 107
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (649 KB)

    In principle, the noise figure of any microwave device is independent of load impedance; however, because of error sensitivities, a load tuner is required to achieve best noise measurement accuracy. This is because a high ouput reflection coefficient of a device under test can greatly increase the measurement receiver noise figure. This paper also presents a direct method of detecting and avoiding... View full abstract»

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  • General Purpose Automatic Microwave Measurements

    Publication Year: 1989, Page(s):108 - 111
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (206 KB)

    The general purpose features required for automatic microwave measurements will be described. These features include calibration, measurement, storage of test procedures and output of date. The calibration would have different features for specific analyzers, but the other features would be dependent only upon the controller used. In addition to storing the calibration, the ability to recall the c... View full abstract»

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  • Improved Waveguide Calibration of Vector Network Analyzers in WR15

    Publication Year: 1989, Page(s):112 - 132
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (918 KB)

    This paper discusses factors affecting the accuracy of Vector Network Analysis in millimeter waveguides. Among these are accuracy improvements provided by a new precision WR15 waveguide flange which maintains compatibility with the current UG-385/U flanges. The new wR15 waveguide flange design offers much improved performance in the frequency range of 50 to 75 GHz. Measurement results for flange r... View full abstract»

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  • Nonlinear Analysis and Simulation of a Fet Oscillator

    Publication Year: 1989, Page(s):133 - 141
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (213 KB)

    The aim of the paper is to present methods of nonlinear analysis and show how can they be applied to oscillator design. We start with a simple but general circuit and we reduce the circuit to generalized van der Pol equations. We then apply the method of averaging and that of harmonic balance . The methods allow us to estimate power and frequency of oscillations. We also show how those two can be ... View full abstract»

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  • Biographies

    Publication Year: 1989, Page(s): 145
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    Freely Available from IEEE
  • ARFTG Executive Committee Members

    Publication Year: 1989, Page(s):150 - 178
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1989, Page(s):1 - ii
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    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1989, Page(s):1 - 146
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2233 KB)

    Provides an overview of the technical articles and features presented. View full abstract»

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  • Author index

    Publication Year: 1989, Page(s):1 - 165
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1989, Page(s):1 - 102
    Request permission for commercial reuse | PDF file iconPDF (2132 KB)
    Freely Available from IEEE