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ARFTG Conference Digest-Winter, 32nd

Date 1-2 Dec. 1988

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Displaying Results 1 - 21 of 21
  • Automatic RF Techniques Group Agenda

    Publication Year: 1988, Page(s):iii - iv
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  • Principles of Nonlinear Active Device Modeling for Circuit Simulation

    Publication Year: 1988, Page(s):1 - 24
    Cited by:  Papers (35)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1179 KB)

    Principles of nonlinear active device modeling for circuit simulation in SPICE and harmonic balance programs are presented, motivated by an examination of three common problems of standard nonlinear GaAs MESFET models. The first problem is that simulations done in large signal analysis don't fit the measured imaginary parts of the Y-parameters versus bias. On the other hand, good fits to the measu... View full abstract»

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  • Design Methodologies for Nonlinear Circuit Simulation and Optimization

    Publication Year: 1988, Page(s):25 - 36
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (647 KB)

    This paper illustrates the methodology for designing a nonlinear circuit using state-of-the-art CAD tools applied to several examples of FET circuits. The parameters needed for characterization of the (nonlinear) FET are extracted using RoMPE, a parameter extraction program based on gradient optimizers which have been enhanced by adjoint sensitivity calculations to provide exact gradients. Measure... View full abstract»

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  • Nonlinear Amplifier and Mixer Measurements with a Vector Network Analyzer

    Publication Year: 1988, Page(s):37 - 48
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB)

    This paper describes an RF network analyzer, the HP 8753B, which has the ability to make nonlinear measurements of amplifiers and mixers. The measurements to be discussed are swept-frequency harmonic distortion, gain compression with power metal calibration, and swept-frequency conversion loss of a mixer. In addition, the block diagram of the network analyzer will be examined in order to explain h... View full abstract»

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  • Ion-Linear Measurements Using Six-Port Network Analyzer

    Publication Year: 1988, Page(s):49 - 58
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (340 KB)

    The six-port junction has already proven to be very useful in small-signal measurements of multi-port networks. The aim of this paper is to demonstrate that it can also be used to determine equivalent non-linear circuit models of selected components, through measurements only at the fundamental frequency. The examples taken are packaged PIN and varactor diodes. Small-signal measurements are presen... View full abstract»

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  • Developing a pulsed VNA, observations and experiences

    Publication Year: 1988, Page(s):59 - 61
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (160 KB)

    Over the past year a group of us at EIP Microwave have been converting a CW VNA into a system capable of measuring devices while in a pulsed RF mode. As we experimented with the CW VNA it became obvious that the problem was not with measuring a nonlinear device but with removing the nonlinearities form the CW measurement system. In this paper I will be discussing some of the tradeoffs which must b... View full abstract»

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  • Millimeter-Wave Noise-Figure Measurement Techniques & Results

    Publication Year: 1988, Page(s):62 - 76
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (363 KB)

    Noise-figure measurement techniques at millimeter-wave frequencies are discussed and example results are shown at V-band (50 to 75 GHz) using an automated instrumentation set-up to cover the full WR-15 waveguide bandwidth. The approach shown involves extending available microwave noise-figure measurement instruments into the millimeter-wave region by the use of broadband millimeter-wave down-conve... View full abstract»

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  • Automated Millimeter-Wave Systems to Support a WR-22 Band Testing Program

    Publication Year: 1988, Page(s):77 - 88
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (390 KB)

    Contractural requirements at this facility made it necessary to develop and evaluate millimeter-wave measurement systems for several parameters in WR-22 Band on an expedited basis. The problem was made severe by the lack of capability at the National Bureau of Standards for any parameter in this band. Working with other facilities having similar problems, a Measurement Assurance Program (MAP) was ... View full abstract»

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  • In-Fixture Calibration of an S-Parameter Measuring System by Means of Time Domain Reflectometry

    Publication Year: 1988, Page(s):89 - 97
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (388 KB)

    We present a technique which resorts to the time domain capabilities of a vector network analyzer and to the network synthesia tools, in order to perform an in-fixture calibration of the S-parameter measurement system directly to the ports of the device under test. The effects of the customer's non ideal fixtures can be removed without requiring the insertion of standard components or particular l... View full abstract»

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  • Determination of Some Nonlinear Transistor Model Parameters by Using Periodic Time Domain Measurements

    Publication Year: 1988, Page(s):98 - 108
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (452 KB)

    Accurate active device models are essential for reliable circuit simulation, necessary in the design of modern integrated circuits. The trend towards higher frequencies places an increasing demand on models with good accuracy in the UHF and microwave regions. Nonlinear high frequency models are needed in the computer aided design of communication subsystems, for example power amplifiers and mixers... View full abstract»

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  • An Automated Methodology for the Measurement and Non-Linear Model Parameter Extraction of GaAs MESFETs

    Publication Year: 1988, Page(s):109 - 117
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (525 KB)

    This paper presents an automated methodology for the measurement and non-linear modeling of GaAs MESFETS. The FET model extraction is based on the optimization of bias-dependent representations of DC-IV and linear equivalent circuit element values to small signal measurements of DC-IV and s-parameter data acquired over a wide range of operating bias, Vgs and Vds. The data acquisition is fully auto... View full abstract»

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  • Large-Signal MESFET Parameter Extraction Techniques

    Publication Year: 1988, Page(s):118 - 126
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (404 KB)

    Much publicity has surrounded the recent introduction of nonlinear microwave CAD tools into the marketplace. However, active device modeling remains as the major limitation of these tools. Furthermore, techniques that characterize nonlinear microwave devices in a systematic, accurate, and repeatable manner still must be developed in order to assure effective and proper use of the new CAD tools. Tw... View full abstract»

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  • Nonlinear Measurements of a Microwave Time-Varying Load

    Publication Year: 1988, Page(s):127 - 130
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (217 KB)

    When a high power microwave load is changing in time due to either microwave heating effect, or an environmental weathering effect, or a manual tuning of the load at high power level, or a manual sweeping of microwave power, the changing complex impedance (both magnitude and phase) is generally very difficult to monitored in real time. This paper reports an experimental result of the real-time non... View full abstract»

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  • Moving Reference Planes for On-Wafer Measurements Using The TRL Calibration Technique

    Publication Year: 1988, Page(s):131 - 140
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (584 KB)

    A method is presented for changing the positions of the reference planes for automatic network analyzer (ANA) measurements using a single set of calibration standards and the THRU-REFLECT-LINE (TRL) calibration procedure. The reference planes can be set from either the THRU or REFLECT calibration standard. However, if the THRU is used, the reference planes can also be set in various positions by c... View full abstract»

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  • Biographies

    Publication Year: 1988, Page(s):141 - 143
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  • ARFTG Executive Committee Members

    Publication Year: 1988, Page(s):147 - 148
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  • ARFTG Mailing List May 1988

    Publication Year: 1988, Page(s):149 - 171
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  • Table of contents

    Publication Year: 1988
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  • Survey of the articles

    Publication Year: 1988, Page(s):1 - 146
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  • Author index

    Publication Year: 1988, Page(s):1 - 165
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  • Table of contents

    Publication Year: 1988, Page(s):1 - 102
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    Freely Available from IEEE