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ARFTG Conference Digest-Spring, 31st

Date May 1988

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Displaying Results 1 - 15 of 15
  • Time-Domain Metrology, Past, Present and Future

    Publication Year: 1988 , Page(s): 3 - 8
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (332 KB)  

    The history of the use of time-domain metrology covers many decades of changing methods and analysis. This has gained momentum in the last 20 years with the advent of computer processing. The transformation algorithms from frequency to time have expanded to display information concerning wave distortion and reflection analysis. View full abstract»

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  • Going from Frequency to the Time Domain

    Publication Year: 1988 , Page(s): 9 - 17
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (385 KB)  

    This version of my 1988 May ARFTG presentation gives copies of the slides and some additional comments. View full abstract»

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  • A New Approach to Planar Structure Characterization Using Time Domain Techniques

    Publication Year: 1988 , Page(s): 19 - 28
    Cited by:  Papers (3)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (376 KB)  

    A new approach for planar transmission line characterization is presented. The approach is based on using time domain techniques for characterizing the coaxial to planar adapter probes used in the measurements. The characterization is achieved by developing an equivalent network model for the probes with the aid of a transient circuit analysis computer program. View full abstract»

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  • Time-Domain Method for Measuring Nonlinear Effects of Active Microwave Devices

    Publication Year: 1988 , Page(s): 29 - 34
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (274 KB)  

    The conventional way to measure the nonlinear behavior of active microwave devices is by using a spectrum analyzer. However, due to lack of phase information, the real waveform of the distorted signal cannot be obtained in this way. On the other hand, using an oscilloscope to show the waveform is an old technique for low fkequency signals. Until recently, this technique was not suitable for microwave frequencies. View full abstract»

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  • Error Corrected UHF Power Transistor Periodic Waveform Measurements

    Publication Year: 1988 , Page(s): 35 - 44
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (409 KB)  

    In the design of UHF and microwave solid state transmitters for cellular radio and other applications, one encounters difficulties because of the nonlinear power devices used. CAD packages for nonlinear design are available (SPICE etc.), but their usage is limited because of inaccurate nonlinear high frequency transistor models and the difficulties in determining their parameters including parasitics. In the optimization of for example transmitter efficiency one still has to rely largely on cut and try methods, inappropriate in monolithic circuits. View full abstract»

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  • Analysis of Multiconductor Transmission Lines

    Publication Year: 1988 , Page(s): 45 - 54
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (452 KB)  

    The objective of this paper is to outline a methodology for the computation of the response of a multiconductor transmission line terminated by linear networks. The lines are embedded in a multilayered lossy dielectric media and have arbitrary cross sections, but uniform along the length. To check the accuracy of the theoretical results, extensive experimental verification has been carried out. View full abstract»

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  • Fault Location Using a Scalar System

    Publication Year: 1988 , Page(s): 55 - 62
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (419 KB)  

    If scalar frequency domain measurements are to be used to generate time domain information, some method must be used t o encode phase information as received power. This is achieved in the comparison reflectometer Ill using a large, frequency invariant reference reflection which i s introduced at the reference plane. View full abstract»

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  • Time Scale Calibrations for Time-Domain Measurements

    Publication Year: 1988 , Page(s): 63 - 70
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (324 KB)  

    The time resolution of sampling oscilloscope. Time Domain Reflectometer (TDR), and Time Domain Transmission (TDT) measurements is approaching the low picoseconds. Time scale calibration and linearity verification with picosecond accuracy has become a crucial concem. Several methods for calibrating the time scale and for veriij?ing the sweep linearity of the PSP-1000, which has an intemal rise time of 5 picoseconds, will be described. View full abstract»

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  • Biographies

    Publication Year: 1988 , Page(s): 71 - 74
    Save to Project icon | Request Permissions | PDF file iconPDF (539 KB)  
    Freely Available from IEEE
  • ARFTG Executive Committee Members

    Publication Year: 1988 , Page(s): 79 - 80
    Save to Project icon | Request Permissions | PDF file iconPDF (71 KB)  
    Freely Available from IEEE
  • ARFTG Mailing List

    Publication Year: 1988 , Page(s): 81 - 102
    Save to Project icon | Request Permissions | PDF file iconPDF (1297 KB)  
    Freely Available from IEEE
  • Table of contents

    Publication Year: 1988 , Page(s): i - iii
    Save to Project icon | Request Permissions | PDF file iconPDF (69 KB)  
    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1988 , Page(s): 1 - 146
    Save to Project icon | Request Permissions | PDF file iconPDF (2233 KB)  
    Freely Available from IEEE
  • Author index

    Publication Year: 1988 , Page(s): 1 - 165
    Save to Project icon | Request Permissions | PDF file iconPDF (2384 KB)  
    Freely Available from IEEE
  • Table of contents

    Publication Year: 1988 , Page(s): 1 - 102
    Save to Project icon | Request Permissions | PDF file iconPDF (2132 KB)  
    Freely Available from IEEE