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30th ARFTG Conference Digest

Dec. 1987

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Displaying Results 1 - 18 of 18
  • Automatic RF Techniques Group Agenda

    Publication Year: 1987, Page(s):1 - 2
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (65 KB)

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  • MMAVERIC - A Calibration Technique for MIMICs

    Publication Year: 1987, Page(s):3 - 12
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (399 KB)

    MMAVERIC is applicable to both one- and two-port calibrations and yields significant information besides the usual error terms. For example, it determines one of the standards used in the calibration, and also furnishes the transmission line's loss and dispersion, which are rarely known accurately enough in MIMIC environments. Moreover, MMAVERIC calculates the uncertainties of the output quantitie... View full abstract»

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  • Low Frequency Extension of TSD Characterization

    Publication Year: 1987, Page(s):13 - 25
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  • Where Are My On-Wafer Reference Planes?

    Publication Year: 1987, Page(s):27 - 40
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (480 KB)

    In order to characterize the accuracy of on-wafer measurements, there is the need to understand microwave waver probe calibrations over a matrix of planar transmission line types, sizes, and substrate materials. One of the calibration issues which arise is the electrical lengths of the planar calibration standards relative to each other and relative to the device under test. In this paper, three t... View full abstract»

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  • "GaAs RF Wafer Qualification using RF Probes"

    Publication Year: 1987, Page(s):41 - 53
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (752 KB)

    Processing of Gallium Arsenide MMIC's is expensive due in part to the time required to RF-qualify wafers. Manufacturers who intend to compete in this relatively new market must reduce device costs. To reduce a MMIC's cost a major emphasis should be on early detection and discontinuation of wafers which will not yield devices meeting the MMIC's expected RF performance. On-wafer RF qualification can... View full abstract»

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  • "Comparison of Verification Kit Data with ARFTG Travelling Experiment Kit"

    Publication Year: 1987, Page(s):55 - 87
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  • Computer Aided Analysis of Microwave Systems

    Publication Year: 1987, Page(s):89 - 90
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (81 KB)

    Although the application of computer methods to the design of microwave systems is well known, in the existing art, it is perhaps also correct to say that the primary focus has been on the numerical processing of the appropriate design equations. It is the purpose of this paper to review and describe certain additions to a program [1], [2], which was developed some years ago at the Technical Unive... View full abstract»

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  • Automatic Noise Figure and S-Parameter Measurements

    Publication Year: 1987, Page(s):91 - 95
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (236 KB)

    The Hewlett Packard 8510B Automatic Network Analyzer has an additional feature available with the modified test set HP 8514B H01. This test set combines the network analyzer capability of the HP 8510B and the HP 8970B Noise Figure Meter for improved and convenient measurements of amplifiers. A software package written in BASIC 5.0 is included that will enhance operation through error correction an... View full abstract»

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  • Measurement of the Excess Noise of a One-Port Device

    Publication Year: 1987, Page(s):97 - 101
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (175 KB)

    In the past, excess noise measurements have been difficult to make and repeat. This has been due to test equipment performance limitations and uncertainties associated with these types of measurements. In this paper a new measurement technique is introduced that provides greater accuracy and improved repeatability. View full abstract»

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  • Automated Control of Down Converter Testing

    Publication Year: 1987, Page(s):103 - 111
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (802 KB)

    The physical layout of down converter circuit boards must be carefully planned when automated testing procedures are to be used. A 6 GHz microwave communications system down converter that was designed for automated testing will be described. The design objectives for automated testing and the board layouts to meet these requirements are discussed for the RF microstrip board and the surface mount ... View full abstract»

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  • Biographies

    Publication Year: 1987, Page(s):113 - 114
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    Freely Available from IEEE
  • Panel Discussion

    Publication Year: 1987, Page(s):115 - 123
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (210 KB)

    A panel session on "A LOOK TO THE FUTURE" was held to discuss requirements for large volume production of GAAS MMICs. Panel members were as listed below: Moderator: Dwayne Ragle, Texas Instruments, Dallas Members: M. Little, RADC M. Mezger, Raytheon G. Roberts, Hewlett Packard H. Stinehelfer, Raytheon and Made-It Associates Discussions by panel members and those in attendance were primarily direct... View full abstract»

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  • ARFTG Executive Committee Members

    Publication Year: 1987
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    Freely Available from IEEE
  • ARFTG Mailing List June 1987

    Publication Year: 1987, Page(s):139 - 170
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1987, Page(s):1 - iii
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    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1987, Page(s):1 - 146
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    Freely Available from IEEE
  • Author index

    Publication Year: 1987, Page(s):1 - 165
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1987, Page(s):1 - 102
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    Freely Available from IEEE