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26th ARFTG Conference Digest

5-6 Dec. 1985

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Displaying Results 1 - 20 of 20
  • Separation of Reflections for VSWR Measurements

    Publication Year: 1985, Page(s):18 - 31
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (736 KB)

    A method of determining VSWR is presented whereby the device under test is isolated from the measuring instrument, its output connectors and any necessary adapters. The isolation is accomplished with a length of transmission line and a simple mathematical reletionship is used to determine the VSWR of the D.U.T. independent of everything else. The paper defines the method, illustrates its accuracy,... View full abstract»

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  • Calculaticn and Use of Time Domain Response From Vector Network Analyzer Measurements

    Publication Year: 1985, Page(s):32 - 47
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1032 KB)

    The translation of frequency response measurements to the time domain has become more popular. In our engineering facility, the requests for time domain information have been increasing since its introduction. Engineers have become aware of the wealth of information that can be found in time domain plots. Implementation of time domain calculation is not difficult. Usually a 100-line program is all... View full abstract»

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  • Shared Resource Management Work Station for Microwave Engineering

    Publication Year: 1985, Page(s):48 - 53
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (347 KB)

    The Hewlett Packard Shared Resource Management System makes a natural environment for the computer-aided microwave engineering work station. The combination of microwave measurements, mirowave design, and microwave analysis as software elements form the basis for microwave engineering. This paper describes the recent software developments and projected enhancements to completely computerize the mi... View full abstract»

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  • CAE Interfaces with HP Automatic Network Analyzers

    Publication Year: 1985, Page(s):54 - 63
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (574 KB)

    Recent enhancements in microwave simulator programs, such as EEsof's Touchstone, now permit the designer to use measured data to refine theoretical models. These models can now reflect manufacturing variables and non-ideal elements which will greatly enhance the predictability of future designs. The measured data is supplied through direct interaction with the HP 8510 or 3577 automatic network ana... View full abstract»

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  • Software Reusability: A Key Concept for the Future

    Publication Year: 1985, Page(s): 64
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (57 KB)

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  • Using PCs As Controllers for Automated RF Measurements

    Publication Year: 1985, Page(s):65 - 70
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  • Programmable Microwave Toner System

    Publication Year: 1985, Page(s):71 - 81
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  • Software for Automated Spurious Signal Testing

    Publication Year: 1985, Page(s):82 - 94
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (571 KB)

    A program is described that performs automated testing of spurious signal emmissions from a satellite transponder. This program makes extensive use of the HP-8566 spectrum analyzer in acquiring spur data over a wide frequency range (typically 8 to 20 GHz). The data is compared to spur specification levels that vary both as a function of frequency and bandwidth resolution. All specification levels ... View full abstract»

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  • Design of Transmission Line Filters

    Publication Year: 1985, Page(s):95 - 101
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  • Stabilizing a Potentially Unstable Two-Port

    Publication Year: 1985, Page(s):102 - 113
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1005 KB)

    Criteria for evaluating the stability of a two-port (primarily a single active device) based on the [v,i] terminal parameter sets have been known for years [1]. More recently, Bodway [2] expressed the stability criteria in terms of the S-parameter matrix. Smith developed his chart and published a useful and thorough treatment of his work [3]. However, Smith's rectangular coordinate system origin d... View full abstract»

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  • Gunn Diode Pulse Thermal Resistance and Characterization Test System

    Publication Year: 1985, Page(s):114 - 134
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (951 KB)

    The thermal resistance test station provides a complete characterization of a GUNN diodes parameters. The output power, efficiency, frequency, power swept response, and thermal resistance measurements are made fast and accurately. The accuracy of present thermal resistance measurements of Ka-band GUNN diodes is ± 15%, better results are expected with the revised heating test. Measurement times of... View full abstract»

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  • A Study of Chip Fixture Characterization Using Varactors

    Publication Year: 1985, Page(s):135 - 144
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (598 KB)

    For every frequency there exists an optimum diode mean capacity,√ (CminCmax). To cover 2-18GHz in .5GHz steps would ideally need 33 diode transfer standards. This is clearly impractical but perhaps 4 diode chips having mean Cj's in a 1:2:4:8 ratio would be practical. View full abstract»

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  • Improved Millimeter Waveguide Flanges Improve VANA Performance

    Publication Year: 1985, Page(s):145 - 164
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1453 KB)

    Present millimeter waveguide flanges are major limitation when making precision measurements, or when attempting to build precision devices. New waveguide flange designs for all of the MMW bands which will mate with existing flanges but offer much improved performance are presented. This includes both rectangular and double ridged waveguide. Data showing the improvement is included. Flanges on exi... View full abstract»

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  • Reflection Residuals of Coaxial Connectors

    Publication Year: 1985, Page(s):165 - 168
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (411 KB)

    A series of measurements were made on the coaxial connector interface using test fixtures which allow each element to be examined separately. The measurements were made in the time domain in a way that eliminated calibration subtraction of seams and other reflection causing mechanisms. Data is given on seams, slots, chamfers and pin gaps. The contribution of various sized internal chamfers of the ... View full abstract»

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  • Instrument Test Cables Extend Measuring Ports of HP8510 VNA

    Publication Year: 1985, Page(s):169 - 179
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  • Membership List for Automatic RF Techniques Group as of March 1985

    Publication Year: 1985, Page(s):192 - 228
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1985, Page(s):i - 17
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    Freely Available from IEEE
  • Survey of the articles

    Publication Year: 1985, Page(s):1 - 146
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    Freely Available from IEEE
  • Author index

    Publication Year: 1985, Page(s):1 - 165
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    Freely Available from IEEE
  • Table of contents

    Publication Year: 1985, Page(s):1 - 102
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    Freely Available from IEEE