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ARFTG Conference Digest-Winter, 26th ARFTG

Date 5-6 Dec. 1985

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Displaying Results 1 - 20 of 20
  • Separation of Reflections for VSWR Measurements

    Page(s): 18 - 31
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    A method of determining VSWR is presented whereby the device under test is isolated from the measuring instrument, its output connectors and any necessary adapters. The isolation is accomplished with a length of transmission line and a simple mathematical reletionship is used to determine the VSWR of the D.U.T. independent of everything else. The paper defines the method, illustrates its accuracy, shows the correlation between different measuring systems, and presents rescits for a few difficult measurements made easily and accurately. View full abstract»

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  • Calculaticn and Use of Time Domain Response From Vector Network Analyzer Measurements

    Page(s): 32 - 47
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    The translation of frequency response measurements to the time domain has become more popular. In our engineering facility, the requests for time domain information have been increasing since its introduction. Engineers have become aware of the wealth of information that can be found in time domain plots. Implementation of time domain calculation is not difficult. Usually a 100-line program is all that is needed to calculate band limited impulse response using a Fast Fourier Transform (FFT). To accomplish this, some study of transform theory is involved, supported with information on sampling. An intuitive approach will be used to help in explaining the digital Fourier transform. Once the basic transform methods are understood, certain methods for conditioning data will be presented to improve the resolution and sensitivity of the transform. Once the basic FPT package has been developed, it can be used in the low pass mode to obtain a TDR type display. This is done by measuring the network in a certain way and inputting the data to the FFT so as to obtain a real-time function. The traditional TDR step response is obtained by using the FFT to compute the inverse Laplace transform after an appropriate data manipulation. View full abstract»

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  • Shared Resource Management Work Station for Microwave Engineering

    Page(s): 48 - 53
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    The Hewlett Packard Shared Resource Management System makes a natural environment for the computer-aided microwave engineering work station. The combination of microwave measurements, mirowave design, and microwave analysis as software elements form the basis for microwave engineering. This paper describes the recent software developments and projected enhancements to completely computerize the microwave measurement and design process. The structure of the software modules to perform specific tasks are integrated by the directory and sub-directory libraries of the SRM system. The self-configuring features of the software packages minimize the development cost of new software. View full abstract»

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  • CAE Interfaces with HP Automatic Network Analyzers

    Page(s): 54 - 63
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    Recent enhancements in microwave simulator programs, such as EEsof's Touchstone, now permit the designer to use measured data to refine theoretical models. These models can now reflect manufacturing variables and non-ideal elements which will greatly enhance the predictability of future designs. The measured data is supplied through direct interaction with the HP 8510 or 3577 automatic network analyzers. Many exciting applications result -- active device characterization, de-embedding and component measurement for use in upgrading model parasitics to reflect the real world, to name a few. This paper presents the design of a 2 to 6 Ghz four-stage feedback amplifier to illustrate the power of the microwave simulator/automatic network analyzer interface. View full abstract»

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  • Software for Automated Spurious Signal Testing

    Page(s): 82 - 94
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    A program is described that performs automated testing of spurious signal emmissions from a satellite transponder. This program makes extensive use of the HP-8566 spectrum analyzer in acquiring spur data over a wide frequency range (typically 8 to 20 GHz). The data is compared to spur specification levels that vary both as a function of frequency and bandwidth resolution. All specification levels and spectrum analyzer settings are supplied to the software from ASCII files, thus the program's operation can be readily modified as test requirements are changed. In addition, this approach eliminates operator intervention, hence errors, during execution of the program. View full abstract»

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  • Design of Transmission Line Filters

    Page(s): 95 - 101
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    First Page of the Article
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  • Stabilizing a Potentially Unstable Two-Port

    Page(s): 102 - 113
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    Criteria for evaluating the stability of a two-port (primarily a single active device) based on the [v,i] terminal parameter sets have been known for years [1]. More recently, Bodway [2] expressed the stability criteria in terms of the S-parameter matrix. Smith developed his chart and published a useful and thorough treatment of his work [3]. However, Smith's rectangular coordinate system origin does not coincide with the center of the chart. White [4] presents the equations for the general contours of the Smith Chart in a easily understood translated coordinate system with its origin at the center of the unity radius chart. This paper brings together the prior work [2,4] and presents a set of equations for finding the real (r and g) circles in the stable operation portion of the Smith Chart and the necessary and sufficient conditions for their existence. A seemingly complicated problem is reduced to simple algebra by a novel change of variables which also highly simplifies the complexity of the expressions manipulated to achieve the desired results. View full abstract»

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  • Gunn Diode Pulse Thermal Resistance and Characterization Test System

    Page(s): 114 - 134
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    The thermal resistance test station provides a complete characterization of a GUNN diodes parameters. The output power, efficiency, frequency, power swept response, and thermal resistance measurements are made fast and accurately. The accuracy of present thermal resistance measurements of Ka-band GUNN diodes is ± 15%, better results are expected with the revised heating test. Measurement times of 2-3 minutes rather than 2-3 hours are required making it a production suitable method. The system expandability becomes apparent at the wafer level. The current versus voltage characteristics at ambient temperature may be able in distinguish between good and bad processed GaAs wafers. This will provide an obvious cost savings because inadequate wafers are withheld during processing or before packaging. View full abstract»

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  • A Study of Chip Fixture Characterization Using Varactors

    Page(s): 135 - 144
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    For every frequency there exists an optimum diode mean capacity, ¿(CminCmax). To cover 2-18GHz in .5GHz steps would ideally need 33 diode transfer standards. This is clearly impractical but perhaps 4 diode chips having mean Cj's in a 1:2:4:8 ratio would be practical. View full abstract»

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  • Improved Millimeter Waveguide Flanges Improve VANA Performance

    Page(s): 145 - 164
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    Present millimeter waveguide flanges are major limitation when making precision measurements, or when attempting to build precision devices. New waveguide flange designs for all of the MMW bands which will mate with existing flanges but offer much improved performance are presented. This includes both rectangular and double ridged waveguide. Data showing the improvement is included. Flanges on existing equipment may be upgraded for improved performance. View full abstract»

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  • Reflection Residuals of Coaxial Connectors

    Page(s): 165 - 168
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (411 KB)  

    A series of measurements were made on the coaxial connector interface using test fixtures which allow each element to be examined separately. The measurements were made in the time domain in a way that eliminated calibration subtraction of seams and other reflection causing mechanisms. Data is given on seams, slots, chamfers and pin gaps. The contribution of various sized internal chamfers of the female contact is plotted and found to cause a significant reflection as the pin gap becomes very small. View full abstract»

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  • Membership List for Automatic RF Techniques Group as of March 1985

    Page(s): 192 - 228
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    Freely Available from IEEE
  • Table of contents

    Page(s): i - 17
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    Freely Available from IEEE
  • Survey of the articles

    Page(s): 1 - 146
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    Freely Available from IEEE
  • Author index

    Page(s): 1 - 165
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    Freely Available from IEEE
  • Table of contents

    Page(s): 1 - 102
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    Freely Available from IEEE