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Date 18-21 Sept. 2006

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Displaying Results 1 - 25 of 182
  • 2006 IEEE AUTOTESTCON IEEE Systems Readiness Technology Conference PROCEEDINGS Integrating Maintenance into the DoD Net-Centric Environment

    Page(s): nil1
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  • Copyright page

    Page(s): nil2
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  • Table of contents

    Page(s): i - ix
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  • Welcome to IEEE Autotestcon 2006!

    Page(s): x
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  • From the Technical Chair

    Page(s): xi
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  • Keynote speaker

    Page(s): xii
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (456 KB)  

    Provides an abstract of the keynote presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings. View full abstract»

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  • Luncheon Speaker

    Page(s): xiii - xiv
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    Provides an abstract of the luncheon presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings. View full abstract»

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  • IEEE Autotestcon Frank Mcginnis Professional Achievement Award

    Page(s): xv
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  • IEEE Autotestcon Frank McGinnis Professional Achievement Award

    Page(s): xvi
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  • John Slattery Professional Achievement Award

    Page(s): xvii
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  • Best Paper awards

    Page(s): xviii
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  • [Breaker page]

    Page(s): xix
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  • [Breaker page]

    Page(s): xx
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  • Call for papers

    Page(s): xxi
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  • Autotestcon 2006 Conference Committee

    Page(s): xxii - xxiii
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  • Autotestcon Board of Directors

    Page(s): xxiv
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  • Autotestcon 2006 Sponsors

    Page(s): xxv
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  • Technical Program Tracks & Sessions

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  • Technical sessions

    Page(s): 1
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  • [Breaker page]

    Page(s): 2
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  • Destructive Test Facility Relies on VXI Fiber Optic Network for Synchronous Data Acquisition

    Page(s): 4 - 7
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (4284 KB) |  | HTML iconHTML  

    VXIbus is an ideal standard for instrumentation associated with developmental test systems used by industrial applications due to its adaptability, accuracy, and responsiveness. This application note is one such example of a VXI solution for a worldwide leader in commercial property and risk management that operates a destructive test facility to analyze the results of disasters predominantly caused by fire. The company implemented a re-configurable 2,400 channel test system based on KineticSystems' VXI modules that used a fiber optic ring to synchronize multiple chassis and multiple channels. Technical details of the VXI implementation and results will be discussed. View full abstract»

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  • Enhancing VXIBUS Systems Through the Power of Ethernet

    Page(s): 8 - 12
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (5121 KB) |  | HTML iconHTML  

    The VXIbus architecture has proven to be an ideal solution for high channel count applications that require extremely tight synchronization between multiple instruments and mainframes. Additionally, VXIbus products have historically integrated quite easily with other open-instrumentation platforms and communication buses such as IEEE-488, IEEE-1394 and USB 2.0, providing a very stable platform, independent of rapidly changing PC bus architectures. The recent introduction of LAN-based instrumentation based upon the LXI standard provides yet another opportunity for VXIbus devices to leverage advances in interface technology. High-speed Ethernet serial communication presents many benefits across a wide range of applications, and leveraging these benefits continues to make VXIbus solutions viable well into the 21st century. View full abstract»

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  • Modular Interconnect Packaging for Scaleable Systems(MIPSS) for Automatic Test Equipment - IEEE-P1693

    Page(s): 13 - 18
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (6631 KB) |  | HTML iconHTML  

    This standard defines the electrical and mechanical specifications of a modular interconnect packaging system design for automatic test system (ATS). It specifically describes a building block approach based upon the integration of three elements: (1) the outer enclosure and the inner Eurocard standard mechanical chassis that forms the mechanical structure of the building block with alignment features to mate with other enclosures (building blocks); (2) revised IEEE-1155 Standard for VME extensions for Instrumentation (VXI), that adds serial bus control to the backplane, a new pluggable virtual power source, and extends the VXI module length to directly couple with rear connectors of the IEEE-P1505 receiver fixture interface (RFI) standard; and (3) the segmentation of the IEEE-P1505 RFI receiver framework to match size of the basic building block while also meeting the intent of the IEEE-P1505.1 common test interface (CTI) pin map standard. View full abstract»

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  • [Breaker page]

    Page(s): 19
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