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AUTOTESTCON '96, Test Technology and Commercialization. Conference Record

Date 16-19 Sept. 1996

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Displaying Results 1 - 25 of 76
  • Conference Record. AUTOTESTCON '96

    Publication Year: 1996
    Request permission for commercial reuse | PDF file iconPDF (765 KB)
    Freely Available from IEEE
  • Author/Co-author index

    Publication Year: 1996
    Request permission for commercial reuse | PDF file iconPDF (91 KB)
    Freely Available from IEEE
  • A view of the AI-ESTATE architecture and the ABBET(TM) upper layers

    Publication Year: 1996, Page(s):213 - 217
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (324 KB)

    Work in the IEEE Standards Coordinating Committee 20 (SCC20) to develop standards for A Broad Based Environment for Test (ABBET) and for supporting intelligent diagnostics in test environments (AI-ESTATE) is coming to fruition. The ABBET subcommittee is preparing to ballot the “full-use” version of its architecture standard (P1226), and the AI-ESTATE subcommittee has published its arch... View full abstract»

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  • Implementing reusable, instrument independent test programs in the factory

    Publication Year: 1996, Page(s):206 - 212
    Cited by:  Papers (2)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (592 KB)

    Development of computer programs that control test sequences on automatic test equipment (ATE) is costly and time consuming. Test programs are usually written by specifying the instruments to be used in the ATE and the sequence of the setup and measurement parameters for these instruments. Reuse of test program software on other ATE is usually not possible without rewriting, revalidating and re-re... View full abstract»

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  • Rapid prototyping using the LabVIEW environment

    Publication Year: 1996, Page(s):235 - 238
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    The paper discusses the use of LabVIEW, a commercial Virtual Instrument software package, within the systems development lifecycle. In particular, the application of LabVIEW to the rapid prototyping stage of systems development is explored. This aspect of the systems development process concerns the ability to produce a representative emulation of a proposed system or subsystem at an early stage i... View full abstract»

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  • Implementing the IEEE A Broad Based Environment for Test (ABBET) standard using an object technology-based approach

    Publication Year: 1996, Page(s):199 - 205
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (452 KB)

    In May 1996, the evolved IEEE ABBET standard was approved to be balloted as a full-use standard replacing the 1226-1993 trial use version that was focused on an Ada Language centric-implementation approach. A major change in the revised ABBET Standard was its reflection of a hardware/software implementation-independent approach to the creation of test programs. No particular methodology and/or tec... View full abstract»

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  • Test program set software development using the rational Booch method

    Publication Year: 1996, Page(s):173 - 178
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB)

    This paper discusses the use of the Booch object-oriented design method to model Test Program Set (TPS) software. A brief discussion of the Booch method will be provided. A discussion on how to define and create TPS objects is included. The discussion on modeling includes the analysis and design of the TPS architecture using the TPS objects. This paper also discusses implementing objects using Ada... View full abstract»

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  • Interoperability standard in sensor-based processing applications

    Publication Year: 1996, Page(s):380 - 383
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (324 KB)

    This paper discusses emerging core technologies and philosophies that will enable systems to communicate with each other, understand what is said within the proper context, and respond properly with conclusions and/or operations thereby promoting interoperability. The efforts described are currently underway supporting the IEEE P1391 initiative to define an approach for standardizing interfaces as... View full abstract»

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  • Running BASIC test programs in a C/ATLAS test environment

    Publication Year: 1996, Page(s):231 - 234
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (328 KB)

    The Swedish Air Force has several hundred BASIC test programs which are executed in old HP-1000 based ATE systems-some more than 20 years old. We have now developed a method to move those old BASIC test programs into the modern JAS-ATE system-with virtually no changes to the Test Program Package (TPP) and the Interface Test Adapter (ITA). We have developed a BASIC interpreter that produces the sam... View full abstract»

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  • ABBET and industry-how to apply ABBET principles and make money doing it!

    Publication Year: 1996, Page(s):194 - 198
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (444 KB)

    A Broad Based Environment for Test (ABBET) is a set of related standards being developed by industry and government experts to produce several results in the rapidly changing product test context. Specifically, the goals of the ABBET standards are to: (1) Reduce test program development time. (2) Increase test program accuracy and effectiveness. (3) Provide reusability of test code from one test s... View full abstract»

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  • Test program structure and development on the Common Test Station

    Publication Year: 1996, Page(s):86 - 94
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (624 KB)

    As with all Automated Test Equipment (ATE), providing the ability to efficiently develop high-quality test programs has been a primary goal during the development of the Common Test Station (CTS). The CTS is currently under development by HMSC and was recently identified by the US Department of Defense Automated Test System (ATS) Executive Agent as a designated ATS family. The modularity and confi... View full abstract»

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  • Application scenarios for AI-ESTATE services

    Publication Year: 1996, Page(s):68 - 72
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (380 KB)

    One of the principal objectives of the P1232 AI-ESTATE standardization project is the development of a standard set of services to be provided by a diagnostic reasoner within a test environment. Recently, considerable progress has been made defining an initial set of services for P1232.2 AI-ESTATE Service specification. In this paper, we provide several possible scenarios under which such services... View full abstract»

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  • Evaluation of three ATE test environments

    Publication Year: 1996, Page(s):166 - 172
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (644 KB)

    It is often difficult to assess the positive and negative issues facing the use of a particular software test environment in a given application. Much of the literature is swayed by the use of each environment by a single application. This paper will provide detailed information on ARGOSystems' evaluation of three popular ATE test environments: the Ada based environment for testing (ABET), the TYX... View full abstract»

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  • ATS PGM office: past, present and future

    Publication Year: 1996, Page(s):375 - 379
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (800 KB)

    This paper provides background on the Air Force Automatic Test Systems Product Group Manager's (ATS PGM) office, a discussion of its current status and activities, and a glimpse of its projected future. The intent of this paper is to provide an overall impression of the factors and philosophies that have directed the PGM's growth View full abstract»

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  • A system for the test of a space electronics device

    Publication Year: 1996, Page(s):46 - 55
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1180 KB)

    This paper describes the design of a test system that is used to test a power conditioning unit that has been developed for a new generation of commercial telecommunications satellite. The paper details how the various problems associated with test of this space electronics product were solved, end how by mixing both manual and automatic test capabilities within the test system design. It has been... View full abstract»

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  • Guidelines for successful implementation of infrared thermography for repairing electronic circuit cards

    Publication Year: 1996, Page(s):410 - 417
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (732 KB)

    While the Air Force has not accepted infrared (IR) thermography as a universal diagnostic tool for repairing circuit cards, the personnel at Hill AFB have found IR thermography to be an effective diagnostic tool to an increasing variety of applications, particularly in the current environment of downsizing, where even the maintenance of the traditional automatic Testing Equipment (ATE) has become ... View full abstract»

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  • Making the bridge between two worlds-post-processing LASAR data into a test language

    Publication Year: 1996, Page(s):223 - 230
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (392 KB)

    If is accepted by everybody that the TPS development challenge can only be won with the intensive use of TPS software tools. One of the most proved and used tools in digital TPS Development are the digital simulators (like LASAR and HITS). However, their use and integration with ATEs and other tools is difficult and requires lot of workaround. This paper places a focus on possible solutions and de... View full abstract»

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  • Units and scaling factors in general purpose ATS applications

    Publication Year: 1996, Page(s):244 - 253
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (820 KB)

    This paper provides the results of a study on the approaches to units (i.e. volts, ohms, amperes) and scaling factors (i.e. hertz (Hz) versus kilo-hertz (KHz) versus megahertz (MWz)) in general purpose automatic test system (ATS) applications. It is hoped that the results of this study will provide an awareness of units and scaling factor issues and concerns among commercial-off-the-shelf (COTS) a... View full abstract»

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  • Comparing and contrasting IEEE ATLAS 95 and ARINC 626-3

    Publication Year: 1996, Page(s):186 - 193
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (588 KB)

    The two major users of the ATLAS test language are the US Department of Defense and its NATO allies and the commercial airlines. Each of these communities use different standards to define and maintain their languages. The DOD and NATO use IEEE ATLAS 716 while the commercial airlines use ARINC Standard 626. Current events present an opportunity to converge these two standards or, at a minimum, pre... View full abstract»

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  • The Common Test Station (CTS) for guided weapons testing

    Publication Year: 1996, Page(s):77 - 85
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (644 KB)

    The Common Test Station (CTS) was originally designated as a member of the CASS DoD Automatic Test Equipment (ATE) family. This designation was a result of expected commonality of design architecture and equipment selection between CASS and the CTS. The Navy's CASS was originally targeted for a broad range of avionics systems in support of Naval aviation and other shipboard electronic systems. As ... View full abstract»

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  • Integrated diagnostics: confusion and solutions

    Publication Year: 1996, Page(s):436 - 440
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (476 KB)

    This paper discusses the definition of integrated Diagnostics (ID), and some of the common misconceptions of what constitutes ID. As ID represents a powerful method for ensuring that weapon systems are developed with diagnostics capabilities that are both comprehensive end cost effective several proposals for enhancing and extending its application are proposed View full abstract»

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  • An overview of IEEE P1232 AI-ESTATE. The standard for intelligent reasoning based systems test and diagnosis arrives

    Publication Year: 1996, Page(s):61 - 67
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    Artificial Intelligence (AI) technology promises to ease cost and improve the supportability of new and existing systems. Many products are available which use AI techniques to assist in test and diagnosis of system malfunctions. The US military is currently deploying support equipment and primary systems which make use of AI in meeting their mission requirements. However, the lack of standard int... View full abstract»

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  • Evaluating the performance of DSP-based RF/microwave measurement systems

    Publication Year: 1996, Page(s):261 - 265
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (372 KB)

    Technology is available to support the use of digital signal processing (DSP) techniques in the measurement of RF/microwave signals. The integration of a front-end RF/microwave receiver, analog-to-digital converter (ADC), and DSP provides a versatile, inexpensive, small, and lightweight system solution. This DSP-based system has, for example, the potential to perform the function of an RF frequenc... View full abstract»

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  • An open architecture COTS tester with intelligent diagnostics

    Publication Year: 1996, Page(s):483 - 488
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (532 KB)

    This paper describes a new Business Model for ATE companies-combining commercial off-the-shed open architecture standards with advanced technology to capture business for both military and commercial customers View full abstract»

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  • Register size vs. fault coverage in modified circular built-in self-test

    Publication Year: 1996, Page(s):23 - 28
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (560 KB)

    Improvement in the effectiveness of circular built-in self-test (BIST) in practical applications is achieved by adding a shift register in the BIST chain with additional logic for deterministic pattern generation. The designer can increase the size of this additional register called the target register, to increase the cycle length of the state transition graph of the circuit in the BIST mode of o... View full abstract»

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