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Advanced Technologies, Intelligent Vision, 1995. AT'95

6-6 Oct. 1995

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  • AT'95: Advanced Technologies Intelligent Vision

    Publication Year: 1995
    Request permission for commercial reuse | PDF file iconPDF (42 KB)
    Freely Available from IEEE
  • From sensors to microsystems: a case study

    Publication Year: 1995, Page(s):27 - 28
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (140 KB)

    The purpose of the paper is to describe the development of an optical interface used in the system REGISTRON of BOBST for the alignment of paper in a rotary printing press. This alignment is based on the detection of small repairs preprinted on the paper. This miniaturisation and the cost optimisation leads to a system based on two ASICs: one ASIC including 8 photodiodes integrated with their tran... View full abstract»

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  • From electronic photography to seeing chips-the future of image sensing

    Publication Year: 1995, Page(s):3 - 9
    Cited by:  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (820 KB)

    Thanks to the advances of semiconductor technology, solid state image sensors with impressive properties can be realized today: CCDs with 26 million pixels are commercially available. Pixel size has been reduced to 5×5 μm2 and less. This enables one to integrate electronic circuitry with each pixel, providing added functionality for custom photo-ASICs and smart image sensors: s... View full abstract»

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  • Multisensorial cameras in industrial quality inspection

    Publication Year: 1995, Page(s):23 - 26
    Cited by:  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (380 KB)

    Industrial surface inspection can greatly be improved if not just greylevel intensity, but also colour and local height can be imaged at once. The multi-sensorial camera produces for every pixel not a scalar attribute, but a complete feature vector with many, preferably uncorrelated components. A typical example is the “3D&Colour” line scan camera which generates a feature vector (... View full abstract»

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  • Smart CCD image sensors for optical metrology and machine vision

    Publication Year: 1995, Page(s):11 - 14
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (352 KB)

    Two types of CCD image sensors are described. The first sensor is a two-dimensional, synchronous detector/demodulator (“Lock-In CCD”) of spatially modulated light fields for applications in heterodyne interferometry and time-of-flight range imaging. Simultaneous measurements of amplitude, phase and background level are carried out at each pixel site. This is made possible by the princi... View full abstract»

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  • Active pixels for image sensing with programmable, high dynamic range

    Publication Year: 1995, Page(s):15 - 18
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (364 KB)

    A novel silicon solid-state photodetector pixel structure is presented which exhibits an enhanced dynamic range. This is achieved by subtraction an offset current from the pixel's photosite while retaining a linear readout characteristic. The offset current can be programmed by a specific programming voltage. This novel circuit is suitable for conventional photodiode sensor architectures as well a... View full abstract»

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  • High precision optical measurement with smart photosensors

    Publication Year: 1995, Page(s):19 - 21
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (444 KB)

    The smart integrating photosensor is described. A scale (linear or circular code and incremental track) is displayed on a specially designed detector by means of a simple telecentric imaging system. The arrangement is also realised in the reflective illumination mode. The code track detector is capable of 20-bit resolution. If a bit on the scale has length X, a length of 220 times X can therefore ... View full abstract»

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