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AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record

Date 8-10 Aug. 1995

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Displaying Results 1 - 25 of 86
  • Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century'

    Publication Year: 1995
    Request permission for commercial reuse | PDF file iconPDF (448 KB)
    Freely Available from IEEE
  • Author index

    Publication Year: 1995
    Request permission for commercial reuse | PDF file iconPDF (82 KB)
    Freely Available from IEEE
  • Value-engineering change proposals for the consolidated automated support system (CASS): issues and solutions in reengineering

    Publication Year: 1995, Page(s):1 - 13
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1119 KB)

    The Consolidated Automated Support System (CASS) is a US Department of Defense (DoD) standard family of advanced-technology automated test systems (ATS) developed for the US Navy by prime contractor Lockheed Martin. It uses commercial-off-the-shelf (COTS) assets, including a Digital Equipment Corporation central processing unit (CPU) and a digital test unit (DTU) supplied by Teradyne, Inc. In Dece... View full abstract»

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  • CASS design for supportability: as technology grows

    Publication Year: 1995, Page(s):14 - 16
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (319 KB)

    CASS (the Consolidated Automated Support System) is committed to maintaining full functionality and supportability throughout its 20 year life cycle, while retaining the capabilities of Commercial Off The Shelf (COTS) equipment. This paper describes options evaluated as two major COTS (the CASS computer (CPU) and Digital Test Unit (DTU)) systems used within CASS reach the end of their commercial p... View full abstract»

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  • Understanding the domain of the Army's CTS

    Publication Year: 1995, Page(s):17 - 30
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1197 KB)

    This paper describes the development of the elements of the domain of the Army's Contact Test Set (CTS). This work is motivated by the anticipated proliferation of applications of the CTS, the testing classifications, and the roles of Test Measurement and Diagnostic Equipment (TMDE) and Software Engineering Directorate (SED). This work includes both the top-down development of the domain, followin... View full abstract»

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  • IFTE verify probe capability

    Publication Year: 1995, Page(s):31 - 34
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (435 KB)

    The Integrated Family of Test Equipment (IFTE) has acquired a verify probe capability for the Base Shop Test Facility/Commercial Equivalent Equipment (BSTF/CEE) similar to the probe capability of the General-purpose Electronic Test Station-1000B (GETS-1000B). Verify probe is a system software routine with which the operator can confirm suspected fault locations. Verify probe is used with Test Prog... View full abstract»

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  • The evolution of ABBET

    Publication Year: 1995, Page(s):35 - 40
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (425 KB)

    This paper illuminates the principles and status of the ABBET (A Broad Based Environment for Test) family of IEEE standards, 1226.x, by exploring the history of the standards effort. View full abstract»

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  • ABBET architecture: baseline for test systems of the future

    Publication Year: 1995, Page(s):41 - 50
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (956 KB)

    The ABBET (A Broad Based Environment for Test) standards initiative provides a standard environment for future test systems. As a broad based standard, ABBET considers test application environments from design verification through field test and technologies from product description methods through instrument description and control. The ABBET standards group is comprised of representatives from c... View full abstract»

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  • A view of the ABBET upper layers

    Publication Year: 1995, Page(s):51 - 56
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (641 KB)

    Currently, the IEEE Std 1226-1993 (ABBET) is undergoing significant revision in preparation for its release as a "full-use" standard. Much of this work is motivated by a need to define the interfaces between the various "layers" of the current architecture and prepare a road map for implementing those interfaces. To date, little work has been-done on the upper layers of ABBET, yet it is believed t... View full abstract»

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  • The IEEE ABBET lower layers definition and status

    Publication Year: 1995, Page(s):57 - 65
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (568 KB)

    The automatic test community is continually challenged with long term supportability problems. These problems occur across all branches of the military as well as within each service. Among these problems are the lack of hardware and software compatibility, the lack of hardware and software interoperability, the difficulties encountered with Test Program Set (TPS) rehosting, the replacement of obs... View full abstract»

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  • Correspondence between VXI plug&play specifications and ABBET standards

    Publication Year: 1995, Page(s):66 - 68
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (263 KB)

    The emerging software standards for the next generation Automatic Test System (ATS) are providing the test community with a wide range of implementation choices. Specifically, accomplishments by the IEEE ABBET (A Broad Based Environment for Test) standards initiative and the VXI plug&play Alliance are rapidly providing the thread for truly interoperable and reconfigurable standard ATS. This paper ... View full abstract»

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  • Principles of a broad based environment for test (ABBET) demonstration (PAD): "ABBET in action"

    Publication Year: 1995, Page(s):69 - 74
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (715 KB)

    ABBET (A Broad Based Environment for Test) is planned to be free of any dependencies-hardware and/or software. This implementation independent concept while desirable appeared difficult to achieve until an investigation of the potential of Object Technology was conducted. The use of Object Technology seemed to address test program cost issues in the commercial sector where savings of 20-40% and si... View full abstract»

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  • Benefits of a TPS virtual layer

    Publication Year: 1995, Page(s):75 - 79
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (387 KB)

    To minimize the life cycle cost of a program, it is essential that re-hosting of TPSs be minimized, or the TPS be designed in such a way as to minimize ATS rehosting efforts. One possible way of doing this is by software abstraction. This abstraction allows the TPSs to be designed so that the ATE can be modified without impact on the TPS source code. This software abstraction is called a TPS virtu... View full abstract»

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  • VHDL implementations of fast IC testing tools

    Publication Year: 1995, Page(s):80 - 83
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (387 KB)

    Switch-level faults, as opposed to traditional gate-level faults, can more accurately model physical failures found in an integrated circuit. However, one problem with switch-level fault simulation is that of long simulation times. This paper addresses this problem by performing fast approximate switch-level fault simulation. Results show one order of magnitude of complexity speed-up as compared t... View full abstract»

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  • Issues involved in reuse library for design for test

    Publication Year: 1995, Page(s):84 - 93
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (877 KB)

    Test has historically represented a significant amount of the cost associated with systems. Advancements in design automation and the application of concurrent engineering has allowed test to be considered when designing systems. The early inclusion of test into the design cycle and the reuse of design incorporating test information reduces the total time and cost associated with system developmen... View full abstract»

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  • An ATLAS integrated development environment

    Publication Year: 1995, Page(s):94 - 100
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (800 KB)

    This paper describes the design and characteristics of an ATLAS integrated development environment (IDE) that currently supports test program set (TPS) development and maintenance for a portable test set. All of the raw editing and windowing capabilities are provided by a commercially available extensible code editor. Some special ATLAS enhancement features such as chroma-coding, template expansio... View full abstract»

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  • Automated functional test generation

    Publication Year: 1995, Page(s):101 - 107
    Cited by:  Papers (6)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (647 KB)

    The paper describes a new process for automating and controlling functional software testing, using a model of an application's desired behavior. The technology, known as Model Reference Technology, or MRT, is described. The process used to build a model and generate tests is explained and examples given. Samples of the results obtained by Cadence Design Systems using production applications of th... View full abstract»

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  • Re-hosting test program sets effectively and affordably

    Publication Year: 1995, Page(s):108 - 111
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (306 KB)

    This paper describes an innovative process for re-hosting test program sets from an existing tester for which they were originally prepared to operate on another tester. The process greatly reduces the time and cost usually required for offloading a test program set while retaining most of the original design and interface hardware. View full abstract»

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  • Computer upgrade and TPS re-host of military ATE with commercial-off-the-shelf (COTS) hardware and software

    Publication Year: 1995, Page(s):112 - 117
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (693 KB)

    As the inventory of existing weapons systems ages, without the prospect of many newer systems becoming operational soon, the DOD is faced with the issue of what to do with ATE approaching obsolescence. Typically two paths are considered, viz, total replacement with new Commercial Off The Shelf (COTS) ATE (including redevelopment of all test programs) or updating the current ATE's computer and re-h... View full abstract»

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  • Lessons learned on a large scale ATS software development project

    Publication Year: 1995, Page(s):118 - 126
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (856 KB)

    This paper provides an overview of some of the lessons learned, both positive and negative, from developing a highly complex software environment for a general purpose automated test system (ATS). It is hoped that these lessons learned can be applied to similar software development efforts in the future. Although some of these experiences are ATS application specific, numerous lessons could be app... View full abstract»

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  • Detecting intermittent test failures with the aid of environmental stress screening

    Publication Year: 1995, Page(s):127 - 134
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (653 KB)

    Confirmation of avionics field failures by a depot maintenance organization is often performed on Automatic Test Equipment (ATE) which is designed to certify a module as "fit to fly". When the ATE does not confirm the failure, the field failure is generally regarded to have been an intermittent event. For any application, these are a major cost driver, and for safety-critical applications, intermi... View full abstract»

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  • A manager's guide to TPS first article acceptance testing

    Publication Year: 1995, Page(s):135 - 142
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (822 KB)

    This paper offers insight into the challenges of First Article Testing (FAT) for TPSs. While FAT represents a successful culmination of extensive development effort, this success comes only with advanced planning and buyer/seller cooperation. This paper emphasizes FAT challenges and their resolution. The paper is written against a real-world contract backdrop, and the problems encountered were rea... View full abstract»

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  • Meeting the management challenges of TPS development in the 21st century

    Publication Year: 1995, Page(s):143 - 150
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (865 KB)

    In addition to the technical challenges of developing Test Program Sets (TPS) for use on CASS, there is the added management challenge of achieving this within aggressive budgets and schedules. Combining this ever demanding need-with the emerging DoD initiatives to have standard 'processes' (ways of doing business) and accurate cost data at the process task level (activity based costing) to suppor... View full abstract»

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  • Lessons learned using boundary scan and built-in test for integration and diagnostic test of the U.S. Navy joint standoff weapon

    Publication Year: 1995, Page(s):151 - 159
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (919 KB)

    The integration of the various hardware and software components of a newly developed system can be a difficult and time consuming task. In many cases, the factory test equipment and test programs are not normally available for testing of the first few printed wiring boards (PWBs)/subsystems/systems built. The time taken to diagnose encountered problems can mean the difference between meeting or fa... View full abstract»

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  • A comparison of conventional and inference model based TPS development processes

    Publication Year: 1995, Page(s):160 - 168
    Cited by:  Papers (3)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1064 KB)

    Many claims have been made regarding the benefits of applying inference model (i.e., dependency model) technology to the development of Test Program Sets. However, although this technology has been around for over a decade, it does not enjoy widespread acceptance in the TPS community. If inference model technology is ever to realize its full potential, the barriers to its incorporation into the TP... View full abstract»

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