Annual Reliability and Maintainability Symposium 1995 Proceedings

16-19 Jan. 1995

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  • Annual Reliability and Maintainability Symposium 1995 Proceedings

    Publication Year: 1995
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    Freely Available from IEEE
  • The P.K. McElroy Award for Best Paper

    Publication Year: 1995
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  • Author index

    Publication Year: 1995
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    Freely Available from IEEE
  • Cumulatlive Indexes

    Publication Year: 1995
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  • Consideration of component failure mechanisms in the reliability assessment of electronic equipment-addressing the constant failure rate assumption

    Publication Year: 1995, Page(s):54 - 59
    Cited by:  Papers (2)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (484 KB)

    The assumption of the constant failure rate can lead to excessive costs and nonoptimum design decisions. As this paper shows, simply summing constant failure rates can produce results which are highly inaccurate. Highly inaccurate results can introduce significant error in decisions made in everything from product design to logistics support requirements such as spares and maintainers. The authors... View full abstract»

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  • A double-event testing approach to improve network-element availability

    Publication Year: 1995, Page(s):296 - 302
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (512 KB)

    To meet the demand for high availability in telecommunications networks, it is necessary to ensure sufficient availability of the elements that compose the network, e.g. switching systems. Two attributes key to a network element's availability are reliability and maintainability. Reliability is the element's ability to detect faults and perform automatic actions to minimize the occurrence and impa... View full abstract»

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  • Beyond the qualified manufacturer list (QML)

    Publication Year: 1995, Page(s):362 - 369
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (600 KB)

    The Microcircuit Application Handbook, MIL-HDBK-179(ER), dated 25 October 1993 is becoming the Army guide for the determination of suitability of a microcircuit packaging approach and the selection criteria for microcircuit suppliers and part types. This document is based on recommendations provided by the DoD Defense Science Board. A multiple entry matrix lists all possible DoD equipment environm... View full abstract»

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  • Reliability-based structural design

    Publication Year: 1995, Page(s):207 - 212
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (536 KB)

    This paper presents the use of state-of-the-art reliability techniques to develop efficient structural design guidelines for civil engineering structures in a manner that includes overall structural system effects. Probabilistic design is done by explicitly accounting for the uncertainties in the different variables and their influence on structural performance. This approach has been used to deve... View full abstract»

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  • Reliability of mobile phones

    Publication Year: 1995, Page(s):33 - 38
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (544 KB)

    The paper addresses reliability aspects of mobile phones, also known as cellular phones. Mobile phones have been in use for about a decade. Early models were low in technology and usage was limited. However, the technology of phones has been improved significantly during the last few years. The market demand has been increasing in a similar manner over the last few years. It is anticipated to incr... View full abstract»

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  • Electronic box-level reliability assessment using computer modeling and simulation

    Publication Year: 1995, Page(s):49 - 53
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1080 KB)

    Modern commercial and military systems rely heavily on large quantities of electronics with high packaging densities. System readiness is strongly dependent upon the reliability of each electronic subsystem, its associate circuit card assemblies and individual components. Currently missing in electronic system reliability assessment is computer simulation from the circuit card level upward in the ... View full abstract»

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  • Built-in-test adequacy-evaluation methodology for an air-vehicle system

    Publication Year: 1995, Page(s):290 - 295
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    Rapid improvement in built-in-test (BIT) system capability is probably one of the most important activities in an air-vehicle system development test and evaluation program. An effective BIT adequacy evaluation methodology can accomplish this. The methodology must provide the development tester BIT parameters that serve as indicators of air-vehicle BIT system performance. Deficiencies that are pin... View full abstract»

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  • Using R&M analysis to calculate economic risk in the process industries

    Publication Year: 1995, Page(s):356 - 361
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (592 KB)

    A systematic procedure for quantifying the financial risk of repetitive hardware failures is used to analyze the reliability of plant electrical systems and process units. The procedure uses component failure rates and the financial impact to calculate annual risk premiums, which approximate the insurance premiums required to compensate for financial losses caused by the component failures. Basic ... View full abstract»

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  • Verifying a new design using Bayes' theorem

    Publication Year: 1995, Page(s):200 - 206
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (432 KB)

    This paper addresses how to verify the expected reliability of a missile system and its subsystems using Bayes' theorem. During the early development phase, a number of design engineering tests are performed to establish the operational characteristics and robustness of a new design. Actual test data is not used for reliability assessment purposes until the system is close to full-scale production... View full abstract»

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  • Simultaneous development and qualification in the fast-changing 3.5" hard-disk-drive technology

    Publication Year: 1995, Page(s):27 - 32
    Cited by:  Papers (1)  |  Patents (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (636 KB)

    This paper presents an enhanced approach to utilizing test as an aid to maturing the 3.5" hard-disk drive (HDD) to improve time to market. It focuses on designing tests that provide maximum feedback to the design function on the designs “goodness or maturity” and the strategy focuses on consolidating different tests done by different groups (including selective customer testing) to max... View full abstract»

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  • A framework for reliability modeling of electronics

    Publication Year: 1995, Page(s):144 - 151
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (940 KB)

    The physics-of-failure approach (PoF) to design, reliability modeling, testing and screening of single chip IC packages and multichip modules (MCM), has been developed. The PoF approach is implemented using CADMP-II software. The PoF approach is based on the identification of potential failure mechanisms and failure sites for the product. Failure mechanisms are described by models which characteri... View full abstract»

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  • A nonexponential approach to availability modeling

    Publication Year: 1995, Page(s):253 - 260
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (760 KB)

    Most current state-of-the-art availability models are based on continuous-time Markov chains. This involves restrictive assumption about the probability distribution for both failure times and repair times being exponential. In many situations, the exponential distribution is not applicable for failure times and/or repair times. A general approach for calculating instantaneous availability is pres... View full abstract»

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  • 6000 meters of reliability

    Publication Year: 1995, Page(s):510 - 514
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (360 KB)

    Development, prototype build and sea test of an advanced 24 bit digital acoustic array, in a 2" diameter package, was completed in only 18 months. The array features much improved and simplified handling since 100 meter section takes considerably less volume when on the deck of a ship, tows with less tension and weighs less than half of existing 3" diameter arrays. Reliability and availability pre... View full abstract»

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  • A graphical model-based reliability estimation tool and failure mode and effects simulator

    Publication Year: 1995, Page(s):74 - 81
    Cited by:  Papers (4)  |  Patents (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (600 KB)

    A new graphical reliability estimation tool, Reliability Performance Module (RPM), is described. RPM combines the features of a powerful reliability tool, Reliability Estimation System Testbed (REST), developed at NASA Langley, with the convenient graphical modelling and simulation capabilities of an off-the-shelf commercial software package, Block Oriented Network Simulator (BONeS), from the Alta... View full abstract»

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  • A verification tool to measure software in critical systems

    Publication Year: 1995, Page(s):315 - 320
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (500 KB)

    Previously, software metrics have been established to evaluate the software development process throughout the software life cycle, and have been effective in helping to determine how a software design is progressing. These metrics are used to uncover favorable and unfavorable design trends and identify potential problems and deficiencies early in the development process to reduce costly redesign ... View full abstract»

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  • A modified bathtub curve with latent failures

    Publication Year: 1995, Page(s):217 - 222
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (412 KB)

    Burn-in and stress screening are becoming increasingly popular in the commercial electronics industry as customers become increasingly sensitive to failures occurring in the useful life of a product or system. For example, thermal stress screening (TSS) is an assembly-level electronics manufacturing process that evolved from the burn-in processes used in NASA and DoD programs. While burn-in subjec... View full abstract»

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  • Reliability of electro-hydraulic steering systems aboard commercial ships

    Publication Year: 1995, Page(s):44 - 48
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (392 KB)

    For the purposes of this study, a generic electrohydraulic steering system of standard components similar to those found on currently sailing commercial tankers and freighters is considered. A fault tree analysis methodology is used to evaluate the proposed design and then employed to identify components or subsystems that have the most potential for improving overall system reliability. Design mo... View full abstract»

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  • Understanding and solving the real reliability assurance problems

    Publication Year: 1995, Page(s):159 - 161
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB)

    To be competitive, manufacturers need to know how things fail, as well as how things work. The combination of physics-of-failure and best practices is an approach to the development of cost-effective reliable products that focuses on how things can fail through an understanding of the root causes of failure. The goal is to answer the following questions: (1) how can the supplier measure how well h... View full abstract»

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  • Innovations in military spares analysis

    Publication Year: 1995, Page(s):397 - 401
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (376 KB)

    The US Defense Secretary hopes to reap savings in the order of $30 billion with procurement reform. He admits that one of his toughest challenges will be to nurture and sustain America's technological edge, which he sees as a necessity in a period of declining force levels, during a time of declining budgets. With these thoughts in mind Science Applications International Corporation (SAIC) took th... View full abstract»

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  • Dependency modeling of an avionics power-supply for testability analysis

    Publication Year: 1995, Page(s):283 - 289
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (820 KB)

    Dependency modeling (DM) can be used to provide an accurate measure of the testability attributes of items ranging in complexity from individual circuit-cards to complete weapon systems. This paper presents a method for performing testability analysis on an avionics power supply (PS) using DM. The level of indenture used in the DM process is assessed, and limitations of the model are described. Th... View full abstract»

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  • Translating user diagnostics, reliability, and maintainability needs into specifications

    Publication Year: 1995, Page(s):106 - 111
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (588 KB)

    Military users state the requirements for a new system in the Operational Requirements Document. They do so using the measures with which they manage the systems. These measures are not suitable for specifying the system's needed performance to a contractor. A translation, therefore, from user needs to specifications is needed. A methodology for this translation process for reliability, maintainab... View full abstract»

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