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[1992] Proceedings International Conference on Wafer Scale Integration

22-24 Jan. 1992

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Displaying Results 1 - 25 of 41
  • Keynote address: critical issues in wafer scale design

    Publication Year: 1992
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (15 KB)

    Summary form only given. The author discusses critical barriers to the further developments of wafer-scale design technology and its successful transfer to industry. These include: 1) difficulty in obtaining multireticle stepper lithography for sub 2-micron fabrication, (2) limitation to two levels of metal and resulting problems in power and clock distribution, (3) excessive turnaround time becau... View full abstract»

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  • The impact of the declining cost per MIPS

    Publication Year: 1992
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (12 KB)

    Summary form only given, as follows. The personal computer (PC) cost per million instructions per second (MIPS) is projected to decline to less than $100.00 per MIPS by 1995, and to a few dollars per MIPS by 2010. This cost reduction will be achieved through very large scale integration, multi-chip modules, and operating voltage reduction. Cheap computing power will allow many problems currently h... View full abstract»

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  • Proceedings. International Conference on Wafer Scale Integration (Cat. No.92CH3088-2)

    Publication Year: 1992
    Request permission for commercial reuse | PDF file iconPDF (66 KB)
    Freely Available from IEEE
  • Optimal group diagnosis procedures for VLSI/WSI array architectures

    Publication Year: 1992, Page(s):352 - 361
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (404 KB)

    Addresses the problem of partitioning VLSI/WSI (wafer scale integration) array architectures into disjoint maximal diagnosis blocks (MDBs) and finding an optical group diagnosis policy for testing and locating faulty elements (modules) in these MDBs. The optimization criterion is to minimize the accumulated diagnosis cost in deriving a feasible reconfiguration solution. The technique for partition... View full abstract»

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  • Efficient fault diagnosis of switches in wafer arrays

    Publication Year: 1992, Page(s):341 - 351
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (456 KB)

    Considers an abstract model of a wafer-scale system where functional modules are connected by connections which run over wiring channels. Programmable switches are located at the junction of these wiring channels. The proposed technique is based on recursively finding progressive fault-free paths across regions of the wafer whose boundaries have been diagnosed to be fault-free. It is shown that su... View full abstract»

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  • Critical area analysis

    Publication Year: 1992, Page(s):281 - 290
    Cited by:  Papers (13)  |  Patents (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (496 KB)

    The critical area is the region on an integrated circuit where the occurrence of a catastrophic spot defect will cause a functional circuit fault. The author describes how to efficiently compute detailed critical areas with the VLASIC Monte Carlo yield simulator. Methods for reducing the computational cost are described, along with some application examples. An SRAM cell failure caused by an extra... View full abstract»

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  • Fault tolerant tree using adaptive operational redundancy

    Publication Year: 1992, Page(s):85 - 94
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (268 KB)

    The authors describe the architecture of fault-tolerant trees. This fault tolerant architecture is based on a majority decision of redundant operations. It shows that low-area redundancy and dynamic fault recovery are possible. This fault tolerant architecture is suitable for binary trees. Two basic types of fault tolerant architecture are presented: clustered architecture by a node-oriented appro... View full abstract»

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  • An enhanced one-step C-testable design of two-dimensional iterative logic arrays

    Publication Year: 1992, Page(s):331 - 340
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    The authors present an improved approach to one-step C-testability of orthogonal two-dimensional iterative logic arrays. This is an improvement of the approach of W. Huang and F. Lombardi (1988) and H. Elhuni et al. (1986). A group of sufficient conditions to test two-dimensional iterative logic arrays with a constant number of test vectors independent of the array size (C-testability) is stated. ... View full abstract»

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  • Design and evaluation of wafer scale clock distribution

    Publication Year: 1992, Page(s):168 - 175
    Cited by:  Papers (11)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (368 KB)

    The authors describe a computer program which is used for simulating the performance of large wafer scale integration clock distribution networks, made up of both passive transmission line elements and active buffers. The theoretical basis for the model is briefly reviewed. The authors present several example networks for 4-in wafers, comparing the AC performances as a function of power dissipatio... View full abstract»

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  • High-level design of algorithm-driven architectures: The testability and diagnosability issue

    Publication Year: 1992, Page(s):271 - 280
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (516 KB)

    Testability and diagnosability represent a mandatory step to be evaluated in the design of complex WSI (wafer scale integration) architectures before restructuring of the architecture to overcome defects can be performed. The authors propose a solution to such issues based on the analysis of testability and diagnosability of the data flow graph derived from the algorithm that has to be implemented... View full abstract»

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  • A rule-based reconfiguration of WSI processor arrays

    Publication Year: 1992, Page(s):75 - 84
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (520 KB)

    The authors propose a formal approach to the reconfiguration of WSI (wafer scale integration) processor arrays. They propose to set up assignment rules based on the available interconnection resources. The assignment rules determine the assignment of a logical cell to a fault-free cell, such that logical cells are always connected through the available interconnection resources. The advantage of t... View full abstract»

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  • On self-testing of array systems

    Publication Year: 1992, Page(s):321 - 330
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (464 KB)

    A novel self-testing method which is applicable to one- and two-dimensional arrays is presented. This method is based on a criterion referred to as GI (group identical) testability. GI testability is an extension and modification of PI (partition identical) testability and it is used to simplify response verification for self-testing. It is shown that the response verifier for PI testability does ... View full abstract»

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  • Design and analysis of defect tolerant hierarchical sorting networks

    Publication Year: 1992, Page(s):240 - 249
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (484 KB)

    A novel hierarchical defect-tolerant sorting network is presented. The design achieves a balance in area-time cost between the odd-even transposition sort and the bitonic sort. It uses less hardware than a single-level odd-even transposition sorter and reduces the wire complexity of the bitonic sorter in VLSI or WSI (wafer scale integration) implementation. The optimal number of levels in the hier... View full abstract»

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  • Repairing power shorts in WSI circuits using infra-red imaging and laser cutting

    Publication Year: 1992, Page(s):165 - 167
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (104 KB)

    An efficient approach to implement a defect tolerant power distribution network suitable for WSI (wafer scale integration) circuits was proposed by M. W. Yung and M. J. Little (1991). The design of the power distribution network has been incorporated into the wafer-scale circuit wafers designed for Hughes 3-D Computer. Experimental results from test structures and practical experience in locating ... View full abstract»

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  • WSI architecture of FFT

    Publication Year: 1992, Page(s):45 - 54
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (308 KB)

    The authors propose a parallel FFT (fast Fourier transform) architecture based on an N-point FFT decomposition. Performance evaluation is performed with respect to the total area of the architecture. It is clear that the architecture is simple and the execution time is faster than that of a single FFT chip. The authors also propose a fault tolerance interconnection for the FFT butterfly n... View full abstract»

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  • A wafer scale optical bus interconnection prototype

    Publication Year: 1992, Page(s):182 - 191
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB)

    Prototypes of a wafer wide optical bus interconnection technology are described. By optically coupling subsystems on the wafer, faults normally found in electrically based interconnection topologies are avoided. Wire buses are more prone to errors than waveguides due to the nature of the material involved and requirements for connectivity. This is accomplished through the incorporation of a planar... View full abstract»

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  • DFGs for synthesis of alternative architectures: Node activation synthesis

    Publication Year: 1992, Page(s):261 - 270
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (384 KB)

    High-level synthesis systems are becoming one of the necessary standards in digital design of complex architectures since they allow a high degree of freedom to the designers in exploring and evaluating architectural alternatives. This possibility is particularly interesting when complex VLSI/WSI (wafer scale integration) architectures are considered. Synthesis and evaluation of alternative archit... View full abstract»

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  • Wafer scale integration of one- and two-dimensional linear arrays

    Publication Year: 1992, Page(s):65 - 74
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (400 KB)

    Practical methods are presented for constructing one- and two-dimensional linear arrays. it is shown that, with a given probability, a square two-dimensional array can be constructed from most of the live cells on an n×n cell wafer using wires of length θ(√log n) and channels of width O(√log n). By applying recent research result... View full abstract»

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  • Yield optimization of redundant multimegabit RAM's using the center-satellite model

    Publication Year: 1992, Page(s):200 - 209
    Cited by:  Papers (3)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (372 KB)

    Redundant wafer scale memories are analyzed using the center satellite model to determine the optimal redundancy organization for yield enhancement. It is suggested that the degree of redundancy for a memory module be determined depending on its distance from the periphery, as defect density increases as one moves toward the periphery. New analytical expressions for the yield of memory modules wit... View full abstract»

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  • Bit serial fault tolerant architectures for convolution and polynomial evaluation

    Publication Year: 1992, Page(s):310 - 319
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB)

    The authors present three distinct serial-input serial-output architectures: two for the computation of discrete convolution (bit-sliced and polyphase convolvers) and one for polynomial evaluation (polynomiers). These devices operate in serial fixed point natural arithmetic. All architectures are characterized by a bit-sliced structure that makes possible easy design and testing. The regular, unif... View full abstract»

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  • Applying WSI methods to emitter de-interleaving

    Publication Year: 1992, Page(s):232 - 239
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (336 KB)

    Examines the application of WSI (wafer scale integration) to a computationally intensive problem-emitter de-interleaving. In the context of an electronic battlefield, both friendly and hostile RF emitters must be identified and sorted. This formidable task is expected to require a computer power of 7 Gb/s. A reconfigurable WSI technique quilted logic array is used to map this problem onto a wafer.... View full abstract»

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  • Process characterization and yield assessment in hybrid wafer scale integration

    Publication Year: 1992, Page(s):155 - 164
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (556 KB)

    Functional yield in the hybrid approach to wafer scale integration (HWSI) is a product of the individual component yields in the HWSI assembly, including the contributions from the interconnection substrate and the pretested ICs mounted onto the substrate, and of the assembly processes employed to construct the HWSI circuit or module. The authors report process characterization and yield results f... View full abstract»

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  • HASP-1002: a hybrid wafer scale associative string processor

    Publication Year: 1992, Page(s):124 - 133
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (476 KB)

    The authors introduce and evaluate a multichip module produced in hybrid-WSI (wafer scale integration) technology embedded for real-time signal and data processing. The benefits and potential of the technologies of the HASP-1002 hybrid-WSI device are shown. The combination of improvements of the size-performance and the cost-performance trade-offs underlines the vitality of hybrid-WSI technologies... View full abstract»

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  • Lithographic manufacturing techniques for wafer scale integration

    Publication Year: 1992, Page(s):4 - 13
    Cited by:  Papers (2)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (496 KB)

    A methodology utilizing a mix-and-match approach of optical 1×lithography and e-beam lithography currently used at TRW for WSI (wafer scale integration) technologies is discussed. Field stitching techniques, design considerations, and macrocell grouping techniques which enhance field stitching capability and impact design rules are described for this mix and match e-beam and 1×optical ... View full abstract»

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  • A WSI rapid prototyping architecture

    Publication Year: 1992, Page(s):35 - 44
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (456 KB)

    Describes a generalized architecture, the WSI architecture for rapid prototyping (WARP), which attempts to map a large class of algorithms with only two types of processing cells. These are (a) the universal multiply-subtract-add cell (UMSA), and (b) the universal nonlinear cell (UNL). Using these cells, the authors have mapped a radix-8 FFT (fast Fourier transform) algorithm to a wafer architectu... View full abstract»

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