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Defect and Fault Tolerance on VLSI Systems, 1991. Proceedings., 1991 International Workshop on

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Defect and Fault Tolerance on VLSI Systems, 1991. Proceedings., 1991 International Workshop on

Date 18-20 Nov. 1991

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Title History

Proceedings. 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems (Cat. No.91TH0395-4)

Some results and open problems concerning memory reconfiguration under clustered fault models

On the testability of realistic bridging faults

Physical boundaries of performance: the interconnection perspective

State-of-the-art of the wafer scale ELSA project

Physical fault injection: a suitable method for the evaluation of functional test efficiency

A new approach to modeling the performance of a class of fault tolerant VLSI/WSI systems based on multiple-level redundancy

Fast search algorithms for reconfiguration problems

A model for enhanced manufacturability of defect tolerant integrated circuits

A bottom-up methodology to characterize delay faults

Improved yield models for fault-tolerant random-access memory chips

Hex-repair: a new approach to hexagonal array reconfiguration

Reconfiguration of time-multiplexed binary trees for satellite communication

Key issues in the design of a fault-tolerant core avionics computer based on the mesh architecture

Overview of fault handling for the chaos router

Current-mode techniques for analog VLSI: technology and defect tolerance issues

Knowledge-based electrical monitor approach using very large array yield structures to delineate defects during process development and production yield improvement

Neural networks on silicon: the mapping of hardware faults onto behavioral errors

Concurrent error diagnosis in mesh array architectures based on overlapping H-processes

Applications of a mechanistic yield model for MOSIC chips

Reliability evaluation of FUSS and other reconfiguration schemes

Efficient and optimal fault-to-spare assignments in doubly fault tolerant arrays

Array architecture for ATG with 100% fault coverage

Circuit-level modeling of spot defects

Almost sure diagnosis of almost every good element

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