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20-23 Sept. 1993

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Displaying Results 1 - 25 of 95
  • AUTOTESTCON 93

    Publication Year: 1993
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    Freely Available from IEEE
  • IEEE P1149.5 standard module test and maintenance bus

    Publication Year: 1993, Page(s):143 - 149
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB)

    The IEEE P1149.5 Standard Module Test and Maintenance Bus (MTM-Bus) standardizes a serial, backplane test and maintenance bus that can be used to integrate modules into testable and maintainable subsystems. This paper discusses the protocol, some implementation details and the status of the standard and related standards activities View full abstract»

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  • ABBET's support for the full product life cycle

    Publication Year: 1993, Page(s):429 - 436
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (456 KB)

    The ABBET (A Broad Based Environment for Test) standard is being developed by the ABBET Subcommittee of the IEEE SCC20 Standards Coordinating Committee. ABBET's goal is to establish a standard environment that supports product test related needs over the full product life cycle. The ABBET environment will be based on an open framework that manages a test knowledge repository and physical test reso... View full abstract»

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  • Integration of neural network technology in automated fault diagnosis equipment

    Publication Year: 1993, Page(s):397 - 401
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB)

    The use of artificial neural networks (ANNs) for identification of pump faults is described. A description of how ANN technology can be incorporated into automated test equipment (ATE) is also presented View full abstract»

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  • Workflow management combined with diagnostic and repair expert system tools for maintenance operations

    Publication Year: 1993, Page(s):367 - 375
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (652 KB)

    The authors present an integrated framework for effective management of maintenance operations that addresses two key problems: the shortage of resources; and the performance differences between the individual available resources, and specifically, the human resources. Software tools are proposed for these two problems. W-6 assists in improved cost-effective utilization of the available resources.... View full abstract»

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  • Advanced fuel accessories test system (AFATS)

    Publication Year: 1993, Page(s):635 - 638
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (404 KB)

    AFATS (Advanced Fuel Accessories Test System) is a computer integrated test system (CITS) which will replace aging 1950 vintage Depot Support Equipment at Kelly Air Force Base, Texas. It will be capable of testing 262 different aircraft and engine fuel accessories. AFATS exploits leading edge technologies to achieve superior performance and workload flexibility. AFATS requirements, systems approac... View full abstract»

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  • Object oriented CASE: The TPS life cycle evolution

    Publication Year: 1993, Page(s):49 - 53
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (256 KB)

    The emergence of object-oriented (O-O) test program set (TPS) development is the result of increased demands for productivity, quality, and portability. While rewards of O-O software development are substantial they are not accomplished by simply switching to an O-O language. O-O software development necessitates an evolution of the traditional Test Program Set (TPS) life cycle. Developers must le... View full abstract»

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  • Manufacturing defects testing of a multi-chip-module using IEEE 1149.1 boundary scan test and embedded built-in test software

    Publication Year: 1993, Page(s):151 - 156
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (360 KB)

    This paper describes the use of boundary scan based tests and embedded built in test (BIT) software in the manufacturing defects testing of a 100 MHz, high density, surface mount multi-chip-module, parallel processing computer View full abstract»

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  • Making a tester out of a heterogeneous collection of instruments

    Publication Year: 1993, Page(s):601 - 603
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (216 KB)

    VXI has provided the test equipment user with a versatile hardware platform that supports a wide variety of instrumentation. Many automatic test equipment (ATE) users have discovered that a collection of instruments does not comprise a test system that is suitable for production testing. What is missing is the software glue that orchestrates and controls the testing process. This paper presents th... View full abstract»

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  • The product test information model

    Publication Year: 1993, Page(s):437 - 439
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (324 KB)

    This paper discusses the need for a product test information model (PGTIM) and the related tools/methodologies that will bridge the gap between the design and the test program development phases fo the product creation process. The paper explains the approach that PTIM plans to use, based on the EXPRESS-G form of notation, that should allow for PTIM's broad use and also facilitate its affiliation ... View full abstract»

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  • ATAG: A tri-service initiative

    Publication Year: 1993, Page(s):405 - 410
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (388 KB)

    For the past three years, the ABBET (A Broad Based Environment for Test, formerly ABET, Ada Based Environment for Test) Technical Advisory Group (ATAG) has been working to expedite the evolution of the IEEE ABBET set of standards, P1226.x. This paper provides an update on ABBET and describes ATAG accomplishments and plans as it prepares to enter a new phase: serving as a tri-service vehicle to hel... View full abstract»

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  • AEGIS ORTS - The first and future ultimate integrated diagnostic system

    Publication Year: 1993, Page(s):377 - 382
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (404 KB)

    This paper discusses the implementation of a structured built-in-test system designed over 20 years ago to support availability of the AEGIS Weapon System. Many of the techniques and concepts which it used are applicable today, forming a basis upon which to apply current technology advances and integrated diagnostic concepts. The evolving result, given in the spirit of OPNAV Instruction 4700.7J - ... View full abstract»

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  • A generalized algorithm for bounding fault detection probabilities in combinational circuits

    Publication Year: 1993, Page(s):683 - 689
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (444 KB)

    With the ease of incorporating a linear feedback shift register (LFSR) within a chip for generating pseudo-random sequence of binary vectors, random pattern testing is popular as a built-in self test (BIST) scheme for combinational circuits for stuck at faults. A combinational circuit is said to be random pattern testable if a certain fault coverage can be achieved with certain confidence when a r... View full abstract»

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  • Virtual instruments for use in test systems development

    Publication Year: 1993, Page(s):639 - 642
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (324 KB)

    SYTRONICS employed the use of modeled instruments during the recent development of the Engine Monitoring and Control System (EMCS) completed for the US Navy in which the engine was modeled and simulated for the purposes of developing, testing, and verifying the Engine Test Cell system. This simulated engine provided a virtual instrument for use with the development of the Test Cell. The Test Cell ... View full abstract»

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  • Navy and joint service missile testing-A management update

    Publication Year: 1993, Page(s):559 - 565
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (528 KB)

    The shrinking defense budget is applying increasing pressure on the armed services for standardizing ATE. While standardization of ATE for avionics and ground systems is well established, the world of missile systems is still proliferate with Special Test Equipment. If newer missile system designs are to survive, there needs to be a concentrated effort for commonality of test equipment. Process ac... View full abstract»

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  • Improvement of test program set development and customer compliance using the interactive test step generator (ITSG)

    Publication Year: 1993, Page(s):55 - 60
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (412 KB)

    Due to increasing complexity of test programs, changing customer requirements, high test program development costs, and expertise needed to generate test programs, the interactive test step generator (ITSG) philosophy was created to attack these problematic areas and increase development efficiency. ITSG is actually a collection of software tools that allow a test program set developer to create, ... View full abstract»

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  • Reconstruction of trace map of a circuit card assembly based on fuzzy pattern recognition

    Publication Year: 1993, Page(s):157 - 163
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (548 KB)

    In this paper, a methodology of adaptive pattern recognition based on adaptive hierarchical fuzzy rules is used to reconstruct the trace map of a printed circuit board. In order to implement this concept, hierarchical structures are discussed. Based on this, a frame-work of adaptive hierarchical fuzzy rule based pattern recognition is presented, where the different features of a pattern are deline... View full abstract»

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  • Time stress measurement device use for on-board diagnostic support

    Publication Year: 1993, Page(s):251 - 258
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (528 KB)

    Time stress measurement systems have been developed to support fielded and emerging systems. This electronic link between the system and maintainer is non-instrusive to the prime mission equipment and provides information as to the cause of failure events in flight. This paper provides a brief background into several programs where TSMD system integration is in progress in mature systems such as t... View full abstract»

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  • Cooking with VXI

    Publication Year: 1993, Page(s):605 - 608
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (188 KB)

    With the advent and success of VXI technology and product support, the question is no longer “to VXI or not to VXI”, but rather how to VXI? Designing test systems with VXI seems simple enough. It's just “plug and chug”, right? This paper examines system development using VXI and offers a recipe for successful system development using VXI, whether the user is commercial or G... View full abstract»

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  • Smart as the standard for test in the commercial air transport industry

    Publication Year: 1993, Page(s):533 - 537
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB)

    This paper traces the historic evolution of ARINC software and hardware interface standards comprising SMART (Standard Modular Avionics Repair and Test) from 1984 through the present. Nearly a decade after several airlines conceived the idea, SMART is being used by avionics, aircraft and ATE manufacturers for development of ATE systems and test programs. SMART contains a set of software tools whic... View full abstract»

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  • Hardware design-for-test process improvements and resulting testability tool requirements

    Publication Year: 1993, Page(s):443 - 449
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (452 KB)

    Testability engineering has relevance in all program phases, at all levels of a weapon system, and for all levels of diagnostics and maintenance. Engineering tool development for testability, however, lags far behind tools for operational hardware and software development. This paper addresses the fundamental elements of the testability process in the hardware design phase and recommends attribute... View full abstract»

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  • Description of the consolidated automated support system (CASS) electro-optical subsystem (EOSS)

    Publication Year: 1993, Page(s):101 - 104
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (264 KB)

    The CASS EOSS has been developed to provide the Navy an automated test capability for electrooptical (EO) sensors. Previous test methods required highly skilled personnel who are completely familiar with a particular EO sensor. These manual test methods required extensive test times and often involved subjective acceptance criteria. The CASS EOSS provides capability for evaluation of visible and i... View full abstract»

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  • FPGA implementation and testing of VXIbus interface hardware

    Publication Year: 1993, Page(s):707 - 713
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (412 KB)

    This paper reports on evaluation of field programmable gate array (FPGA) technology applied to the implementation and testing of VXIbus interface circuitry. Using FPGAs, all the logic of a general purpose breadboard (Hewlett-Packard E1399A) can be fit into a single low-cost gate array package (Xilinx XC4000) with attendant savings in board space. Functions implemented using the FPGA include: (1) d... View full abstract»

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  • Progress in specifying the ABBET ATLAS-level test procedure and operator/file interfaces

    Publication Year: 1993, Page(s):411 - 418
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (572 KB)

    ABBET (A Broad Band Environment for Test) CAP (Common Ada Packages) (ATLAS-Level Test Procedure Interface) provide the best features of both Ada and ATLAS for automated test program generation by providing the UUT oriented test signal vocabulary of the ATLAS with higher level Ada procedures and data structures. The similarities between the ATLAS and ALTPI constructs make the transition to ABBET re... View full abstract»

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  • DARTS: An enabling technology for concurrent engineering

    Publication Year: 1993, Page(s):383 - 388
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (400 KB)

    Advanced technology includes techniques, materials, and architectures which provide real advantages over those currently used. Such technology has not replaced the technology currently being used for one or more of the following reasons: (1) it is generally unknown, (2) it does not have all the necessary input and output interfaces, (3) it is incompatible with established standards and practices, ... View full abstract»

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