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IEEE Standard Test Access Port and Boundary - Scan Architecture

  • IEEE Standard Test Access Port and Boundary - Scan Architecture

    Publication Year: 1990
    Cited by:  Papers (16)
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    IEEE Std. 1149.1-1990, defines circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum... View full abstract»

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