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Radiation Effects Data Workshop, 1993., IEEE

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Radiation Effects Data Workshop, 1993., IEEE

Date 21-21 July 1993

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Title History

1993 IEEE Radiation Effects Data Workshop

1993 Radiation Effects Data Workshop - Author Index

Experimental Evaluation Of High Speed Ccd Imager Radiation Effects Using Co60 And Proton Radiation

Observation Of Single Event Latchup In Bipolar Devices

Heavy Ion Testing Using The Ganil Accelerator Compilation Of Results With Predictions

Study Of Single-event-upsets In PAL16R8

Solid State Tape Recorders: Spaceflight SEU Data For SAMPEX And TOMS/meteor-3

Heavy Ton / Proton Test Results On High Integrated Memories

Single Event Effects On Space Radiation Hardened 64K SRAMs At Room Temperature

Total Ionizing Dose Effects In 12-bit Successive-approxmation Analog-to-digital Converters

Measurement of single event effects in the 87C51 microcontroller

Design And Testing Of SEU/ SEL Immune Memory And Logic Circuits In A Commercial Cmos Process

Heavy Ion Test Results For Electronic Devices

Observations Of Single-event Upset And Multiple-bit Upset In Non-hardened High-density SRAMs In The TOPEX/ Poseidon Orbit

Deep Dielectric Charging Simulation New Guide-lines

Radiation Damage And Grain Boundary Effects In High-T, Microwave Devices And Tunnel Junctions

Seu And Latch-up Results For Sparc Processors

Radiation Testing Of InGaAsP Fiber Optic Transmitter And Receiver Modules

Overview Of Device See Susceptibility From Heavy Ions

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