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[1993] Proceedings of the Tenth Biennial University/Government/Industry Microelectronics Symposium

18-19 May 1993

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Displaying Results 1 - 25 of 52
  • Proceedings of 1993 10th Biennial University/Government/ Industry Microelectronics Symposium

    Publication Year: 1993
    Request permission for commercial reuse | PDF file iconPDF (32 KB)
    Freely Available from IEEE
  • Transient modeling of heterostructure optoelectronic switches

    Publication Year: 1993, Page(s):156 - 161
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (300 KB)

    A 1-D simulation tool is developed for the transient analysis of four-layer double heterostructure optical switches. The simulated results for an InP/InGaAs PNPN switch show that the minority carrier lifetime could significantly alter the switching characteristics. The breakover voltage and holding current are strong functions of the minority carrier lifetime. The transient simulation results indi... View full abstract»

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  • A team oriented approach to department organization in the microelectronics industry

    Publication Year: 1993, Page(s):245 - 248
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (396 KB)

    A summary is presented of an experiment to completely organize an engineering department using the team concept. The effectiveness of the team-oriented department organization was measured by an opinion survey. The results of this survey were tabulated at department, project and organization levels. The results for the team-organized department are compared to the results for the entire organizati... View full abstract»

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  • Microelectronics manufacturing science technology: A university/government/industry cooperative success story

    Publication Year: 1993, Page(s):1 - 4
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (340 KB)

    The microelectronics manufacturing science technology (MMST) program was initiated to enable cost-effective production of military integrated circuits in small volume. These circuits include both state-of-the-art integrated circuits, as well as obsolete parts no longer being manufactured. Commercial needs for fast-turn prototypes, low volume application specific integrated circuits (ASICs) and dev... View full abstract»

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  • Characterization of electrical packages via simulation and measurement

    Publication Year: 1993, Page(s):162 - 165
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (288 KB)

    A methodology that makes use of the advantages of both electromagnetic simulation and measurement to characterize integrated circuit packages is presented. The advantages, limitations and procedures to improve the accuracy of both methods are discussed. Results from both methods are compared. An accurate prediction of circuit performance is achieved with packaging models generated by this methodol... View full abstract»

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  • Wafer level detecting of Idd failures in CMOS ASICs using liquid crystal techniques

    Publication Year: 1993, Page(s):240 - 244
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (924 KB)

    Simple techniques using liquid crystal and different power-up schemes to locate the failures in CMOS ASICs on the wafer level are described. These techniques are simple and efficient, and are used to locate defects and floating nodes which cause Idd failures at wafer sort. Wafer level defect reduction and prototype debugging are successfully performed on parts in which Idd source location is diffi... View full abstract»

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  • A case study of successful university-government-industry microelectronics partnership

    Publication Year: 1993, Page(s):5 - 9
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (428 KB)

    A highly successful university-government-industry microelectronics partnership is described. It resulted in a successful ion implantation modeling program. This program continues to be very active. It has transferred and continues to transfer considerable technology back to industry, universities, and national laboratories View full abstract»

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  • A Dutch-US microelectronic collaboration

    Publication Year: 1993, Page(s):166 - 169
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    The interaction between a European educational institution, i.e., the Electrical Engineering Department of the Hogeschool Enschede (HE), in the Netherlands and the Microelectronic Engineering Department of the Rochester Institute of Technology (RIT) in the US is described. Six students from the Netherlands have come to the US to complete a thesis for graduation from Hogeschool Enschede. One studen... View full abstract»

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  • Subthreshold analysis of floating-gate MOSFET's

    Publication Year: 1993, Page(s):141 - 144
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (280 KB)

    An analytical model for subthreshold operation of floating-gate MOSFETs is presented. The authors; first-order analysis shows exponential dependence between the current and drain-to-substrate and source-to-substrate voltages; this is confirmed by experimental data. A small-signal model is presented for the common source configuration. Methods for adjusting the charge on the floating gate are also ... View full abstract»

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  • Applying the TQM method of process characterization to Harris Semiconductor's Spice model development and support

    Publication Year: 1993, Page(s):65 - 70
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (568 KB)

    Improving product-to-market (PTM) cycle time for new products is recognized as a critical success factor in achieving Harris Corporation's quality first goals. One key component in reducing PTM times is the application and improvement of CAD tools and their related models, which are the basis for circuit simulation and verification. As a means to improve PTM times, the total quality management (TQ... View full abstract»

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  • Training artificial neural networks for statistical process control

    Publication Year: 1993, Page(s):235 - 239
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (316 KB)

    The use of artificial neural networks (ANNs) in statistical process control (SPC) is studied. An ANN is developed in order to determine the status of a process. The objective of the network is to be able to classify the incoming X-Bar values by indicating the status of the process with the appropriate rule. The network is presented with ten values which can be out of control, as described by any o... View full abstract»

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  • Microelectronic packaging technology transfer

    Publication Year: 1993, Page(s):10 - 16
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (512 KB)

    The appropriate and efficient technology transfer mechanism will vary, depending on individual company circumstances and needs. It is important for research organizations to have multiple mechanisms in place to meet the diverse needs of research sponsors. The Computer Aided Life Cycle Engineering Electronic Packaging Research Center (CALCE EPRC) at the University of Maryland has considerable exper... View full abstract»

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  • Education for engineering in Japan

    Publication Year: 1993, Page(s):80 - 84
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (344 KB)

    Engineering education in Japan is characterized by an emphasis on group work on a strong grounding in fundamentals in pre-university education, and by career-long on-the-job training (OJT) through a mentor system, and rotation within his/her company. Universities teach fundamentals, and perform a useful screening function for employers through their entrance examinations. Career-long mutual commit... View full abstract»

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  • Design, optimization, and characterization of a low temperature RPECVD MOS gate stack process

    Publication Year: 1993, Page(s):208 - 212
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (300 KB)

    Plasma-enhanced chemical vapor deposition (PECVD) allows film deposition in very short times and at low substrate temperatures. The use of remote plasma-enhanced chemical vapor deposition (RPECVD) to deposit an oxide insulator layer for a MOS gate stack structure within a single-wafer processing system is reported. The project background including government and industry support is presented. The ... View full abstract»

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  • Microelectronics at the University of Minnesota

    Publication Year: 1993, Page(s):170 - 173
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (352 KB)

    The Microelectronics Laboratory for Research and Education (MLRE) at the University of Minnesota is a class-10 semiconductor fabrication facility dedicated to support university research and education, as well as to collaborate with other universities and industry in microelectronics-related areas. The facility and its equipment are used for work in areas such as compound semiconductor growth, opt... View full abstract»

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  • On the simulation of analog VLSI systems operating in the subthreshold and transition regions

    Publication Year: 1993, Page(s):145 - 150
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (396 KB)

    Issues related to the simulation of analog integrated systems are investigated, especially those utilizing MOSFETs in the subthreshold region. Simulation program with IC emphasis SPICE3, CAzM, and anaLOG, three of the most commonly available university tools, are examined to determine their relative strengths and applicability. The ease of obtaining convergence, the reliability of results, and mod... View full abstract»

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  • Modeling test and measurement equipment for simulated testing: bridging the gap between simulation and reality

    Publication Year: 1993, Page(s):188 - 192
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (360 KB)

    It is important to incorporate the concept of manufacturability and testability into the engineering curriculum. Incorporating state-of-the-art computer-controlled test and measurement equipment in the curriculum requires an efficient and cost-effective solution to deal with access to this level of equipment. The concept of simulated testing as an innovative solution to this problem is presented View full abstract»

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  • The formation of focused teams for technology exchange

    Publication Year: 1993, Page(s):71 - 73
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (232 KB)

    The formation of technology teams in focused engineering areas (ion implantation, diffusion/oxidation, and wet/dry etch) between multiple manufacturing sites within Harris Semiconductor is described. Harris manufactures advanced digital and analog integrated circuits and discrete semiconductors primarily for signal processing and power control applications. The goals established in forming these t... View full abstract»

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  • Enhanced performance of PMOS and CMOS circuits using self-aligned MOSFETs with modulation doped Si-Ge channel

    Publication Year: 1993, Page(s):219 - 222
    Cited by:  Papers (2)  |  Patents (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (212 KB)

    The use of MOS gate Si-SiGe MODFETs to obtain performance enhancement in PMOS and CMOS integrated circuits is described. Device parameters are computed to obtain compatible transfer characteristics which make it possible to operate these MOS gate MODFETs in CMOS configurations. These transistors, potentially operating in the 10 to 60 GHz range, lead to design of high-performance CMOS logic and mem... View full abstract»

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  • Temperature control strategies for RTP systems

    Publication Year: 1993, Page(s):229 - 234
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (416 KB)

    A simulation of rapid thermal processing (RTP) is made to investigate the accuracy of various control schemes. The simulated RTP process is chemical vapor deposition (CVD) of polycrystalline silicon over an oxide. The simulated control schemes are open loop control, pyrometer control, pyrometer control with corrected emissivity, and open loop control with the programmed lamp heating. Wafer tempera... View full abstract»

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  • Applying CIM and TQM to a student run integrated circuit factory

    Publication Year: 1993, Page(s):17 - 22
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (360 KB)

    Rochester Institute of Technology (RIT) has received a five year grant from IBM through an IBM total quality management (TQM) competition. Among the several projects funded by this grant is a project entitled Six Sigma Process Capability in Student-Run IC Factory. RIT is in the first year of this project and is involved in defining the process capability baseline from data collected for the past s... View full abstract»

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  • The VISION program: an opportunity for a partnership in education

    Publication Year: 1993, Page(s):85 - 87
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (236 KB)

    VISION is a teacher-enhancement program which helps bridge the gap between the technological capabilities of secondary school students and the technological requirements for the work force. In this program, middle and high school teachers participate as a group. Local industry personnel familiarize participants with methodologies and with applications of mathematics, science, and technology. Unive... View full abstract»

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  • The Teaching Company scheme, an academic-industry partnership-a case study

    Publication Year: 1993, Page(s):29 - 36
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (496 KB)

    Details of an academic-industry partnership scheme in the United Kingdom are presented as a case study. The scheme has successfully brought together academia and industry to provide development and transfer of ideas and to provide training for young and experienced graduates. It has also enabled a manufacturing company to quickly acquire the skills necessary to use technology CAD, (TCAD) efficient... View full abstract»

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  • NASA secondary teacher VLSI program

    Publication Year: 1993, Page(s):93 - 97
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    An experimental education program was initiated by NASA to expose secondary teachers to modern VLSI technology and to allow them to design VLSI chips. A plan is proposed that provides a transfer of digital technology into the high school system. The approach and preliminary results of this new program are presented View full abstract»

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  • A case study of cooperative university/government/industry education and research

    Publication Year: 1993, Page(s):41 - 45
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (504 KB)

    A case study of the author's experience and perspectives on cooperative university/government/industry education and research is presented. It is argued that the most effective technology transfer takes place through the exchange and education of people. The cooperative education and research system plays an important role in producing the quality personnel and advanced technology needed to restor... View full abstract»

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