Wavelet-based representations for the 1/f family of fractal processes

Full text access may be available

To access full text, please use your member or institutional sign in.

Username

Password

This paper appears in:
Proceedings of the IEEE
Date of Publication: Oct 1993
Author(s): Wornell, G.W.
Res. Lab. of Electron., MIT, Cabridge, MA
Volume: 81 , Issue: 10
Page(s): 1428 - 1450
Product Type: Journals & Magazines

Available Formats	Non-Member Price	Member Price
PDF	US$31.00	US$10.00
Become an IEEE Member or Subscribe to IEEE Xplore for exclusive pricing! IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses. Learn more about: IEEE membership IEEE Xplore subscriptions

Abstract

It is demonstrated that 1/f fractal processes are, in a broad sense, optimally represented in terms of orthonormal wavelet bases. Specifically, via a useful frequency-domain characterization for 1/f processes, the wavelet expansion's role as a Karhunen-Loeve-type expansion for 1/f processes is developed. As an illustration of potential, it is shown that wavelet-based representations naturally lead to highly efficient solutions to some fundamental detection and estimation problems involving 1/f processes

Index Terms

Index Terms are available to subscribers and IEEE members.

Additional Details
Citing Documents (46)

ISSN : 0018-9219
INSPEC Accession Number: 4583150
Digital Object Identifier : 10.1109/5.241506
Date of Current Version : 06 August 2002
Issue Date : Oct 1993
Sponsored by : IEEE

| Create Account

IEEE Account

Purchase Details

Profile Information

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

A non-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2012 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.

Please enter a valid username or password.

For Institutional Users:

More Search Options