Robust system design with built-in soft-error resilience

Full text access may be available

To access full text, please use your member or institutional sign in.

Username

Password

This paper appears in:
Computer
Date of Publication: Feb. 2005
Author(s): Mitra, S.
Intel
Seifert, N. ; Zhang, M. ; Shi, Q. ; Kim, K.S.
Volume: 38 , Issue: 2
Page(s): 43 - 52
Product Type: Journals & Magazines

Available Formats	Non-Member Price	Member Price
PDF	US$31.00	US$10.00
Become an IEEE Member or Subscribe to IEEE Xplore for exclusive pricing! IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses. Learn more about: IEEE membership IEEE Xplore subscriptions

Abstract

Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.

Index Terms

Index Terms are available to subscribers and IEEE members.

Additional Details
References (21)
Citing Documents (156)

ISSN : 0018-9162
INSPEC Accession Number: 8339349
Digital Object Identifier : 10.1109/MC.2005.70
Date of Current Version : 07 March 2005
Issue Date : Feb. 2005
Sponsored by : IEEE Computer Society

| Create Account

IEEE Account

Purchase Details

Profile Information

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

A non-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2012 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.

Please enter a valid username or password.

For Institutional Users:

More Search Options