Close category search window
 

A 14-b 12-MS/s CMOS pipeline ADC with over 100-dB SFDR

Full text access may be available

To access full text, please use your member or institutional sign in.


This paper appears in:
Solid-State Circuits, IEEE Journal of
Date of Publication: Dec. 2004
Author(s): Yun Chiu
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
Gray, P.R. ;  Nikolic, B.
Volume: 39 , Issue: 12
Page(s): 2139 - 2151
Product Type: Journals & Magazines

Available Formats Non-Member Price Member Price
US$31.00 US$10.00
Learn how you can qualify for the best price for the item!
  • Email
  • Print
  • Rights And Permissions

Abstract

A 1.8-V 14-b 12-MS/s pseudo-differential pipeline analog-to-digital converter (ADC) using a passive capacitor error-averaging technique and a nested CMOS gain-boosting technique is described. The converter is optimized for low-voltage low-power applications by applying an optimum stage-scaling algorithm at the architectural level and an opamp and comparator sharing technique at the circuit level. Prototyped in a 0.18-μm 6M-1P CMOS process, this converter achieves a peak signal-to-noise plus distortion ratio (SNDR) of 75.5 dB and a 103-dB spurious-free dynamic range (SFDR) without trimming, calibration, or dithering. With a 1-MHz analog input, the maximum differential nonlinearity is 0.47 LSB and the maximum integral nonlinearity is 0.54 LSB. The large analog bandwidth of the front-end sample-and-hold circuit is achieved using bootstrapped thin-oxide transistors as switches, resulting in an SFDR of 97 dB when a 40-MHz full-scale input is digitized. The ADC occupies an active area of 10 mm2 and dissipates 98 mW.

Index Terms

Index Terms are available to subscribers and IEEE members.

 





Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A non-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2012 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.