This paper appears in:
Industrial Electronics, 2003. ISIE '03. 2003 IEEE International Symposium on
Date of Conference:
9-11 June 2003
Author(s):
Nunes, E.
Departamento Engenharia Informatica, Escola Superior de Tecnologia, Castelo Branco, Portugal
Abreu, E.
;
Metrolho, J.C.
;
Cardoso, N.
;
Costa, M.
;
Lopes, E.
Volume: 1
Page(s):
594 - 597 vol. 1
Product Type:
Conference Publications
Abstract
This document presents the description of an application for the automatic visual inspection of flour quality. The flour quality depends on the number of impurities detected in the flour after a predefined settling time. The software was developed with IMAQ Vision for LabVTEW software-developing tool and it uses a commercial camera as image acquisition device. The paper along its sections describes the main system blocks. An illustrative example is used for better description of the several steps during the digital processing of the acquired images.
Index Terms
Index Terms are available to subscribers and IEEE members.
On page(s): 594
Print ISBN: 0-7803-7912-8
INSPEC Accession Number: 7971244
Digital Object Identifier : 10.1109/ISIE.2003.1267318
Date of Current Version :
26 February 2004
Issue Date :
9-11 June 2003
Available to subscribers and IEEE members.
Available to subscribers and IEEE members.
