By Topic

Anomalous light reflection at the surface of a corrugated thin metal film

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
I. F. Salakhutdinov ; Gen. Phys. Inst., Acad. of Sci., Moscow, Russia ; V. A. Sychugov ; A. V. Tishchenko ; B. A. Usievich
more authors

The process of excitation of surface electromagnetic waves (SEW's) in corrugated thin metal film is investigated theoretically and experimentally. The existence of an anomalous increase of the reflection coefficient is demonstrated. The excitation of long-range plasmons in thin metal films opens new possibilities for sensor applications

Published in:

IEEE Journal of Quantum Electronics  (Volume:34 ,  Issue: 6 )