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Measurement of the spatial resolution of wide-pitch silicon strip detectors with large incident angle

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10 Author(s)
Kawasaki, T. ; Graduate Sch. of Sci., Osaka Univ., Japan ; Hazumi, M. ; Nagashima, Y. ; Senyo, K.
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As a part of R&D for the BELLE experiment at KEK-B, we measured the spatial resolution of silicon strip detectors for particles with incident angles ranging from 0° to 75°. These detectors have strips with pitches of 50, 125 and 250 μm on the ohmic side. We have obtained the incident angle dependence which agreed well with a Monte Carlo simulation. The resolution was found to be 11 μm for normal incidence with a pitch of 50 μm, and 29 μm for incident angle of 75° with a pitch of 250 μm

Published in:

Nuclear Science, IEEE Transactions on  (Volume:44 ,  Issue: 3 )

Date of Publication:

Jun 1997

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