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PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration

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3 Author(s)
Moo-Young Kim ; Electr. & Electron. Eng. Dept., Korea Univ., Seoul, South Korea ; Hokyu Lee ; Chulwoo Kim

A current source with a small current error has been proposed to maintain the bandwidth of the system without an increase in power consumption for a margin. It minimizes the current error under process, supply voltage, and temperature (PVT) variations. Because the on-resistance of the nMOS array is self-calibrated digitally by an on-chip digital PVT detector, a current error of only ±2% is achieved. The current source has been implemented in an 80-nm CMOS process, occupies 0.018 mm2 and consumes 94.9 μW at a supply voltage of 1.0 V.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:20 ,  Issue: 4 )