Cart (Loading....) | Create Account
Close category search window
 

Accelerating FAB-MAP With Concentration Inequalities

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Cummins, M. ; Mobile Robot. Res. Group, Oxford Univ., Oxford, UK ; Newman, P.

We outline an approach for using concentration inequalities to perform rapid approximate multi-hypothesis testing. In a scenario where multiple hypotheses are ranked according to a large set of features, our scheme improves the efficiency of selecting the best hypothesis by providing a “bail-out threshold” at which unpromising hypotheses can be excluded from further evaluation. We show how concentration inequalities can be used to derive principled bail-out thresholds, subject to a user-specified error tolerance. The technique is similar to the sequential probability ratio test, but is applicable in more general conditions. We apply the technique to improve the speed of the fast-appearance-based mapping system for appearance-based place recognition and mapping. The speed increase provided by the new approach is data dependent, but we demonstrate speed improvements of between 25x - 50x on real data, with only a slight degradation in accuracy.

Published in:

Robotics, IEEE Transactions on  (Volume:26 ,  Issue: 6 )

Date of Publication:

Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.