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Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs With Asymmetric Cells

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3 Author(s)
Jin-Fu Li ; Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan ; Yu-Jen Huang ; Yong-Jyun Hu

This paper presents a march-like testTAC-P to cover comparison faults of ternary content addressable memories (TCAMs) with asymmetric cells. The TAC-P only requires 4N Write operations and (3N+2B) Compare operations for an N ×B -bit TCAM with Hit and priority address encoder outputs. We show that the test also can cover search time failures induced by process variation in the comparison circuit of a TCAM. Furthermore, a test TMF for match failures induced by the process variation in the comparison circuit of a TCAM is also presented.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:29 ,  Issue: 11 )

Date of Publication:

Nov. 2010

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