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This paper presents a march-like testTAC-P to cover comparison faults of ternary content addressable memories (TCAMs) with asymmetric cells. The TAC-P only requires 4N Write operations and (3N+2B) Compare operations for an N ×B -bit TCAM with Hit and priority address encoder outputs. We show that the test also can cover search time failures induced by process variation in the comparison circuit of a TCAM. Furthermore, a test TMF for match failures induced by the process variation in the comparison circuit of a TCAM is also presented.