Cart (Loading....) | Create Account
Close category search window
 

Corrosion Estimation of Stainless Steel in Nitric Acid by an Optoelectronic Instrument Based on Diffuse Light Scattering Pattern Measurement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Marimuthu, P.N. ; Coll. of Eng. & Pet., Kuwait Univ., Safat, Kuwait ; Kabilan, A.P.

This paper presents the design and implementation of an optoelectronic instrument for measuring corrosion of metal surfaces, based on measurement of lightwave scattering pattern. The instrument consists of a thin beam light emitting diode (LED) that illuminates a tiny spot on the metal surface, and an array of photodiodes spread over a hemispherical structure covering the surface to record the light scattering pattern. A mathematical model of light scattering by a corroded metal surface is constructed in which a newly defined corrosion factor is correlated to light scattering pattern. The corrosion factor derived from the scattering pattern gives a measure of the degree of corrosion in a scale from 0 to 100. The temporal behavior of corrosion of stainless steel samples immersed in nitric acid of various concentrations is presented graphically. A semi empirical mathematical model describing the corrosion and dissolution processes in terms of the well-known bilogarithmic laws fits very well with the experimental results. The measured corrosion factor and the corresponding roughness factor as measured by an atomic force microscope are compared to show the relation between the two.

Published in:

Sensors Journal, IEEE  (Volume:10 ,  Issue: 10 )

Date of Publication:

Oct. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.