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A Practical DFT Approach for Complex Low Power Designs

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4 Author(s)
Kifli, A. ; Faraday Technol. Corp., Hsinchu, Taiwan ; Chen, Y.W. ; Tsay, Y.W. ; Wu, K.C.

Low power designs create new challenges in design implementation, verification and testing. DFT practice that overlooks test power may result in yield loss/overkill during manufacturing test. This paper addresses the practical problems often encountered during DFT implementation and manufacturing test for complex low power designs.

Published in:

Asian Test Symposium, 2009. ATS '09.

Date of Conference:

23-26 Nov. 2009

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