Cart (Loading....) | Create Account
Close category search window

Holographic data storage on nonphotosensitive glass with a single femtosecond laser pulse

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Li, Yan ; Venture Business Laboratory, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan ; Watanabe, Wataru ; Itoh, K. ; Sun, Xiudong

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Holographic data storage on fused silica, soda-lime, and lead glasses with a single 130 fs laser pulse at a wavelength of 800 nm is presented. After the sample is exposed to the interference fringe pattern of the object beam and the reference beam, a relief microhologram is recorded through surface ablation. The recorded information can be reconstructed without destruction of the hologram when the power of the reference beam is reduced below the ablation threshold. The preliminary experimental results demonstrate the possibility of holographic data storage on nonphotosensitive glasses. © 2002 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:81 ,  Issue: 11 )

Date of Publication:

Sep 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.